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1. 发明申请

US20070296432A1 Measurement board for electronic device test apparatus 有权
标题翻译：电子设备测试仪测量板
公开(公告)号：US20070296432A1
公开(公告)日：2007-12-27
申请号：US11444425
申请日：2006-06-01
申请人： Hiroyuki Mineo , Atsunori Shibuya
发明人： Hiroyuki Mineo , Atsunori Shibuya
IPC分类号： G01R31/02
CPC分类号： H01R24/52 , G01R1/0408 , H01R2103/00
摘要： A performance board able to secure low loss, low reflection, stable transmission characteristics even when using a high frequency signal to test an electronic device and able to suppress signal leakage to the outside and entry of noise, provided with a base board having a signal pattern electrically connected with a socket formed on its front surface, a coaxial connector to which a coaxial cable electrically connecting the performance board and test apparatus is connected, passing through the base board from the back surface toward the front surface, and having a front exposed part of the center contact bent and electrically connected to the signal pattern, and a cover member covering the front exposed part of the center contact and correcting the impedance of the front exposed part.
摘要翻译：即使使用高频信号来测试电子设备并且能够抑制信号泄漏到外部并进入噪声的性能板，其能够确保低损耗，低反射，稳定的传输特性，该基板具有信号图案与形成在其前表面上的插座电连接，同轴连接器，电连接性能板和测试装置的同轴电缆连接到同轴连接器，穿过基板从后表面朝向前表面，并且具有前暴露部分弯曲和电连接到信号图案的中心接触件，以及覆盖中心接触件的前暴露部分并校正前暴露部分的阻抗的盖构件。

2. 发明授权

US07688092B2 Measuring board for electronic device test apparatus 有权
标题翻译：电子设备测试仪测量板
公开(公告)号：US07688092B2
公开(公告)日：2010-03-30
申请号：US12144007
申请日：2008-06-23
申请人： Hiroyuki Mineo , Atsunori Shibuya
发明人： Hiroyuki Mineo , Atsunori Shibuya
IPC分类号： G01R31/02
CPC分类号： H01R24/52 , G01R1/0408 , H01R2103/00
摘要： A performance board able to secure low loss, low reflection, stable transmission characteristics even when using a high frequency signal to test an electronic device and able to suppress signal leakage to the outside and entry of noise, provided with a base board having a signal pattern electrically connected with a socket formed on its front surface, a coaxial connector to which a coaxial cable electrically connecting the performance board and test apparatus is connected, passing through the base board from the back surface toward the front surface, and having a front exposed part of the center contact bent and electrically connected to the signal pattern, and a cover member covering the front exposed part of the center contact and correcting the impedance of the front exposed part.
摘要翻译：即使使用高频信号来测试电子设备并且能够抑制信号泄漏到外部并进入噪声的性能板，其能够确保低损耗，低反射，稳定的传输特性，该基板具有信号图案与形成在其前表面上的插座电连接，同轴连接器，电连接性能板和测试装置的同轴电缆连接到同轴连接器，穿过基板从后表面朝向前表面，并具有前部暴露部分弯曲和电连接到信号图案的中心接触件，以及覆盖中心接触件的前暴露部分并校正前暴露部分的阻抗的盖构件。

3. 发明申请

US20090033347A1 Measuring board for electronic device test apparatus 有权
标题翻译：电子设备测试仪测量板
公开(公告)号：US20090033347A1
公开(公告)日：2009-02-05
申请号：US12144007
申请日：2008-06-23
申请人： Hiroyuki Mineo , Atsunori Shibuya
发明人： Hiroyuki Mineo , Atsunori Shibuya
IPC分类号： G01R1/067
CPC分类号： H01R24/52 , G01R1/0408 , H01R2103/00
摘要： A performance board able to secure low loss, low reflection, stable transmission characteristics even when using a high frequency signal to test an electronic device and able to suppress signal leakage to the outside and entry of noise, provided with a base board having a signal pattern electrically connected with a socket formed on its front surface, a coaxial connector to which a coaxial cable electrically connecting the performance board and test apparatus is connected, passing through the base board from the back surface toward the front surface, and having a front exposed part of the center contact bent and electrically connected to the signal pattern, and a cover member covering the front exposed part of the center contact and correcting the impedance of the front exposed part.
摘要翻译：即使使用高频信号来测试电子设备并且能够抑制信号泄漏到外部并进入噪声的性能板，其能够确保低损耗，低反射，稳定的传输特性，该基板具有信号图案与形成在其前表面上的插座电连接，同轴连接器，电连接性能板和测试装置的同轴电缆连接到同轴连接器，穿过基板从后表面朝向前表面，并且具有前暴露部分弯曲和电连接到信号图案的中心接触件，以及覆盖中心接触件的前暴露部分并校正前暴露部分的阻抗的盖构件。

4. 发明授权

US07405582B2 Measurement board for electronic device test apparatus 有权
标题翻译：电子设备测试仪测量板
公开(公告)号：US07405582B2
公开(公告)日：2008-07-29
申请号：US11444425
申请日：2006-06-01
申请人： Hiroyuki Mineo , Atsunori Shibuya
发明人： Hiroyuki Mineo , Atsunori Shibuya
IPC分类号： G01R31/02
CPC分类号： H01R24/52 , G01R1/0408 , H01R2103/00
摘要： A performance board able to secure low loss, low reflection, stable transmission characteristics even when using a high frequency signal to test an electronic device and able to suppress signal leakage to the outside and entry of noise, provided with a base board having a signal pattern electrically connected with a socket formed on its front surface, a coaxial connector to which a coaxial cable electrically connecting the performance board and test apparatus is connected, passing through the base board from the back surface toward the front surface, and having a front exposed part of the center contact bent and electrically connected to the signal pattern, and a cover member covering the front exposed part of the center contact and correcting the impedance of the front exposed part.
摘要翻译：即使使用高频信号来测试电子设备并且能够抑制信号泄漏到外部并进入噪声的性能板，其能够确保低损耗，低反射，稳定的传输特性，该基板具有信号图案与形成在其前表面上的插座电连接，同轴连接器，电连接性能板和测试装置的同轴电缆连接到同轴连接器，穿过基板从后表面朝向前表面，并且具有前暴露部分弯曲和电连接到信号图案的中心接触件，以及覆盖中心接触件的前暴露部分并校正前暴露部分的阻抗的盖构件。

5. 发明授权

US07185255B2 Test apparatus 有权
标题翻译：测试仪器
公开(公告)号：US07185255B2
公开(公告)日：2007-02-27
申请号：US10858456
申请日：2004-06-01
申请人： Atsunori Shibuya
发明人： Atsunori Shibuya
IPC分类号： G01R31/28 , G06F11/00
CPC分类号： G01R31/31907 , G01R31/2886 , G01R35/00
摘要： A test apparatus for testing an electronic device, includes a test module for sending and/or receiving a test signal to and/or from the electronic device, a test head including a plurality of Test Head (TH) slots for detachably holding the test module, a diagnosis module for performing diagnosis of the test module, and a coupling device including a plurality of Performance Board (PB) slots being electrically coupled to the TH slots respectively for detachably holding the diagnosis module. The diagnosis module held in one of the PB slots diagnoses the test module held in one of the TH slots being electrically coupled to one of the PB slots.
摘要翻译：一种用于测试电子设备的测试设备，包括用于向电子设备发送和/或接收测试信号的测试模块，包括多个测试头（TH）槽的测试头，用于可拆卸地保持测试模块，用于执行测试模块的诊断的诊断模块，以及包括多个性能板（PB）槽的耦合装置，其分别电耦合到所述TH插槽，用于可拆卸地保持所述诊断模块。保持在一个PB插槽中的诊断模块诊断保持在电气耦合到一个PB插槽的一个TH插槽中的测试模块。

6. 发明授权

US06995578B2 Coupling unit, test head, and test apparatus 失效
标题翻译：耦合单元，测试头和测试仪器
公开(公告)号：US06995578B2
公开(公告)日：2006-02-07
申请号：US10881175
申请日：2004-06-30
申请人： Atsunori Shibuya , Masashi Hoshino
发明人： Atsunori Shibuya , Masashi Hoshino
IPC分类号： G01R31/02
CPC分类号： G01R31/2889
摘要： A coupling unit for electrically coupling a performance board on which an electronic device is mounted and a tester control unit for generating a control signal for controlling a test of the electronic device includes a board containing unit for containing a test board electrically coupled to the tester control unit in order that the test board is replaceable on one of a plurality of different holding positions and a coupling cable whose one end is coupled to the test board held in the holding position and the other end is coupled to the performance board.
摘要翻译：用于电耦合安装有电子设备的性能板的耦合单元和用于产生用于控制电子设备的测试的控制信号的测试器控制单元包括：板容纳单元，用于容纳与测试器控制器电耦合的测试板单元，以便测试板可以在多个不同的保持位置中的一个上被替换;以及耦合电缆，其一端耦合到保持在保持位置的测试板，另一端耦合到该性能板。

7. 发明申请

US20090206858A1 DIAGNOSIS BOARD ELECTRICALLY CONNECTED WITH A TEST APPARATUS FOR TESTING A DEVICE UNDER TEST 有权
标题翻译：诊断板电气连接用于测试测试设备的测试设备
公开(公告)号：US20090206858A1
公开(公告)日：2009-08-20
申请号：US12422844
申请日：2009-04-13
申请人： Atsunori Shibuya
发明人： Atsunori Shibuya
IPC分类号： G01R31/02
CPC分类号： G01R1/07378
摘要： There is provided a test apparatus having a test head containing test modules for sending/receiving signals to/from a device-under-test, a device mounting section having a socket for mounting the device-under-test and a performance board placed on the test head to connect each terminal of the test module with each terminal of the device-under-test via the device mounting section, and the performance board has a plurality of sub-boards each containing a part of a plurality of wires for connecting the test module with the device-under-test and a fixing section for attaching and fixing the plurality of sub-boards in a body to the test head.
摘要翻译：提供了一种具有测试头的测试装置，该测试头包含用于向/从被测器件发送/接收信号的测试模块，具有用于安装被测器件的插座的器件安装部分和放置在测试器上的性能板测试头通过设备安装部分将测试模块的每个端子与被测器件的每个端子连接，并且性能板具有多个子板，每个子板包含用于连接测试的多条导线的一部分具有被测器件的模块和用于将多个子板附接和固定到主体中的固定部分。

8. 发明授权

US07548078B2 Performance board for electronically connecting a device under test with a test apparatus for testing a device under test 有权
标题翻译：用于电子连接被测设备的测试设备用于测试被测设备的性能板
公开(公告)号：US07548078B2
公开(公告)日：2009-06-16
申请号：US11393314
申请日：2006-03-30
申请人： Atsunori Shibuya
发明人： Atsunori Shibuya
IPC分类号： G01R31/26
CPC分类号： G01R1/07378
摘要： There is provided a test apparatus having a test head containing test modules for sending/receiving signals to/from a device-under-test, a device mounting section having a socket for mounting the device-under-test and a performance board placed on the test head to connect each terminal of the test module with each terminal of the device-under-test via the device mounting section, and the performance board has a plurality of sub-boards each containing a part of a plurality of wires for connecting the test module with the device-under-test and a fixing section for attaching and fixing the plurality of sub-boards in a body to the test head.
摘要翻译：提供了一种具有测试头的测试装置，该测试头包含用于向/从被测器件发送/接收信号的测试模块，具有用于安装被测器件的插座的器件安装部分和放置在测试器上的性能板测试头通过设备安装部分将测试模块的每个端子与被测器件的每个端子连接，并且性能板具有多个子板，每个子板包含用于连接测试的多条导线的一部分具有被测器件的模块和用于将多个子板附接和固定到主体中的固定部分。

9. 发明申请

US20070069758A1 Performance board, test apparatus, board for diagnosis, and diagnosis method 有权
标题翻译：性能板，测试仪器，诊断板和诊断方法
公开(公告)号：US20070069758A1
公开(公告)日：2007-03-29
申请号：US11393314
申请日：2006-03-30
申请人： Atsunori Shibuya
发明人： Atsunori Shibuya
IPC分类号： G01R31/26
CPC分类号： G01R1/07378
摘要： There is provided a test apparatus having a test head containing test modules for sending/receiving signals to/from a device-under-test, a device mounting section having a socket for mounting the device-under-test and a performance board placed on the test head to connect each terminal of the test module with each terminal of the device-under-test via the device mounting section, and the performance board has a plurality of sub-boards each containing a part of a plurality of wires for connecting the test module with the device-under-test and a fixing section for attaching and fixing the plurality of sub-boards in a body to the test head.
摘要翻译：提供了一种具有测试头的测试装置，该测试头包含用于向/从被测器件发送/接收信号的测试模块，具有用于安装被测器件的插座的器件安装部分和放置在测试器上的性能板测试头通过设备安装部分将测试模块的每个端子与被测器件的每个端子连接，并且性能板具有多个子板，每个子板包含用于连接测试的多条导线的一部分具有被测器件的模块和用于将多个子板附接和固定到主体中的固定部分。

10. 发明申请

US20060041694A1 Test apparatus, configuration method, and device interface 有权
标题翻译：测试仪器，配置方法和设备接口
公开(公告)号：US20060041694A1
公开(公告)日：2006-02-23
申请号：US10923634
申请日：2004-08-20
申请人： Nobuei Washizu , Atsunori Shibuya
发明人： Nobuei Washizu , Atsunori Shibuya
IPC分类号： G06F13/12
CPC分类号： G06F11/273 , G01R31/31907 , G01R31/31919 , G06F11/263
摘要： A test apparatus includes a bus switch unit capable of switching the output ports to select which of the output ports an input signal is output from, a control unit for inputting a plurality of control signals, according to a test program for testing the electronic device, to the bus switch unit and controlling which of the output ports each of the control signals is output from, a plurality of slots provided corresponding to the plurality of output ports, and a device interface capable of switching the connectors, which couple the plurality of slots and the electronic device, to select which of the connectors the slot is coupled to, wherein the device interface further includes a diagnosis decoder for sequentially supplying each of the test modules with a diagnosis signal via each of the connectors, and the control unit detects which of the test modules the diagnosis signal received via each of the connectors is supplied to and which of the connectors each of the output ports is coupled to based on a result of detecting the module.
摘要翻译：测试装置包括总线开关单元，其能够根据用于测试电子设备的测试程序，切换输出端口以选择从其输出输入信号的哪个输出端口，用于输入多个控制信号的控制单元，到总线开关单元，并且控制每个控制信号的输出端口中的哪个输出端口，与多个输出端口相对应设置的多个时隙，以及能够切换连接器的设备接口，所述连接器将多个时隙和电子设备，用于选择插槽耦合到哪个连接器，其中设备接口还包括诊断解码器，用于经由每个连接器顺序地向每个测试模块提供诊断信号，并且控制单元检测哪个的测试模块，通过每个连接器接收的诊断信号被提供给每个输出端口的连接器和哪个连接器是联接的基于检测模块的结果。

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