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    • 4. 发明授权
    • Image recording apparatus in which a recorded content or output for which the confidentiality is required can be prevented from being visible to another user
    • 可以防止其中需要保密性的记录内容或输出对另一用户可见的图像记录装置
    • US08570549B2
    • 2013-10-29
    • US13050319
    • 2011-03-17
    • Shunsuke Yamamoto
    • Shunsuke Yamamoto
    • G06K15/00H04N1/60B41C1/00G03G15/02G03G15/00G03G21/00
    • B41J13/0036B65H31/24B65H2220/04B65H2511/412B65H2511/51B65H2511/515B65H2513/42G06F21/608B65H2220/01
    • An image recording apparatus, including: a recording device; discharge trays; a discharge mechanism; detectors; an input device through which is inputted authentication information relating to image data; and a controller including: an image-data reception portion; an authentication-information confirming portion to make a confirmation as to whether the authentication information contains specific information; a confirmation-necessity judging portion to judge whether the confirmation by the confirming portion with respect to the image data is necessary; a selecting portion to select one discharge tray on which the recording medium is not placed, wherein, where the judging portion judges that the confirmation is necessary, the controller permits selection of the one discharge tray, controls the recording device to record the image based on the image data after the confirmation that the authentication information contains the specific information, and controls the discharge mechanism to discharge, to the selected one discharge tray, the image-recorded recording medium.
    • 一种图像记录装置,包括:记录装置; 卸料盘 排放机构; 探测器 输入设备,通过该输入设备输入与图像数据有关的认证信息; 以及控制器,包括:图像数据接收部分; 验证信息确认部分,用于确认认证信息是否包含特定信息; 确定必要性判断部分,用于判断是否需要由确认部分对图像数据的确认; 选择部分,用于选择其上没有放置记录介质的一个排出托盘,其中,在判断部分判断需要确认的情况下,控制器允许选择一个排出托盘,控制记录装置基于 确认认证信息包含特定信息之后的图像数据,并且控制排出机构排出到所选择的一个排出托盘,图像记录记录介质。
    • 5. 发明申请
    • Group III-V nitride semiconductor substrate and method for producing same
    • III-V族氮化物半导体衬底及其制造方法
    • US20090050915A1
    • 2009-02-26
    • US12213391
    • 2008-06-18
    • Shunsuke Yamamoto
    • Shunsuke Yamamoto
    • H01L33/00H01L21/00
    • C30B29/403C30B25/02C30B25/18H01L21/0242H01L21/02433H01L21/0254H01L21/0262
    • A group III-V nitride semiconductor substrate includes a first region of group III-V nitride semiconductor crystal grown on a facet on a heterosubstrate, and a second region of the group III-V nitride semiconductor crystal grown on a plane with a predetermined plane orientation on the heterosubstrate. The first region has an area ratio of not more than 10% to the second region in a plane of the substrate. A method for producing a group III-V nitride semiconductor substrate includes a first crystal growth step of supplying a source gas of a group III-V nitride semiconductor onto a heterosubstrate at a first partial pressure to grow the group III-V nitride semiconductor on a plane with a predetermined plane orientation and a facet on the heterosubstrate, and a second crystal growth step of supplying onto the heterosubstrate the source gas at a second partial pressure higher than the first partial pressure to grow the semiconductor on the plane with the predetermined plane orientation and the facet after the first crystal growth step is conduced for a predetermined time period so as to suppress a crystal growth of the semiconductor on the facet.
    • III-V族氮化物半导体衬底包括在异质衬底上的小面上生长的III-V族氮化物半导体晶体的第一区域和在具有预定平面取向的平面上生长的III-V族氮化物半导体晶体的第二区域 在异基质上。 第一区域与衬底的平面中的第二区域的面积比不大于10%。 一种III-V族氮化物半导体衬底的制造方法包括:将第III-V族氮化物半导体的源极气体以第1分压供给到异质衬底上的第1晶体生长工序, 具有预定平面取向的平面和在异质基板上的刻面的第二晶体生长步骤和以高于第一分压的第二分压向异质底物供应源极气体以在预定平面取向的平面上生长半导体的第二晶体生长步骤 并且在第一晶体生长步骤之后的刻面被导通预定时间段,以便抑制半导体在该刻面上的晶体生长。
    • 9. 发明授权
    • Droplet ejection device that adjusts ink ejection amount
    • 调节喷墨量的液滴喷射装置
    • US08333449B2
    • 2012-12-18
    • US12979891
    • 2010-12-28
    • Shunsuke Yamamoto
    • Shunsuke Yamamoto
    • B41J29/38
    • B41J2/17566B41J2/04508B41J2/04578B41J2/0458B41J2/04581B41J2/04588B41J2/04595B41J2/2114B41J2002/14225B41J2002/14459B41J2202/20
    • A droplet ejection device includes a first determining unit that determines a first amount of liquid on an image pixel basis based on both a second amount and an ejection pattern both obtained from image data, actuator that ejects the first amount of the liquid, a second determining unit that determines a third amount of treating agent on an image pixel basis based on a difference between the first and second amounts, such that a density of the liquid corresponding to a combination of the first amount of the liquid and the third amount of the treating agent comes closer to a density of the liquid corresponding to the second amount of the liquid when there is a difference between the first and second amounts, and a treating-agent application member that applies the third amount of the treating agent to a recording medium.
    • 液滴喷射装置包括第一确定单元,该第一确定单元基于从图像数据获得的第二量和排出图案确定基于图像像素的第一量的液体,排出第一量的液体的致动器,第二确定单元 单位,其基于第一和第二量之间的差,基于图像像素确定第三量的处理剂,使得与第一量的液体的组合相对应的液体的浓度和第三量的处理 当第一和第二量之间存在差异时,试剂接近对应于第二量液体的液体的密度,以及将第三量的处理剂施加到记录介质的处理剂施加构件。
    • 10. 发明授权
    • Nitride semiconductor substrate and manufacturing method of the same
    • 氮化物半导体衬底及其制造方法相同
    • US08274087B2
    • 2012-09-25
    • US12619972
    • 2009-11-17
    • Shunsuke Yamamoto
    • Shunsuke Yamamoto
    • H01L29/20
    • H01L21/0262C30B25/02C30B29/406H01L21/0242H01L21/02458H01L21/0254Y10T83/0405
    • To improve an adhesion to a substrate holder, and improve a device production yield by uniformizing a temperature distribution in a surface of a substrate and uniformizing characteristics such as a film thickness. When a concave warpage is set to be negative on a substrate front side, and a convex warpage is set to be positive on the substrate front side, then a line segment is drawn from one end of a substrate rear surface to the other end of the substrate rear surface, passing through a substrate center line, and a substrate is sliced by this line segment in a substrate thickness direction, a maximum value of shortest values of a distance from an arbitrary point on the drawn line segment to a rear side outline in a sliced surface, is defined as warpage H in a diameter direction, and when the warpage H in the diameter direction is obtained in a substrate peripheral direction, with its maximum value set to be Hmax, and its minimum value set to be Hmin, the warpage H in the diameter direction is defined to satisfy Hmax−Hmin≦30 μm.
    • 为了提高对基板保持器的粘合性,通过使基板的表面的温度分布均匀化,使膜厚等均匀化等来提高元件的制造成品率。 在基板正面侧的凹曲面设定为负的情况下,在基板正面侧将凸出的翘曲设定为正的情况下,将线段从基板背面的一端拉到另一端 基板后表面,通过基板中心线,并且基板在基板厚度方向上被该线段切片,从绘制线段上的任意点到后侧轮廓的距离的最短值的最大值 切片面被定义为直径方向的翘曲H,当在基板圆周方向上获得直径方向上的翘曲H,其最大值设定为Hmax,其最小值设定为Hmin时, 将直径方向的翘曲H定义为满足Hmax-Hmin≦̸30μm。