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    • 5. 发明授权
    • Imidazonaphthyridine derivatives
    • 咪唑并萘啶衍生物
    • US5468756A
    • 1995-11-21
    • US241631
    • 1994-05-12
    • Fumio SuzukiTakeshi KurodaShigeto KitamuraKenji Ohmori
    • Fumio SuzukiTakeshi KurodaShigeto KitamuraKenji Ohmori
    • A61K31/435A61K31/4375A61P11/08A61P29/00A61P37/08C07D471/14C07D471/00A61K31/44
    • C07D471/14
    • Disclosed are imidazonaphthyridine derivatives represented by formula (I) ##STR1## wherein: R.sup.1 represents lower alkyl or substituted or unsubstituted aryl; andX--Y--Z represents ##STR2## wherein R.sup.2 represents hydrogen, lower alkyl, alkenyl, aralkenyl, or --C (R.sup.5)H--(CH.sub.2).sub.n --R.sup.4 (wherein R.sup.4 represents substituted or unsubstituted aryl, substituted or unsubstituted pyridyl, substituted or unsubstituted furyl, hydroxy-substituted lower alkyl, lower alkanoyloxy, morpholino, lower alkanoyl, carboxy, lower alkoxycarbonyl, cycloalkyl, hydroxy, lower alkoxy, halogen or NR.sup.6 R.sup.7 wherein R.sup.6 and R.sup.7 independently represents hydrogen or lower alkyl; R.sup.5 represents hydrogen, lower alkyl, or phenyl; and n represents an integer of 0 to 3); and R.sup.3 represents hydrogen, mercapto, hydroxy, lower alkyl, or aryland pharmaceutically acceptable salts thereof.The compounds show a potent anti-inflammatory, anti-allergic and broncho-dilative activity.
    • 公开了由式(I)表示的咪唑并吡啶衍生物其中:R1表示低级烷基或取代或未取代的芳基; 并且XYZ表示其中R2表示氢,低级烷基,烯基,芳烯基或-C(R5)H-(CH2)n-R4(其中R4表示取代或未取代的芳基,取代或未取代的吡啶基,取代或未取代的呋喃基 羟基取代的低级烷基,低级烷酰氧基,吗啉代,低级烷酰基,羧基,低级烷氧基羰基,环烷基,羟基,低级烷氧基,卤素或NR6R7,其中R6和R7独立地表示氢或低级烷基; R5表示氢,低级烷基或苯基; n表示0〜3的整数)。 并且R 3表示氢,巯基,羟基,低级烷基或芳基及其药学上可接受的盐。 这些化合物显示有效的抗炎,抗过敏和支气管扩张活性。
    • 8. 发明授权
    • Logic circuitry having self-test function
    • 逻辑电路具有自检功能
    • US07313742B2
    • 2007-12-25
    • US10808421
    • 2004-03-25
    • Masafumi TakahashiKenji Ohmori
    • Masafumi TakahashiKenji Ohmori
    • G01R31/28
    • G01R31/318558G01R31/318541
    • A logic circuit having a self-test function includes a plurality of F/Fs having at least first-, second- and last-stage scanning F/Fs, each having a clock input, a scanning input and a scanning output terminals. The scanning F/Fs are connected one another so as to supply a scanning clock signal to the clock input terminal of each scanning F/F and a signal from the scanning output terminal of the first-stage to the scanning input terminal of the second-stage for sequential logical operations. Also provided in the logic circuit are a data selector to select either an external scanning signal or a signal output from the scanning output terminal of the last-stage and fed back through a feed-back signal line and a scanning controller to supply a control signal to the data selector so as to supply the signal fed back from the last-stage to the scanning input terminal of the first-stage, thus controlling each F/F in an internal scanning mode. The signal from the last-stage is supplied from the logic circuit via an external scanning output terminal.
    • 具有自检功能的逻辑电路包括具有至少第一,第二和最后级扫描F / F的多个F / F,每个F / F均具有时钟输入,扫描输入和扫描输出端。 扫描F / F彼此连接,以将扫描时钟信号提供给每个扫描F / F的时钟输入端,以及从第一级的扫描输出端到第二级的扫描输入端的信号。 顺序逻辑运算的阶段。 还提供在逻辑电路中的数据选择器是选择外部扫描信号或从最后级的扫描输出端输出并通过反馈信号线和扫描控制器反馈的信号,以提供控制信号 到数据选择器,以将从最后级反馈的信号提供给第一级的扫描输入端,从而以内部扫描模式控制每个F / F。 来自最后级的信号通过外部扫描输出端从逻辑电路提供。
    • 10. 发明申请
    • Logic circuitry having self-test function
    • 逻辑电路具有自检功能
    • US20050005211A1
    • 2005-01-06
    • US10808421
    • 2004-03-25
    • Masafumi TakahashiKenji Ohmori
    • Masafumi TakahashiKenji Ohmori
    • G01R31/28G01R31/3185H01L21/66H01L21/822H01L27/04H03K19/00
    • G01R31/318558G01R31/318541
    • A logic circuit having a self-test function includes a plurality of F/Fs having at least first-, second- and last-stage scanning F/Fs, each having a clock input, a scanning input and a scanning output terminals. The scanning F/Fs are connected one another so as to supply a scanning clock signal to the clock input terminal of each scanning F/F and a signal from the scanning output terminal of the first-stage to the scanning input terminal of the second-stage for sequential logical operations. Also provided in the logic circuit are a data selector to select either an external scanning signal or a signal output from the scanning output terminal of the last-stage and fed back through a feed-back signal line and a scanning controller to supply a control signal to the data selector so as to supply the signal fed back from the last-stage to the scanning input terminal of the first-stage, thus controlling each F/F in an internal scanning mode. The signal from the last-stage is supplied from the logic circuit via an external scanning output terminal.
    • 具有自检功能的逻辑电路包括具有至少第一,第二和最后级扫描F / F的多个F / F,每个F / F均具有时钟输入,扫描输入和扫描输出端。 扫描F / F彼此连接,以将扫描时钟信号提供给每个扫描F / F的时钟输入端,以及从第一级的扫描输出端到第二级的扫描输入端的信号。 顺序逻辑运算的阶段。 还提供在逻辑电路中的数据选择器是选择外部扫描信号或从最后级的扫描输出端输出并通过反馈信号线和扫描控制器反馈的信号,以提供控制信号 到数据选择器,以将从最后级反馈的信号提供给第一级的扫描输入端,从而以内部扫描模式控制每个F / F。 来自最后级的信号通过外部扫描输出端从逻辑电路提供。