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    • 3. 发明授权
    • Gas cluster-ion irradiation apparatus
    • 气体簇离子照射装置
    • US07405394B2
    • 2008-07-29
    • US11173023
    • 2005-07-05
    • Shigeru OnoShinji SasakiKenji FurusawaJiro MatsuoToshio Seki
    • Shigeru OnoShinji SasakiKenji FurusawaJiro MatsuoToshio Seki
    • B01D59/44
    • H01J37/3053H01J2237/04756H01J2237/0812H01J2237/304
    • In a cluster ion beam irradiation apparatus including an apparatus for measuring size and energy distribution of gas cluster ions by using the time of flight (TOF) mass spectrometry, a unit for applying a retarding voltage is disposed in a stage preceding a TOF measuring instrument including a drift tube and a current measuring instrument. By measuring the size and energy distribution of the gas cluster ions and adjusting ionization conditions, cluster ions having predetermined energy and size are supplied to a work surface. In addition, a product of a pressure in an ion transportation device and an ion transportation length is controlled so as to satisfy the relation P×L≦30/N2/3/E1/2 Pa·m, where N is the size of gas cluster ions used for irradiation, and E is kinetic energy (eV) of the gas cluster ions.
    • 在包括用于通过使用飞行时间(TOF)质谱法测量气体簇离子的尺寸和能量分布的装置的集束离子束照射装置中,在TOF测量仪器之前的阶段中设置用于施加延迟电压的单元,包括 漂移管和电流测量仪器。 通过测量气体团簇离子的尺寸和能量分布并调节电离条件,将具有预定能量和尺寸的簇离子供应到工作表面。 此外,控制离子输送装置中的压力和离子输送长度的乘积,以满足关系式PxL <= 30 / N 2/3 / E 1/2 Pa.m,其中N是用于照射的气体簇离子的大小,E是气体簇离子的动能(eV)。