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1. 发明授权

US07719301B2 Testing method of semiconductor integrated circuit and information recording medium 有权
标题翻译：半导体集成电路和信息记录介质的测试方法
公开(公告)号：US07719301B2
公开(公告)日：2010-05-18
申请号：US12066748
申请日：2007-03-06
申请人： Hiromi Tsuchida , Akihiro Maejima , Jinsaku Kaneda , Eisaku Maeda
发明人： Hiromi Tsuchida , Akihiro Maejima , Jinsaku Kaneda , Eisaku Maeda
IPC分类号： G01R31/26
CPC分类号： G01R31/2894
摘要： A testing method of semiconductor integrated circuit wherein the quality of diffusion for semiconductor chips can be tested before the semiconductor chips become packaged semiconductor integrated circuits is provided. Input data is set, and circuit current values I(L) and I(H) obtained for each of a plurality of circuit areas are compared with first test pass ranges I1(L) and I1(H) to extract articles within the first test pass (S2), and the current values of the circuit areas determined to be articles within the first test pass and second test pass ranges I2(L), and I2(H) determined based on these current values are compared, thereby conducting a retest to extract circuit areas within the second test pass. The current values may be replaced by the voltage values.
摘要翻译：提供半导体集成电路的测试方法，其中可以在半导体芯片变成封装半导体集成电路之前测试半导体芯片的扩散质量。设置输入数据，将与多个电路区域中的每一个获得的电路电流值I（L）和I（H）与第一测试通过范围I1（L）和I1（H）进行比较，以提取第一测试（S2），并且将根据这些电流值确定的确定为第一测试通过和第二测试通过范围I2（L）和I2（H）的物品的电路区域的当前值进行比较，从而进行重新测试在第二次测试通过期间提取电路区域。电流值可以由电压值代替。

2. 发明申请

US20090237104A1 TESTING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT AND INFORMATION RECORDING MEDIUM 有权
标题翻译：半导体集成电路和信息记录介质的测试方法
公开(公告)号：US20090237104A1
公开(公告)日：2009-09-24
申请号：US12066748
申请日：2007-03-06
申请人： Hiromi Tsuchida , Akihiro Maejima , Jinsaku Kaneda , Eisaku Maeda
发明人： Hiromi Tsuchida , Akihiro Maejima , Jinsaku Kaneda , Eisaku Maeda
IPC分类号： G01R31/26
CPC分类号： G01R31/2894
摘要： A testing method of semiconductor integrated circuit wherein the quality of diffusion for semiconductor chips can be tested before the semiconductor chips become packaged semiconductor integrated circuits is provided. Input data is set, and circuit current values I(L) and I(H) obtained for each of a plurality of circuit areas are compared with first test pass ranges I1(L) and I1(H) to extract articles within the first test pass (S2), and the current values of the circuit areas determined to be articles within the first test pass and second test pass ranges I2(L), and I2(H) determined based on these current values are compared, thereby conducting a retest to extract circuit areas within the second test pass. The current values may be replaced by the voltage values.
摘要翻译：提供半导体集成电路的测试方法，其中可以在半导体芯片变成封装半导体集成电路之前测试半导体芯片的扩散质量。设置输入数据，将与多个电路区域中的每一个获得的电路电流值I（L）和I（H）与第一测试通过范围I1（L）和I1（H）进行比较，以提取第一测试（S2），并且将根据这些电流值确定的确定为第一测试通过和第二测试通过范围I2（L）和I2（H）的物品的电路区域的当前值进行比较，从而进行重新测试在第二次测试通过期间提取电路区域。电流值可以由电压值代替。

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