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    • 1. 发明申请
    • X-RAY FLUORESCENCE SPECTROMETER AND X-RAY FLUORESCENCE ANALYZING METHOD
    • X射线荧光分光光度计和X射线荧光分析方法
    • US20130101085A1
    • 2013-04-25
    • US13807896
    • 2011-04-21
    • Hiroaki KitaHiroshi Kobayashi
    • Hiroaki KitaHiroshi Kobayashi
    • G01N23/223
    • G01N23/223G01N2223/076G01N2223/3306G01N2223/6116
    • The X-ray fluorescence spectrometer of the present invention includes a sample table (8) for a sample (S) having a crystalline structure, an X-ray source (1), a detecting unit (7) for detecting secondary X-rays (4) from the sample (S), a rotating unit (11) for rotating the sample table (8), a parallel translating unit (12) for causing the sample table (8) to undergo a parallel translational movement, a selecting unit (17) for selecting three of circumvent angles, at which diffracted X-rays can be circumvented, based on a diffraction profile obtained from the angle of rotation of the sample (S) and the intensity of secondary X-rays (4), the interval between the neighboring circumvent angles being smaller than 180°, and a control unit (15) for controlling the rotating unit (11) so as to set the sample (S) at the circumvent angle at which the sample table (8) will not interfere with any other structures.
    • 本发明的X射线荧光光谱仪包括:具有晶体结构的样品(S)的样品台(8),X射线源(1),检测次级X射线的检测单元(7) 4)来自样品(S)的旋转单元(11),用于使样品台(8)旋转的旋转单元(11),用于使样品台(8)进行平行平移运动的平行平移单元(12),选择单元 17),用于根据从样品(S)的旋转角度和次级X射线(4)的强度获得的衍射轮廓,选择衍射X射线可绕出衍射角度的三个角度,间隔 以及控制单元(15),用于控制旋转单元(11),以将样品(S)设置在样品台(8)将不会干涉的旋转角度 与任何其他结构。
    • 2. 发明授权
    • X-ray fluorescence spectrometer and X-ray fluorescence analyzing method
    • X射线荧光光谱仪和X射线荧光分析法
    • US08644450B2
    • 2014-02-04
    • US13807896
    • 2011-04-21
    • Hiroaki KitaHiroshi Kobayashi
    • Hiroaki KitaHiroshi Kobayashi
    • G01N23/223
    • G01N23/223G01N2223/076G01N2223/3306G01N2223/6116
    • The X-ray fluorescence spectrometer of the present invention includes a sample table (8) for a sample (S) having a crystalline structure, an X-ray source (1), a detecting unit (7) for detecting secondary X-rays (4) from the sample (S), a rotating unit (11) for rotating the sample table (8), a parallel translating unit (12) for causing the sample table (8) to undergo a parallel translational movement, a selecting unit (17) for selecting three of circumvent angles, at which diffracted X-rays can be circumvented, based on a diffraction profile obtained from the angle of rotation of the sample (S) and the intensity of secondary X-rays (4), the interval between the neighboring circumvent angles being smaller than 180°, and a control unit (15) for controlling the rotating unit (11) so as to set the sample (S) at the circumvent angle at which the sample table (8) will not interfere with any other structures.
    • 本发明的X射线荧光光谱仪包括:具有晶体结构的样品(S)的样品台(8),X射线源(1),检测次级X射线的检测单元(7) 4)来自样品(S)的旋转单元(11),用于使样品台(8)旋转的旋转单元(11),用于使样品台(8)进行平行平移运动的平行平移单元(12),选择单元 17),用于根据从样品(S)的旋转角度和次级X射线(4)的强度获得的衍射轮廓,选择衍射X射线可绕出衍射角度的三个角度,间隔 以及控制单元(15),用于控制旋转单元(11),以将样品(S)设置在样品台(8)将不会干涉的旋转角度 与任何其他结构。