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1. 发明授权

US06891670B2 Double confocal scanning microscope 有权
标题翻译：双共焦扫描显微镜
公开(公告)号：US06891670B2
公开(公告)日：2005-05-10
申请号：US09683713
申请日：2002-02-06
申请人： Hilmar Gugel , Joerg Bewersdorf , Stefan W. Hell
发明人： Hilmar Gugel , Joerg Bewersdorf , Stefan W. Hell
IPC分类号： G02B21/00 , G02B21/14 , G02B21/06
CPC分类号： G02B21/0032 , G02B21/0056 , G02B21/0068 , G02B21/0076
摘要： The present invention concerns a double confocal scanning microscope having an illuminating beam path (1) of a light source (2) and a detection beam path (3) of a detector (4), and in order to eliminate at their cause the problems of reconstruction methods. To do so, at least one optical component (24, 25) acting on the illuminating and/or detection beam path (1, 3) is provided, and is configured in such a way that it influences the amplitude and/or phase and/or polarization of the light; and the characteristics of the double confocal illumination and/or detection are thereby modifiable.
摘要翻译：本发明涉及一种具有光源（2）的照明光束路径（1）和检测器（4）的检测光束路径（3）的双共焦扫描显微镜，并且为了消除其原因，重建方法。为此，提供作用在照明和/或检测光束路径（1,3）上的至少一个光学部件（24,25），并且被配置成使得其影响幅度和/或相位和/ 或光的极化; 因此可以修改双共聚焦照明和/或检测的特性。

2. 发明申请

US20060291043A1 INTERFERENCE MICROSCOPE, AND METHOD FOR OPERATING AN INTERFERENCE MICROSCOPE 失效
标题翻译：干涉显微镜，以及操作干涉显微镜的方法
公开(公告)号：US20060291043A1
公开(公告)日：2006-12-28
申请号：US11458914
申请日：2006-07-20
申请人： Joerg Bewersdorf , Hilmar Gugel
发明人： Joerg Bewersdorf , Hilmar Gugel
IPC分类号： G02B21/00
CPC分类号： G02B21/082 , G02B21/06 , G02B21/18 , G02B21/34
摘要： The present invention concerns an interference microscope and a method for operating an interference microscope, in particular a 4π microscope, standing wave field microscope, or I2M, I3M, or I5M microscope, at least one specimen support unit associated with the specimen being provided. For determination of the phase position of the interfering light in the specimen region, on the basis of which the interference microscope can be aligned, the interference microscope is characterized in that for determination of the illumination state in the specimen region of the interference microscope, at least one planar area of the specimen support unit is configured to be detectable by light microscopy.
摘要翻译：本发明涉及一种干涉显微镜和用于操作干涉显微镜的方法，特别是4pi显微镜，驻波场显微镜或I 2 M 3 I M，或I ^{5M显微镜，提供与样本相关联的至少一个样本支撑单元。为了确定样本区域中的干涉光的相位位置，基于干涉显微镜可以对准，干涉显微镜的特征在于，为了确定干涉显微镜的样本区域中的照明状态，样本支撑单元的至少一个平面区域被配置为可通过光学显微镜检测。}

3. 发明申请

US20050078361A1 Microscope having a reference specimen 审中-公开
标题翻译：显微镜具有参考标本
公开(公告)号：US20050078361A1
公开(公告)日：2005-04-14
申请号：US10919899
申请日：2004-08-17
申请人： Joerg Bewersdorf , Hilmar Gugel
发明人： Joerg Bewersdorf , Hilmar Gugel
IPC分类号： G02B21/34 , G02B21/00
CPC分类号： G02B21/0024 , G02B21/006 , G02B21/0076
摘要： The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.
摘要翻译：本发明涉及显微镜，特别是共聚焦或双共聚焦扫描显微镜，以及用于操作显微镜的方法，至少一个与所述样本相关联的样本支撑单元，提供了至少一个已知构造的参考样本，并且通过光学显微镜检测参考样品用于显微镜的校准，对准或调整。利用根据本发明的显微镜和用于操作显微镜的根据本发明的方法，可以检测和补偿漂移相关的变化。还提供了可以容易且可靠地聚焦的试样的辅助装置。

4. 发明授权

US07742226B2 Interference microscope, and method for operating an interference microscope 失效
标题翻译：干涉显微镜和干涉显微镜的操作方法
公开(公告)号：US07742226B2
公开(公告)日：2010-06-22
申请号：US11458914
申请日：2006-07-20
申请人： Joerg Bewersdorf , Hilmar Gugel
发明人： Joerg Bewersdorf , Hilmar Gugel
IPC分类号： G02B21/06 , G02B21/00
CPC分类号： G02B21/082 , G02B21/06 , G02B21/18 , G02B21/34
摘要： The present invention concerns an interference microscope and a method for operating an interference microscope, in particular a 4π microscope, standing wave field microscope, or I2M, I3M, or I5M microscope, at least one specimen support unit associated with the specimen being provided. For determination of the phase position of the interfering light in the specimen region, on the basis of which the interference microscope can be aligned, the interference microscope is characterized in that for determination of the illumination state in the specimen region of the interference microscope, at least one planar area of the specimen support unit is configured to be detectable by light microscopy.
摘要翻译：本发明涉及一种干涉显微镜和用于操作干涉显微镜的方法，特别是涉及一种干涉显微镜，显微镜，驻波场显微镜或I2M，I3M或I5M显微镜，提供至少一个与样品相关的样品支撑单元。为了确定样本区域中的干涉光的相位位置，基于干涉显微镜可以对准，干涉显微镜的特征在于，为了确定干涉显微镜的样本区域中的照明状态，样本支撑单元的至少一个平面区域被配置为可通过光学显微镜检测。

5. 发明授权

US06798569B2 Microscope and method for operating a microscope 有权
标题翻译：显微镜和操作显微镜的方法
公开(公告)号：US06798569B2
公开(公告)日：2004-09-28
申请号：US10037851
申请日：2002-01-04
申请人： Joerg Bewersdorf , Hilmar Gugel
发明人： Joerg Bewersdorf , Hilmar Gugel
IPC分类号： G02B2100
CPC分类号： G02B21/0024 , G02B21/006 , G02B21/0076
摘要： The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.
摘要翻译：本发明涉及显微镜，特别是共聚焦或双共聚焦扫描显微镜，以及用于操作显微镜的方法，至少一个与所述样本相关联的样本支撑单元，提供了至少一个已知构造的参考样本，并且通过光学显微镜检测参考样品用于显微镜的校准，对准或调整。利用根据本发明的显微镜和用于操作显微镜的根据本发明的方法，可以检测和补偿漂移相关的变化。还提供了可以容易且可靠地聚焦的试样的辅助装置。

6. 发明授权

US06570705B2 Optical arrangement for illuminating objects and double—confocal scanning microscope 有权
标题翻译：用于照明物体的光学布置和双共焦扫描显微镜
公开(公告)号：US06570705B2
公开(公告)日：2003-05-27
申请号：US09954018
申请日：2001-09-18
申请人： Joerg Bewersdorf , Hilmar Gugel , Juergen Hoffmann
发明人： Joerg Bewersdorf , Hilmar Gugel , Juergen Hoffmann
IPC分类号： G02B2106
CPC分类号： G02B21/0076 , G02B21/0032 , G02B21/088 , G02B26/06
摘要： The present invention relates to an optical arrangement for illuminating objects (1), in particular fluorescent objects, preferably in conjunction with a confocal or a double-confocal scanning microscope, having an illuminating beam path (2) of a light source (3), a detection beam path (4) of a detector (5), and a component (6) which unifies the detection beam path (4). For the purpose of at least largely loss-free union of the light coming from the object (1) into a propagation direction (19), the optical arrangement according to the invention is characterized in that with reference to the beam cross section active for the detector, light of the fist and second partial detection beam can be united at least largely in an overlapping fashion into one propagation direction (19) at the component (6) thereby providing an unified the detection beam path (4).
摘要翻译：本发明涉及一种用于照射物体（1）的光学装置，特别是荧光物体，优选与共聚焦或双共焦扫描显微镜结合，具有光源（3）的照明光束路径（2）检测器（5）的检测光束路径（4）和统一检测光路（4）的部件（6）。为了将来自物体（1）的光至少在很大程度上无损地结合到传播方向（19）中，根据本发明的光学装置的特征在于，参考对于检测器，第一部分检测光束和第二部分检测光束的光可以至少大部分地以组合（6）的一个传播方向（19）重叠地组合在一起，从而提供统一的检测光束路径（4）。

7. 发明授权

US08879148B2 Pulse combiner for the various spectral colors of a supercontinuum laser pulse 有权
标题翻译：脉冲组合器用于超连续谱激光脉冲的各种光谱颜色
公开(公告)号：US08879148B2
公开(公告)日：2014-11-04
申请号：US13402007
申请日：2012-02-22
申请人： Arno Florian Warken , Hilmar Gugel
发明人： Arno Florian Warken , Hilmar Gugel
IPC分类号： G02B21/06 , G02B21/00 , G01J3/02 , G01J3/10 , G01J3/44 , G01N21/64
CPC分类号： G02B21/0032 , G01J3/0205 , G01J3/0218 , G01J3/10 , G01J3/4406 , G01N21/6408 , G01N21/6458 , G02B21/0076 , G02B2207/114
摘要： An illumination device (20) for a microscope (40) has a laser unit (24) that generates at least one broadband laser light pulse (30); light components (71, 72, 73, 74, 75, 76) of different wavelengths of said broadband laser light pulse (30) being offset in time from one another. A compensation unit (36) disposed in the path of the broadband laser light pulse (30) temporally offsets the light components (71, 72, 73, 74, 75, 76) of the broadband laser light pulse (30) in such a way that they exit the compensation unit (36) simultaneously or nearly simultaneously.
摘要翻译：用于显微镜（40）的照明装置（20）具有产生至少一个宽带激光脉冲（30）的激光单元（24）; 所述宽带激光脉冲（30）的不同波长的光分量（71,72,73,74,75,76）在时间上彼此抵消。布置在宽带激光脉冲（30）的路径中的补偿单元（36）以这种方式暂时偏移宽带激光脉冲（30）的光分量（71,72,73,74,75,76）他们同时或几乎同时离开补偿单元（36）。

8. 发明授权

US08718414B2 Acousto-optical tunable filter element 有权
标题翻译：声光可调谐滤光片
公开(公告)号：US08718414B2
公开(公告)日：2014-05-06
申请号：US13366670
申请日：2012-02-06
申请人： Hilmar Gugel , Volker Seyfried
发明人： Hilmar Gugel , Volker Seyfried
IPC分类号： G02F1/335 , G02F1/11
CPC分类号： G02F1/116 , G02B3/0087 , G02B21/0032 , G02B21/0064 , G02B21/16 , G02B27/0927 , G02B27/42 , G02B27/46 , G02F1/00 , G02F1/01 , G02F1/03 , G02F1/11 , G02F1/29 , G02F1/33 , G02F1/353 , G02F2201/305 , G02F2202/32 , G02F2203/12 , G02F2203/18 , G02F2203/24
摘要： An acousto-optical filter element (114) is provided which has an acousto-optical crystal (118) having an acoustic signal transmitter (120) for generating acoustic signals in the acousto-optical crystal (118). The acousto-optical crystal (118) is designed to selectively spatially deflect light of a target wavelength from an input light beam (116) entering into the acousto-optical crystal (118), as a function of a high frequency applied to the acoustic signal transmitter (120), and to thereby produce a target light beam (126) having the target wavelength. In addition, the acousto-optical filter element (114) includes a spatial filter element (132) which is located in the target light beam (126) and is designed to selectively suppress the intensity of the target light beam (126) in a plane perpendicular to the propagation direction of the target light beam (126).
摘要翻译：提供一种声光滤波器元件（114），其具有声光晶体（118），该声光晶体具有用于在声光晶体（118）中产生声信号的声信号发射器（120）。声光晶体（118）被设计为根据进入声光晶体（118）的输入光束（116）选择性地空间偏转目标波长的光，作为施加到声信号的高频的函数发射器（120），从而产生具有目标波长的目标光束（126）。此外，声光滤波器元件（114）包括位于目标光束（126）中的空间滤光元件（132），并被设计成选择性地抑制平面中的目标光束（126）的强度垂直于目标光束（126）的传播方向。

9. 发明授权

US07466885B2 Light source comprising a plurality of microstructured optical elements 有权
标题翻译：光源包括多个微结构化光学元件
公开(公告)号：US07466885B2
公开(公告)日：2008-12-16
申请号：US10570486
申请日：2004-09-06
申请人： Hilmar Gugel
发明人： Hilmar Gugel
IPC分类号： G02B6/12 , G02B6/26 , G02B6/02
CPC分类号： G02B21/0076 , G02B21/0032 , G02F2001/3528
摘要： The invention relates to a light source comprising a microstructured optical element (11) that receives and spectrally spreads the light from a primary light source (3). The inventive light source is characterized in that the spectrally spread light penetrates at least one other microstructured optical element (15, 19, 21). Said light source can be efficiently used in scanning microscopy and especially in STED microscopy.
摘要翻译：本发明涉及一种光源，其包括微结构化光学元件（11），其接收并光谱地扩展来自主光源（3）的光。本发明的光源的特征在于，光谱扩展的光穿透至少一个其它微结构光学元件（15,19,21）。所述光源可以有效地用于扫描显微镜，特别是在STED显微镜中。

10. 发明申请

US20070206278A1 Method and microscope for high spatial resolution examination of samples 有权
标题翻译：样品高空间分辨率检测方法与显微镜
公开(公告)号：US20070206278A1
公开(公告)日：2007-09-06
申请号：US11653446
申请日：2007-01-16
申请人： Marcus Dyba , Hilmar Gugel
发明人： Marcus Dyba , Hilmar Gugel
IPC分类号： G02B21/06
CPC分类号： G02B27/58 , G02B21/0076
摘要： A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, A), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in the form of a focal line (10) with a cross-sectional profile having at least one intensity zero point (5) with laterally neighboring intensity maxima (9).
摘要翻译：一种用于样品的高空间分辨率检查的方法和显微镜，特别是激光扫描荧光显微镜，待检查的样品（1）包括可以从第一状态（Z 1，A）重复转换成第二状态（Z 2，A），第一状态和第二状态（Z 1，A; Z 2，B）在至少一个光学特性中彼此不同，包括以下步骤：样本区域（P）被记录的信号首先进入第一状态（Z 1，A），并且通过光信号（4）感应第二状态（Z 2，B），在样本区域内特别排除空间划分的子区域（P）被定义为光信号（4）以焦线（10）的形式提供，其横截面轮廓具有至少一个具有横向相邻的强度最大值的强度零点（5）（9）。

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