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1. 发明申请

US20110279670A1 Apparatus for Measuring Three-Dimensional Profile Using LCD 审中-公开
标题翻译：使用LCD测量三维轮廓的装置
公开(公告)号：US20110279670A1
公开(公告)日：2011-11-17
申请号：US12674173
申请日：2008-08-11
申请人： Heui-Jae Park , Il-Hwan Lee , Soon-Min Choi , Jeong-Ho Lee
发明人： Heui-Jae Park , Il-Hwan Lee , Soon-Min Choi , Jeong-Ho Lee
IPC分类号： H04N7/18
CPC分类号： G01B11/2518
摘要： Provided is an apparatus for measuring a three-dimensional profile using a LCD in which a sine wave pattern is formed on a measurement object, whereby image information of the measurement object is obtained using the sine wave pattern and a camera, and the image information is analyzed to measure a profile of the measurement object, the apparatus including a LCD projector including: a light source irradiating light forward; a LCD panel disposed at a front side of the light source, generating a sine wave pattern having a plurality of phases and a plurality of periods; polarization plates respectively disposed on front and rear sides of the LCD panel; a first focusing lens disposed apart from a front side of the LCD panel, focusing the sine wave pattern generated by the LCD panel on the measurement object; and a housing supporting the light source, the LCD panel, the polarization plates and the first focusing lens.
摘要翻译：本发明提供一种使用在测量对象上形成正弦波图案的LCD来测量三维轮廓的装置，由此利用正弦波图形和照相机获得测量对象的图像信息，并且图像信息是分析以测量测量对象的轮廓，该装置包括一个LCD投影仪，其包括：向前照射光的光源; 设置在所述光源的前侧的LCD面板，产生具有多个相位和多个周期的正弦波图案; 分别设置在LCD面板的前侧和后侧的偏振板; 第一聚焦透镜，其与LCD面板的前侧分离，将由LCD面板产生的正弦波图案聚焦在测量对象上; 以及支撑光源，LCD面板，偏振板和第一聚焦透镜的壳体。

2. 发明申请

US20110043794A1 Dark-Field Examination Device 有权
标题翻译：暗场检查装置
公开(公告)号：US20110043794A1
公开(公告)日：2011-02-24
申请号：US12673525
申请日：2009-01-16
申请人： Tai-Wook Kim , Heui-Jae Park , Il-Hwan Lee
发明人： Tai-Wook Kim , Heui-Jae Park , Il-Hwan Lee
IPC分类号： G01N21/00
CPC分类号： G01N21/956 , G01N2021/8822 , G01N2021/9513 , G02F1/1303
摘要： The present invention relates to a dark-field examination device. The dark-field examination device according to the present invention is characterized in that it comprises: an illumination unit for irradiating light towards an examination object on a base; a reflection unit for reflecting, back towards the examination object, incident light which has been reflected by means of the examination object or incident light which has passed through the base; and an imaging unit for imaging the examination object by receiving light which has been scattered by means of the examination object, and in that the illumination unit, the reflection unit and the imaging unit are arranged in such a way that part of the light which has been irradiated from the illumination unit is scattered by means of the examination object and falls incident upon the imaging unit while another part of the light which has been irradiated from the illumination unit falls incident upon the reflection unit, and the light reflected back towards the examination object by means of the reflection unit is scattered by means of the examination object and falls incident upon the imaging unit.
摘要翻译：本发明涉及一种暗视野检查装置。根据本发明的暗视野检查装置的特征在于，它包括：照明单元，用于向基座上的检查对象照射光; 反射单元，用于向检查对象反射已经通过检查对象反射的入射光或已经穿过基座的入射光; 以及成像单元，用于通过接收通过检查对象散射的光来对检查对象进行成像，并且照明单元，反射单元和成像单元被布置成使得具有从照明单元照射的照射单元通过检查对象物散射并入射到成像单元上，而从照明单元照射的另一部分光入射到反射单元上，并且将光反射回检查通过反射单元的物体通过检查对象散射并落在成像单元上。

3. 发明授权

US08223326B2 Dark-field examination device 有权
标题翻译：暗场检查装置
公开(公告)号：US08223326B2
公开(公告)日：2012-07-17
申请号：US12673525
申请日：2009-01-16
申请人： Tai-Wook Kim , Heui-Jae Park , Il-Hwan Lee
发明人： Tai-Wook Kim , Heui-Jae Park , Il-Hwan Lee
IPC分类号： G01N21/00
CPC分类号： G01N21/956 , G01N2021/8822 , G01N2021/9513 , G02F1/1303
摘要： The present invention relates to a dark-field examination device. The dark-field examination device according to the present invention is characterized in that it comprises: an illumination unit for irradiating light towards an examination object on a base; a reflection unit for reflecting, back towards the examination object, incident light which has been reflected by means of the examination object or incident light which has passed through the base; and an imaging unit for imaging the examination object by receiving light which has been scattered by means of the examination object, and in that the illumination unit, the reflection unit and the imaging unit are arranged in such a way that part of the light which has been irradiated from the illumination unit is scattered by means of the examination object and falls incident upon the imaging unit while another part of the light which has been irradiated from the illumination unit falls incident upon the reflection unit, and the light reflected back towards the examination object by means of the reflection unit is scattered by means of the examination object and falls incident upon the imaging unit.
摘要翻译：本发明涉及一种暗视野检查装置。根据本发明的暗视野检查装置的特征在于，它包括：照明单元，用于向基座上的检查对象照射光; 反射单元，用于向检查对象反射已经通过检查对象反射的入射光或已经穿过基座的入射光; 以及成像单元，用于通过接收通过检查对象散射的光来对检查对象进行成像，并且照明单元，反射单元和成像单元被布置成使得具有从照明单元照射的照射单元通过检查对象物散射并入射到成像单元上，而从照明单元照射的另一部分光入射到反射单元上，并且将光反射回检查通过反射单元的物体通过检查对象散射并落在成像单元上。

4. 发明授权

US07113273B2 Machine and method for inspecting ferrule of optical connector 有权
标题翻译：光连接器套管检测机及方法
公开(公告)号：US07113273B2
公开(公告)日：2006-09-26
申请号：US10501381
申请日：2003-01-17
申请人： Heui-Jae Pahk , Il-Hwan Lee , Hwa-Kyun Lee , Dong-Sung Lee
发明人： Heui-Jae Pahk , Il-Hwan Lee , Hwa-Kyun Lee , Dong-Sung Lee
IPC分类号： G01N21/00 , G06K9/00
CPC分类号： G01B11/08 , G01B11/12
摘要： Provided is a machine for inspecting ferrules of an optical connector and a method thereof. A fixture arranges the ferrules on a rectangular system to inspect the ferrules. A robot centers first ferrule on a optical system and focuses the first ferrule on the optical system. The optical system includes two cameras for photographing inside diameter image data and outside diameter image data of the ferrule. While the robot moves sequentially the optical system and remaining ferrules, all the inside and outside diameter image data of the ferrules are in sequence obtained by the optical system. Each inside and outside diameter and eccentricity of the ferrules are calculated by the obtained inside and outside diameter image data via a computer program.
摘要翻译：提供一种用于检查光连接器的套圈的机器及其方法。夹具将套管布置在矩形系统上以检查套圈。机器人将光学系统上的第一套圈中心并将第一套圈聚焦在光学系统上。光学系统包括用于拍摄内径图像数据和套圈的外径图像数据的两个相机。当机器人依次移动光学系统和剩余的套圈时，套管的所有内外径图像数据依次由光学系统获得。通过计算机程序通过获得的内外图像数据计算套圈的内外径和偏心度。

5. 发明申请

US20050041241A1 Machine and method for inspecting ferrule of optical connector 有权
标题翻译：光连接器套管检测机及方法
公开(公告)号：US20050041241A1
公开(公告)日：2005-02-24
申请号：US10501381
申请日：2003-01-17
申请人： Heui-Jae Pahk , Il-Hwan Lee , Hwa-Kyun Lee , Dong-Sung Lee
发明人： Heui-Jae Pahk , Il-Hwan Lee , Hwa-Kyun Lee , Dong-Sung Lee
IPC分类号： G01M11/00 , G01B11/08 , G01B11/12 , G02B6/36 , G02B27/00 , G01N21/88
CPC分类号： G01B11/08 , G01B11/12
摘要： Provided is a machine for inspecting ferrules of an optical connector and a method thereof. A fixture arranges the ferrules on a rectangular system to inspect the ferrules. A robot centers first ferrule on a optical system and focuses the first ferrule on the optical system. The optical system includes two cameras for photographing inside diameter image data and outside diameter image data of the ferrule. While the robot moves sequentially the optical system and remaining ferrules, all the inside and outside diameter image data of the ferrules are in sequence obtained by the optical system. Each inside and outside diameter and eccentricity of the ferrules are calculated by the obtained inside and outside diameter image data via a computer program.
摘要翻译：提供一种用于检查光连接器的套圈的机器及其方法。夹具将套管布置在矩形系统上以检查套圈。机器人将光学系统上的第一套圈中心并将第一套圈聚焦在光学系统上。光学系统包括用于拍摄内径图像数据和套圈的外径图像数据的两个相机。当机器人依次移动光学系统和剩余的套圈时，套管的所有内外径图像数据依次由光学系统获得。通过计算机程序通过获得的内外图像数据计算套圈的内外径和偏心度。

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