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    • 1. 发明授权
    • Method for producing a diaphragm sensor array and diaphragm sensor array
    • 隔膜传感器阵列和隔膜传感器阵列的制造方法
    • US06506621B1
    • 2003-01-14
    • US10016026
    • 2001-12-12
    • Hans ArtmannThorsten PannekRobert Siegel
    • Hans ArtmannThorsten PannekRobert Siegel
    • H01L2100
    • G01J5/06B81B3/0081B81B2203/0127B81B2203/0315B81C2201/0115B81C2201/0136G01J5/10
    • In a method for producing a diaphragm sensor array having a semiconductor material substrate on which a plurality of planar diaphragm regions is arranged as a carrier layer for sensor elements, the planar diaphragm regions are thermally decoupled from one another by crosspieces made of a material having clearly better heat conductive properties compared to the diaphragm regions and the lateral surroundings of the crosspieces. Masking for a subsequent step for producing porous semiconductor material is applied at the locations of the semiconductor material substrate at which the crosspieces for the thermal decoupling are formed, and the semiconductor regions not protected by the masking are rendered porous and the diaphragm regions are produced thereupon. Instead of using porous silicon, a plasma etching process may be performed from the backside of a semiconductor material substrate. In particular, high integration densities of diaphragm sensors may be achieved with both methods. A diaphragm sensor array is produced by one of the methods.
    • 在具有半导体材料基板的膜片传感器阵列的制造方法中,多个平面膜片区域被布置为传感器元件的载体层,平面隔膜区域通过由具有清楚的材料制成的横条而彼此热分离 与隔膜区域和横梁的横向周围相比,具有更好的导热性能。 在用于制造多孔半导体材料的后续步骤中的掩模被应用于半导体材料基板的用于形成用于热解耦的接头的位置处,并且未被掩蔽保护的半导体区域变得多孔,并且在其上产生隔膜区域 。 代替使用多孔硅,可以从半导体材料基板的背面进行等离子体蚀刻工艺。 特别地,可以通过两种方法实现膜片传感器的高集成度。 通过这些方法之一产生膜片传感器阵列。
    • 3. 发明授权
    • Structural element having a porous region at least regionally provided with a cover layer and its use as well as method for setting the thermal conductivity of a porous region
    • 具有至少区域地设置有覆盖层的多孔区域的结构元件及其用途以及用于设定多孔区域的热导率的方法
    • US07709933B2
    • 2010-05-04
    • US10742055
    • 2003-12-18
    • Hans ArtmannThorsten PannekHans-Peter TrahFranz Laermer
    • Hans ArtmannThorsten PannekHans-Peter TrahFranz Laermer
    • H01L31/036
    • C04B38/007B81C1/00492B81C2201/0115C04B2111/28C04B35/14
    • A structural element having a region of porous silicon or porous silicon oxide, which was obtained from a porization, starting from an edge area of the region, in at least largely crystalline silicon. Relative to the edge area, the crystalline silicon has a crystal orientation that has an orientation that differs from a orientation or from an orientation that is equivalent for reasons of symmetry. This structural element is suited for use in a mass-flow sensor, in a component for the thermal decoupling of sensor and/or actuator structures, or a gas sensor. Furthermore, methods for setting the thermal conductivity of a region of porous silicon or porous silicon oxide of a structural element are described. In particular, in a porization of crystalline silicon, starting from an edge area of the region, the crystalline orientation of the silicon relative to the edge area is selected such that a thermal conductivity comes about along a direction perpendicular to the edge area that differs from, in particular is lower than, the thermal conductivity, that comes about in this direction in an otherwise analogous porization of crystalline silicon having a orientation or an equivalent orientation relative to this edge area.
    • 具有多孔硅或多孔氧化硅区域的结构元件,其从至少大部分为晶体硅的区域的边缘区域开始从孔化获得。 相对于边缘区域,晶体硅具有取向不同于<100>取向的晶体取向或者由于对称原因等同的取向。 该结构元件适用于质量流量传感器,用于传感器和/或致动器结构或气体传感器的热解耦的部件。 此外,描述了用于设定结构元件的多孔硅或多孔氧化硅区域的热导率的方法。 特别地,在从区域的边缘区域开始的晶体硅的孔化中,选择硅相对于边缘区域的晶体取向,使得热导率沿垂直于与边缘区域不同的边缘区域的方向 ,特别是低于导热率,其在相对于该边缘区域具有<100>取向或等同取向的晶体硅的另外类似的孔化中在该方向上。
    • 8. 发明授权
    • Method for producing diaphragm sensor unit and diaphragm sensor unit
    • 膜片传感器单元和隔膜传感器单元的制造方法
    • US06759265B2
    • 2004-07-06
    • US10268711
    • 2002-10-10
    • Hans ArtmannThorsten Pannek
    • Hans ArtmannThorsten Pannek
    • H01L2100
    • B81C1/0069B81B2203/0127B81B2203/0315B81C2201/0115B81C2201/0136B81C2201/0139
    • In a method for producing a diaphragm sensor unit having a semiconductor material substrate, a flat diaphragm and an insulating well for thermal insulation below the diaphragm are generated, for the formation of sensor element structures for at least one sensor. The substrate, made of semiconductor material, in a specified region, which defines sensor element structures, receives a deliberately different doping from the surrounding semiconductor material, that porous semiconductor material is generated from semiconductor material sections between the regions distinguished by doping, and semiconductor material in the well region under semiconductor is rendered porous and under parts of the sensor element structure is removed and/or rendered porous.
    • 在制造具有半导体材料基板的隔膜传感器单元的方法中,产生用于形成用于至少一个传感器的传感器元件结构的隔膜下方的平坦隔膜和隔热绝缘孔。 由限定传感器元件结构的特定区域中的由半导体材料制成的衬底接收与周围半导体材料的故意不同的掺杂,多孔半导体材料是由掺杂区域之间的半导体材料部分和半导体材料 在半导体中的阱区域被多孔化并且在传感器元件结构的部分被去除和/或变得多孔的情况下。
    • 9. 发明授权
    • Flow sensor
    • 流量传感器
    • US07040160B2
    • 2006-05-09
    • US10432542
    • 2001-10-11
    • Hans ArtmannThorsten PannekUwe Konzelmann
    • Hans ArtmannThorsten PannekUwe Konzelmann
    • G01F1/68
    • G01F1/6845
    • A flow sensor is described, in particular for analysis of gas flows, having a substrate and at least one sensor component which is sensitive to a flow of a medium, the sensor component being separated from the substrate in at least some areas by a region that is a poor heat conductor compared to the substrate. In addition, the region having poor heat conductivity is a porous silicon region or a porous silicon oxide region, or the region having poor heat conductivity is a recess in the surface of the substrate above which the sensor element (15) is situated on at least one web which bridges the recess and is at least mostly unsupported. The flow sensor described here is particularly suitable for angle-dependent detection of a gas flow.
    • 描述了一种流量传感器,特别是用于分析气体流动,具有基底和至少一个对介质流动敏感的传感器部件,传感器部件在至少一些区域与基底分离,区域为 与基底相比,导热系数差。 此外,导热性差的区域是多孔硅区域或多孔氧化硅区域,或者导热性差的区域是衬底表面中的凹部,传感器元件(15)至少位于其上 一个网桥连接凹槽,并且至少几乎不被支撑。 这里描述的流量传感器特别适用于气流的角度依赖检测。