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    • 10. 发明专利
    • DE3688222T2
    • 1993-11-04
    • DE3688222
    • 1986-07-10
    • HITACHI LTD
    • WATANABE TAKAOKITUKAWA GOROHORI RYOICHIITOH KIYOOKAWAJIRI YOSHIKIKAWAHARA TAKAYUKI
    • G11C7/12G11C8/10H03K5/08H03K17/00H03K17/693H03K19/017H03K19/0175H03K19/0944H03K5/02H03K19/08H03K19/01H03K19/096G11C7/00
    • A semiconductor device of high integration density and low power consumption prevents the influence of the amplitude of an input signal upon the amplitude of an output signal in such a way that a preceding circuit (C) and a succeeding circuit (D) are endowed with different reference voltages.In an aspect of performance, the semiconductor device is constructed of a circuit which includes a bipolar transistor (26) and an insulated-gate field effect transistor (25, 27, 291, and which operates with reference to one or more voltages (B1), at least one of the reference voltages having a voltage value different from a reference operating voltage (VA) of a preceding circuit (CI which controls the above circuit.In another aspect of performance, first switching means is interposed between a first reference voltage and an input node of a driver circuit, and second switching means is interposed between an output of a preceding circuit and the input of the driver circuit, so that when an output signal of the preceding circuit is at a high level, the second switch is turned "on" while the first switch is turned "off" thereby to produce a still higher potential, and that when the output signal of the preceding circuit is at a low level, the second switch is turned "off" while the first switch is turned "on".The semiconductor device is suited to those circuits of a high-density DRAM and SRAM which use voltage limiters.