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    • 1. 发明专利
    • CONDUCTIVITY MEASURING METHOD
    • JPS55112573A
    • 1980-08-30
    • JP1939079
    • 1979-02-21
    • HITACHI CABLE
    • TAKAGI TERUOKONDOU MASAOMI
    • G01R27/02
    • PURPOSE:To reduce the number of processes and make it possible to measure conductivity in a short time by obtaining the resistance value and the sectional area of a conductive material by operations and by obtaining conductivity of the conductive material from these operation results by operations. CONSTITUTION:Sample 1 is set on sample stand, and dimension measuring equipment 2 is turned around sample 1 to measure outside dimensions of each part, and micro computer 6 is used to operate the sectional area of sample 1 on a basis of obtained measure values. Simultaneously, a constant current is flowed from constant current source 4 to sample 1, and voltage drop between two points A and B of sample 1 is measured at this time by high-precision voltmeter 5, and micro computer 6 is used to operate the resistance value per unit length of sample 1 on a basis of the measure value and the current value. Next, micro computer 6 is used to operate conductivity of sample 1 on a basis of the sectional area and the resistance value per unit length of sample 1.
    • 2. 发明专利
    • DEVICE FOR MEASURING SIZE
    • JPS55136903A
    • 1980-10-25
    • JP4498779
    • 1979-04-12
    • HITACHI CABLEKEISOKU GIJUTSU KENKYUSHO
    • KONDOU MASAOMIWATANABE MASARUTODOKORO MINORU
    • G01B11/02
    • PURPOSE:To accurately measure the size of an article by stabilizing the sizing clock on the basis of a signal from an image sensor and the sizing clock having predetermined frequency from a PLL circuit. CONSTITUTION:When an article 14 is irradiated by a light source 15 and the light from the light source 15 is received through the article 14 by an image sensor 1, the sensor 1 produces a signal having a waveform shown in Fig. a. When the signal a is fed through an amplifier 9 and an envelope circuit 10, the circuit 10 produces a signal having a waveform shown in Fig. b. The signal output from the circuit 10 is then applied to a waveform shaper 11, which produces a signal c having pulse width t corresponding to the size of an article 14 to be measured. When the signal from the sensor 1 is, on the other hand, applied to a PLL circuit, the circuit produces a sizing clock having predetermined frequency shown in Fig. d from a variable frequency oscillator 6. When the output from the shaper 11 and the output from the oscillator 6 are then applied to an AND gate 14 as shown in Figs. c and d, the AND gate 14 produces a signal e having pulse number corresponding to the width of silver plated portion 18. The pulse number is counted by a counter 15 to measure the width of the portion 18.
    • 4. 发明专利
    • DEVICE FOR MEASURING PATTERN ON SURFACE OF ARTICLE
    • JPS55136902A
    • 1980-10-25
    • JP4498679
    • 1979-04-12
    • HITACHI CABLEKEISOKU GIJUTSU KENKYUSHO
    • KONDOU MASAOMIWATANABE MASARUTODOKORO MINORU
    • G01B11/02G01B11/24
    • PURPOSE:To measure the plated state of an article on which surface is not partially plated on the basis of a sizing clock having predetermined frequency from a PLL circuit and of a signal from an image sensor. CONSTITUTION:Light rays are irradiated from a light source 19 to a flat article 16 on which silver is plated on the portion 18 on the surface of a copper plate 17. When the reflected light rays are applied to an image sensor 1, a signal having a waveform shown in Fig. a is produced from the sensor 1, because the reflectivities of the copper plate 17 and the silver plated portion 18 are different. When the signal a is fed through an amplifier 9 and an envelope circuit 10, the circuit 10 produces a signal having a waveform shown in Fig. b. When the output of the circuit 10 is applied to a waveform shaper 11, the shaper 11 prlduces a signal c having a pulse duration t corresponding to the width of the portion 18. When the signal output from the sensor 1 is applied, on the other hand, to a PLL circuit 2, the circuit 2 generates a sizing clock having predetermined frequency shown in Fig. d from a variable frequency oscillator 6. The output from the shaper 11 and the output from the oscillator 6 are applied then to an AND gate 14 as shown in Figs. c and d. Thus, the AND gate 14 produces a signal e having pulse number corresponding to the width of the portion 18. The pulse number is counted by a counter 15 to measure the width of the portion 18.
    • 8. 发明专利
    • INSPECTION APPARATUS FOR SURFACE CONDITION
    • JPS55136943A
    • 1980-10-25
    • JP4498579
    • 1979-04-12
    • HITACHI CABLEKEISOKU GIJUTSU KENKYUSHO
    • KONDOU MASAOMIWATANABE MASARUTODOKORO MINORU
    • G01B11/30G01N21/88G01N21/89G01N21/892G01N21/94G01N29/04
    • PURPOSE:To improve the inspection precision of the surface condition of a body by finding in order the difference between an original signal and a plurality of delay signals formed from the original signal in order to obtain a response signal even from a defect of a gentle change. CONSTITUTION:A light-receiving device 32 outputs a signal (a) which has a response part (A) corresponding to a sharp defect 34 and a response part (B) corresponding to a gentle defect 34'. The signal (a) is sent to an amplifier 9 and an envelope circuit 10 to obtain a signal (b), which is provided with delays in delay circuits 111, 112, and 113 to obtain signals (e), (f), and (i) respectively. The difference between the signals (e), (f), and (i) and the original signal (b) is subtracted from the signals (e), (f), and (i) in differential amplifiers 121, 122, and 123 to obtain signals (d), (g), and (j) respectively. The signal (e) having a pulse (C) corresponding to the sharp defect 34 is obtained from the signal (d), a signal (h), from the signal (g), and a signal (k) having a pulse (D) corresponding to the gentle defect 34', from the signal (j). The signals (e), (h), and (k) are transmitted to an OR circuit 16 to obtain a signal l having the pulses (C) and (D) corresponding to the defect part.