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1. 发明申请

US20130043771A1 MESA-TYPE QUARTZ-CRYSTAL VIBRATING PIECE AND QUARTZ CRYSTAL DEVICE 有权
标题翻译： MESA型晶体振荡片和QUARTZ晶体器件
公开(公告)号：US20130043771A1
公开(公告)日：2013-02-21
申请号：US13584829
申请日：2012-08-14
申请人： HIROYUKI SASAKI , KENJI SHIMAO , MANABU ISHIKAWA
发明人： HIROYUKI SASAKI , KENJI SHIMAO , MANABU ISHIKAWA
IPC分类号： H01L41/047 , H01L41/053
CPC分类号： H03H9/0595 , H03H9/09 , H03H9/1035 , H03H9/19
摘要： A mesa-type quartz-crystal vibrating piece includes a vibrator in a quadrangular shape with both main surfaces, a pair of excitation electrodes on both the main surfaces, a thin portion outside of the quadrangular shape, and a pair of extraction electrodes. The thin portion has a thickness thinner than a thickness of the vibrator. The pair of extraction electrodes are extracted from the excitation electrodes to a predetermined direction. A center of a first length in the predetermined direction of the excitation electrode is decentered from a center of a second length in the predetermined direction. The second length includes a length of the vibrator and a length of the thin portion. The center of the first length is decentered toward an opposite side of the extraction electrode by 25 μm to 65 μm.
摘要翻译：台面型石英振动片包括具有两个主表面的四边形振动器，两个主表面上的一对激励电极，四边形外部的薄部分和一对提取电极。该薄壁部的厚度比振动体的厚度薄。将一对提取电极从激励电极提取到预定方向。在激励电极的预定方向上的第一长度的中心从预定方向上的第二长度的中心偏心。第二长度包括振动器的长度和薄部分的长度。第一长度的中心朝向引出电极的相对侧偏心25μm至65μm。

2. 发明申请

US20120242195A1 CRYSTAL DEVICE AND INSPECTION METHOD OF CRYSTAL DEVICE 失效
标题翻译：晶体器件的晶体和检测方法
公开(公告)号：US20120242195A1
公开(公告)日：2012-09-27
申请号：US13426613
申请日：2012-03-22
申请人： KENJI SHIMAO , MANABU ISHIKAWA , HIROYUKI SASAKI
发明人： KENJI SHIMAO , MANABU ISHIKAWA , HIROYUKI SASAKI
IPC分类号： H01L41/047
CPC分类号： H03H9/1021 , H03H9/0519
摘要： A crystal device and an inspection method for inspecting the crystal device are provided. The crystal device includes: a crystal plate; excitation electrodes formed on the crystal plate; extraction electrodes extending from the excitation electrodes; electrode pads electrically connected with the extraction electrodes; a package including mounting terminals formed on a mounting surface and connection terminals formed on a bottom surface, which is on the other side of the mounting surface, and electrically connected with the mounting terminals; and an electrically-conductive adhesive agent bonding and fixing the connection terminals to the electrode pads. An bonding status inspection region, on which no metal film is formed, is formed in the crystal plate, and the bonding status inspection region is surrounded by or adjacent to the electrode pads. In addition, the bonding status inspection region occupies not more than 25% of the area of the electrode pads.
摘要翻译：提供了一种用于检查晶体装置的晶体装置和检查方法。晶体装置包括：晶体板; 形成在晶体板上的激励电极; 从激励电极延伸的提取电极; 与提取电极电连接的电极焊盘; 包括形成在安装表面上的安装端子和形成在底面的连接端子的封装，所述连接端子位于所述安装面的另一侧，并与所述安装端子电连接; 以及将连接端子接合并固定到电极焊盘的导电粘合剂。在该晶体板中形成没有形成金属膜的接合状态检查区域，并且接合状态检查区域被电极焊盘包围或邻近。此外，接合状态检查区域不超过电极焊盘面积的25％。

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