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    • 4. 发明申请
    • CROSSBAR-MEMORY SYSTEMS AND METHODS FOR WRITING TO AND READING FROM CROSSBAR MEMORY JUNCTIONS OF CROSSBAR-MEMORY SYSTEMS
    • 交叉记忆体系统和用于写入和读取跨轨存储器系统的跨轨存储器连接的方法
    • WO2008048597A2
    • 2008-04-24
    • PCT/US2007/022070
    • 2007-10-16
    • HEWLETT-PACKARD DEVELOPMENT COMPANY, L. P.ROBINETT, WarrenKUEKES, Philip, J.
    • ROBINETT, WarrenKUEKES, Philip, J.
    • G11C13/02
    • G11C13/02B82Y10/00G06F11/1008G06F11/1076G11C11/54G11C13/0023G11C13/004G11C13/0069G11C2013/0047G11C2013/0057G11C2013/009G11C2213/16G11C2213/77G11C2213/81
    • Various embodiments of the present invention are directed to crossbar-memory systems to methods for writing information to and reading information stored in such systems. In one embodiment of the present invention, a crossbar-memory system (1300) comprises a first layer of microscale signal lines (808), a second layer of microscale signal lines (810), a first layer of nanowires (804) configured so that each first layer nanowire overlaps each first layer microscale signal line (808), and a second layer of nanowires (806) configured so that each second layer nanowire overlaps each second layer microscale signal line (810) and overlaps each first layer nanowire (804). The crossbar-memory system includes nonlinear-tunneling resistors (1526,1528) configured to selectively connect first layer nanowires (804) to first layer microscale signal lines (808) and to selectively connect second layer nanowires (806) to second layer microscale signal lines (810). The crossbar-memory system (1300) also includes nonlinear tunneling-hysteretic resistors (1318) configured to connect each first layer nanowire (2008) to each second layer nanowire (2012) at each crossbar intersection.
    • 本发明的各种实施例涉及交叉存储器系统,用于将信息写入和读取存储在这样的系统中的信息的方法。 在本发明的一个实施例中,交叉开关存储器系统(1300)包括第一层微米级信号线(808),第二层微型信号线(810),第一层纳米线(804),其构造成使得 每个第一层纳米线与每个第一层微米信号线(808)重叠,并且第二纳米线层(806)被配置为使得每个第二层纳米线与每个第二层微米信号线(810)重叠并与每个第一层纳米线(804)重叠, 。 交叉开关存储器系统包括非线性隧道电阻器(1526,1528),其被配置为选择性地将第一层纳米线(804)连接到第一层微米信号线(808),并且将第二层纳米线(806)选择性地连接到第二层微米信号线 (810)。 交叉开关存储器系统(1300)还包括非线性隧道迟滞电阻器(1318),其被配置为在每个交叉点交叉处将每个第一层纳米线(2008)连接到每个第二层纳米线(2012)。
    • 6. 发明申请
    • DEFECT-AND-FAILURE-TOLERANT DEMULTIPLEXER USING SERIES REPLICATION AND ERROR-CONTROL ENCODING
    • 使用串行复制和错误控制编码的缺陷 - 容错解扩器
    • WO2008008419A2
    • 2008-01-17
    • PCT/US2007/015861
    • 2007-07-11
    • HEWLETT-PACKARD DEVELOPMENT COMPANY, L. P.ROBINETT, WarrenKUEKES, Philip, J.WILLIAMS, Stanley, R.
    • ROBINETT, WarrenKUEKES, Philip, J.WILLIAMS, Stanley, R.
    • H03K19/007G06F11/1076H03K19/00315
    • One embodiment of the present invention is a method for constructing defect-and-failure-tolerant demultiplexers (figures 14 an 16). This method is applicable to nanoscale, microscal, or larger-scale demultiplexer circuits,. Demultiplexer circuits can be viewed as a set of AND gates (figures 9A-B), each including a reversibly switchable interconnection between a number of address lines (910-912 and 920-922), or address-line-derived signal lines, and an output signal line (914 and 924). Each reversibly switchable interconnection includes one ot more reversibly switchable elements (906-908 and 916-918). In certain demultiplexer embodiments, NMOS (102) and/or PMOS transistors (206) are employed as reversibly switchable elements. In the method that representd one embodiment of the present invention, two or more serially connected transistors (410, 412, and 411, 413; 1502) are employed in each reversibly switchable interconnection, so that short defects in up to one less then the number of serially interconnected transistors does not lead to failure of the reversibly switchable interconnection. In addition, error-control-encoding techniques are used to introduce additional address-line-derived signal lines (1602, 1604) and additional switchable interconnections (1610) so that the demultiplexer may function even when a number of individual, switchable interconnections are open-defective.
    • 本发明的一个实施例是一种用于构造缺陷和容错解复用器的方法(图14和16)。 该方法适用于纳米级,微型或更大规模的解复用器电路。 解复用器电路可被视为一组与门(图9A-B),每一个都包括多个地址线(910-912和920-922)或源自地址线的信号线之间的可逆切换的互连,以及 输出信号线(914和924)。 每个可逆切换的互连包括一个更可逆的可切换元件(906-908和916-918)。 在某些解复用器实施例中,采用NMOS(102)和/或PMOS晶体管(206)作为可逆可切换元件。 在代表本发明的一个实施例的方法中,在每个可逆可切换的互连中采用两个或更多个串联连接的晶体管(410,412和411,413; 1502),使得短至多一个的缺陷 串联互连的晶体管不会导致可逆可切换互连的故障。 另外,使用错误控制编码技术来引入附加的地址线导出信号线(1602,1604)和附加可切换互连(1610),使得即使当多个单独的可切换互连打开时解复用器也可以起作用 缺陷型。
    • 7. 发明申请
    • DEFECT-TOLERANT AND FAULT-TOLERANT CIRCUIT INTERCONNECTIONS
    • 缺陷容忍和容错电路互连
    • WO2005026957A2
    • 2005-03-24
    • PCT/US2004/029333
    • 2004-09-08
    • HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.KUEKES, Philip, J.WILLIAMS, R., StanleySEROUSSI, Gadiel
    • KUEKES, Philip, J.WILLIAMS, R., StanleySEROUSSI, Gadiel
    • G06F11/00
    • G06F11/1016B82Y10/00G11C8/10G11C13/0014G11C2213/77G11C2213/81
    • Methods for increasing defect tolerance and fault tolerance in systems containing interconnected components, in which a signal level is classified as belonging to one of a plurality of different, distinguishable classes based on one or more thresholds separating the signal-level classes, and defect-and-fault tolerant systems embodying the methods. An electronic-device embodiment including an array of nanowire crossbars, the nanoscale memory elements within the nanowire crossbars addressed through conventional microelectronic address lines, and a method embodiment for providing fault-tolerant interconnection interfaces with electrically distinguishable signal levels are described. In the described embodiment, in order to interconnect microelectronic address lines with the nanowire crossbars within the electronic memory, an address encoding technique is employed to generate a number of redundant, parity-check address lines to supplement a minimally required set of address signal lines needed to access the nanoscale memory elements.
    • 用于增加包含相互连接的部件的系统中的缺陷容忍度和容错性的方法,其中根据分离信号级别类别的一个或多个阈值将信号级别分类为多个不同的可区分类别之一,以及缺陷和 体现这种方法的容错系统。 描述了一种电子器件实施例,其包括纳米线交叉杆阵列,通过常规微电子地址线寻址的纳米线交叉管内的纳米级存储元件,以及用于提供具有电可区分信号电平的容错互连接口的方法实施例。 在所描述的实施例中,为了将微电子地址线与电子存储器内的纳米线交叉点互连,采用地址编码技术来生成多个冗余的奇偶校验地址线,以补充所需的最低要求的地址信号线组 以访问纳米尺度的存储元件。
    • 10. 发明申请
    • CONFIGURABLE MOLECULAR SWITCH ARRAY
    • 可配置分子开关阵列
    • WO2004021443A1
    • 2004-03-11
    • PCT/US2003/027280
    • 2003-08-29
    • HEWLETT-PACKARD DEVELOPMENT COMPANY, L. P.
    • SNIDER, Gregory, S.KUEKES, Philip, J.WILLIAMS, R., Stanley
    • H01L27/12
    • H01L27/285B82Y10/00G11C13/0009G11C13/0014G11C2213/14G11C2213/34G11C2213/77G11C2213/81
    • A computing system (74) for implementing at least one electronic circuit with gain comprises at least one two-dimensional molecular switch array (50, 120). The molecular switch array (50, 120) is formed by assembling two or more crossed planes of wires (10) into a configuration of devices. Each device comprises a junction (16) formed by a pair of crossed wires (20, 22) and at least one connector species (24) that connects the pair of crossed wires (20, 22) in the junction (16). The junction (16) has a functional dimension in nanometers, and includes a switching capability provided by both one or more connector species (24) and the pair of crossed wires (20, 22) and a configurable nanoscale wire transistor having a first state that functions as a transistor (38) and a second state that functions as a conducting semiconductor wire (44). Specific connections are made to interconnect the devices and connect the devices to two structures (60, 62, 130, 132) that provide high and low voltages.
    • 用于实现具有增益的至少一个电子电路的计算系统(74)包括至少一个二维分子开关阵列(50,120)。 分子开关阵列(50,120)通过将两个或更多个交叉的导线平面(10)组装成装置的构造而形成。 每个装置包括由一对交叉线(20,22)形成的接点(16)和连接该接合部(16)中的该对交叉线(20,22)的至少一个连接器种类(24)。 结(16)具有纳米的功能尺寸,并且包括由一个或多个连接器种类(24)和一对交叉导线(20,22)提供的切换能力以及具有第一状态的可配置纳米级线晶体管, 用作晶体管(38)和用作导电半导体线(44)的第二状态。 进行具体的连接以将设备互连并将设备连接到提供高和低电压的两个结构(60,62,130,132)。