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1. 发明专利

JP2007165911A X-ray detector with radiation hard photodiode design 有权
标题翻译：具有辐射硬光电设计的X射线探测器
公开(公告)号：JP2007165911A
公开(公告)日：2007-06-28
申请号：JP2006337979
申请日：2006-12-15
申请人： Ge Inspection Technologies Lp , ジーイー・インスペクション・テクノロジーズ,エルピー
发明人： ZELAKIEWICZ SCOTT STEPHEN , ALBAGLI DOUGLAS , HENNESSY WILLIAM ANDREW , COUTURE AARON JUDY
IPC分类号： H01L31/09 , H01L27/14 , H01L27/146
CPC分类号： G01T1/2018
摘要： PROBLEM TO BE SOLVED: To provide a photodetector for X-ray applications with a photodiode design enabling operation in conventional X-ray setting, while reducing or restricting leakage and deterioration of detector pixels and those performances caused as a result of such leakage. SOLUTION: A photodetector (16) incorporates a photodiode design (34, 64) with reduced leakage at each pixel location. The photodiode has a reduced surface area and a peripheral edge of reduced length. The length may be minimized by making the photodiode round. The diode is surrounded by a reflective layer (66) that may act as a contact for the diode. The reflective layer reflects photons back towards the reduced area diode to maintain good sensitivity. The reflective/contact layer may form a capacitor with another contact layer (54) by disposing a dielectric layer (56) therebetween, thereby increasing the effective capacitance of the photodiode. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：为了提供具有能够在常规X射线设置中操作的光电二极管设计的X射线应用的光电检测器，同时减少或限制检测器像素的泄漏和劣化以及由于这种泄漏而引起的那些性能。解决方案：光电检测器（16）结合光电二极管设计（34,64），每个像素位置具有减少的泄漏。光电二极管具有减小的表面积和减小长度的周边边缘。可以通过使光电二极管圆形化来减小长度。二极管被可用作二极管的触点的反射层（66）包围。反射层将光子反射回减小区域二极管以保持良好的灵敏度。反射/接触层可以通过在其间布置介电层（56）而与另一接触层（54）形成电容器，从而增加光电二极管的有效电容。版权所有（C）2007，JPO＆INPIT

2. 发明专利

JP2007235098A Diode design for reducing influence by radiation damage 有权
标题翻译：用于减少辐射损伤影响的二极管设计
公开(公告)号：JP2007235098A
公开(公告)日：2007-09-13
申请号：JP2006338007
申请日：2006-12-15
申请人： Ge Inspection Technologies Lp , ジーイー・インスペクション・テクノロジーズ,エルピー
发明人： ZELAKIEWICZ SCOTT STEPHEN , BOGDANOVICH SNEZANA , COUTURE AARON JUDY , ALBAGLI DOUGLAS , HENNESSY WILLIAM ANDREW
IPC分类号： H01L27/14 , A61B6/00 , G01T1/20 , H01L31/10 , H04N5/32
CPC分类号： G01T1/2928 , G01T1/2018
摘要： PROBLEM TO BE SOLVED: To provide a photodiode having a design capable of operating in the conventional X-ray environment while suppressing deterioration of photodiodes by exposure, especially leakage and deterioration of detector pixels and pixel performance, which are caused from leakage thereof, in a digital X-ray detector. SOLUTION: The photodetector 16 for X-ray applications contains photodiodes 34, 64 gated so as to reduce the leakage of electric charges from photodiodes at each pixel position. A gate layer 36 can be arranged along all periphery of the detector and may be maintained at a common potential with a contact layer 38 or at a differential potential. A passivation layer or a dielectric layer 56 separates a gate layer from the photdiodes. Leakage around the edge of the diode which may be caused by radiation exposure for a long time is reduced by the gate layer. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：为了提供具有能够在常规X射线环境中操作的设计的光电二极管，同时通过曝光来抑制光电二极管的劣化，特别是由于泄漏而引起的检测器像素的泄漏和劣化以及像素性能的劣化，在数字X射线检测器中。解决方案：用于X射线应用的光电检测器16包含门控的光电二极管34,64，以便减少每个像素位置处的光电二极管的电荷泄漏。栅极层36可以沿着检测器的所有周边布置，并且可以通过接触层38保持在共同的电位或者在差分电势处。钝化层或介电层56将栅极层与光电二极管分开。通过栅极层可以减少可能由长时间的辐射暴露引起的二极管边缘周围的泄漏。版权所有（C）2007，JPO＆INPIT

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