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1. 发明授权

US07948252B2 Multilayered probe card 有权
标题翻译：多层探针卡
公开(公告)号：US07948252B2
公开(公告)日：2011-05-24
申请号：US12173695
申请日：2008-07-15
申请人： Gary W. Grube , Igor Y. Khandros , Benjamin N. Eldridge , Gaetan L. Mathieu , Poya Lotfizadeh , Chih-Chiang Tseng
发明人： Gary W. Grube , Igor Y. Khandros , Benjamin N. Eldridge , Gaetan L. Mathieu , Poya Lotfizadeh , Chih-Chiang Tseng
IPC分类号： G01R31/02
CPC分类号： G01R1/07314 , G01R1/07342 , G01R1/07378 , G01R3/00 , G01R31/2886 , G01R31/2889 , Y10T29/49002 , Y10T29/49004 , Y10T29/49117 , Y10T29/49124 , Y10T29/49126 , Y10T29/4913 , Y10T29/49147 , Y10T29/49149 , Y10T29/49453
摘要： A method of designing and manufacturing a probe card assembly includes prefabricating one or more elements of the probe card assembly to one or more predefined designs. Thereafter, design data regarding a newly designed semiconductor device is received along with data describing the tester and testing algorithms to be used to test the semiconductor device. Using the received data, one or more of the prefabricated elements is selected. Again using the received data, one or more of the selected prefabricated elements is customized. The probe card assembly is then built using the selected and customized elements.
摘要翻译：一种设计和制造探针卡组件的方法包括将探针卡组件的一个或多个元件预制成一个或多个预定的设计。此后，接收关于新设计的半导体器件的设计数据以及描述用于测试半导体器件的测试器和测试算法的数据。使用接收到的数据，选择一个或多个预制元素。再次使用接收的数据，定制一个或多个所选择的预制元素。然后使用选定和定制的元件构建探针卡组件。

2. 发明申请

US20080272794A1 METHOD OF MANUFACTURING A PROBE CARD 有权
标题翻译：制作探针卡的方法
公开(公告)号：US20080272794A1
公开(公告)日：2008-11-06
申请号：US12173695
申请日：2008-07-15
申请人： Gary W. Grube , Igor Y. Khandros , Benjamin N. Eldridge , Gaetan L. Mathieu , Poya Lotfizadeh , Chih-Chiang Tseng
发明人： Gary W. Grube , Igor Y. Khandros , Benjamin N. Eldridge , Gaetan L. Mathieu , Poya Lotfizadeh , Chih-Chiang Tseng
IPC分类号： G01R1/073
CPC分类号： G01R1/07314 , G01R1/07342 , G01R1/07378 , G01R3/00 , G01R31/2886 , G01R31/2889 , Y10T29/49002 , Y10T29/49004 , Y10T29/49117 , Y10T29/49124 , Y10T29/49126 , Y10T29/4913 , Y10T29/49147 , Y10T29/49149 , Y10T29/49453
摘要： A method of designing and manufacturing a probe card assembly includes prefabricating one or more elements of the probe card assembly to one or more predefined designs. Thereafter, design data regarding a newly designed semiconductor device is received along with data describing the tester and testing algorithms to be used to test the semiconductor device. Using the received data, one or more of the prefabricated elements is selected. Again using the received data, one or more of the selected prefabricated elements is customized. The probe card assembly is then built using the selected and customized elements.
摘要翻译：一种设计和制造探针卡组件的方法包括将探针卡组件的一个或多个元件预制成一个或多个预定的设计。此后，接收关于新设计的半导体器件的设计数据以及描述用于测试半导体器件的测试器和测试算法的数据。使用接收到的数据，选择一个或多个预制元素。再次使用接收的数据，定制一个或多个所选择的预制元素。然后使用选定和定制的元件构建探针卡组件。

3. 发明授权

US07400157B2 Composite wiring structure having a wiring block and an insulating layer with electrical connections to probes 失效
标题翻译：复合布线结构具有布线块和与探针电连接的绝缘层
公开(公告)号：US07400157B2
公开(公告)日：2008-07-15
申请号：US11692035
申请日：2007-03-27
申请人： Gary W. Grube , Igor Y. Khandros , Benjamin N. Eldridge , Gaetan L. Mathieu , Poya Lotfizadeh , Chih-Chiang Tseng
发明人： Gary W. Grube , Igor Y. Khandros , Benjamin N. Eldridge , Gaetan L. Mathieu , Poya Lotfizadeh , Chih-Chiang Tseng
IPC分类号： G01R31/02 , G06F17/50 , H01L29/10 , H05K3/36
CPC分类号： G01R31/2886 , G01R1/07314 , G01R1/07342 , G01R1/07357 , G01R1/07378 , G01R3/00 , Y10T29/49126
摘要： A method of designing and manufacturing a probe card assembly includes prefabricating one or more elements of the probe card assembly to one or more predefined designs. Thereafter, design data regarding a newly designed semiconductor device is received along with data describing the tester and testing algorithms to be used to test the semiconductor device. Using the received data, one or more of the prefabricated elements is selected. Again using the received data, one or more of the selected prefabricated elements is customized. The probe card assembly is then built using the selected and customized elements.
摘要翻译：一种设计和制造探针卡组件的方法包括将探针卡组件的一个或多个元件预制成一个或多个预定的设计。此后，接收关于新设计的半导体器件的设计数据以及描述用于测试半导体器件的测试器和测试算法的数据。使用接收到的数据，选择一个或多个预制元素。再次使用接收的数据，定制一个或多个所选择的预制元素。然后使用选定和定制的元件构建探针卡组件。

4. 发明授权

US06864105B2 Method of manufacturing a probe card 失效
标题翻译：探针卡的制造方法
公开(公告)号：US06864105B2
公开(公告)日：2005-03-08
申请号：US10087081
申请日：2002-03-01
申请人： Gary W. Grube , Igor Y. Khandros , Benjamin N. Eldridge , Gaetan L. Mathieu , Poya Lotfizadeh , Chih-Chiang Tseng
发明人： Gary W. Grube , Igor Y. Khandros , Benjamin N. Eldridge , Gaetan L. Mathieu , Poya Lotfizadeh , Chih-Chiang Tseng
IPC分类号： G01R31/26 , G01R1/073 , G01R31/28 , H01L21/66
CPC分类号： G01R1/07314 , G01R1/07342 , G01R1/07378 , G01R3/00 , G01R31/2886 , G01R31/2889 , Y10T29/49002 , Y10T29/49004 , Y10T29/49117 , Y10T29/49124 , Y10T29/49126 , Y10T29/4913 , Y10T29/49147 , Y10T29/49149 , Y10T29/49453
摘要： A method of designing and manufacturing a probe card assembly includes prefabricating one or more elements of the probe card assembly to one or more predefined designs. Thereafter, design data regarding a newly designed semiconductor device is received along with data describing the tester and testing algorithms to be used to test the semiconductor device. Using the received data, one or more of the prefabricated elements is selected. Again using the received data, one or more of the selected prefabricated elements is customized. The probe card assembly is then built using the selected and customized elements.
摘要翻译：一种设计和制造探针卡组件的方法包括将探针卡组件的一个或多个元件预制成一个或多个预定的设计。此后，接收关于新设计的半导体器件的设计数据以及描述用于测试半导体器件的测试器和测试算法的数据。使用接收到的数据，选择一个或多个预制元素。再次使用接收的数据，定制一个或多个所选择的预制元素。然后使用选定和定制的元件构建探针卡组件。

5. 发明申请

US20050146339A1 Method of manufacturing a probe card 有权
公开(公告)号：US20050146339A1
公开(公告)日：2005-07-07
申请号：US11073187
申请日：2005-03-04
申请人： Gary Grube , Igor Khandros , Benjamin Eldridge , Gaetan Mathieu , Poya Lotfizadeh , Chih-Chiang Tseng
发明人： Gary Grube , Igor Khandros , Benjamin Eldridge , Gaetan Mathieu , Poya Lotfizadeh , Chih-Chiang Tseng
IPC分类号： G01R31/26 , G01R1/073 , G01R31/28 , H01L21/66 , G01R31/02
CPC分类号： G01R31/2886 , G01R1/07314 , G01R1/07342 , G01R1/07357 , G01R1/07378 , G01R3/00 , Y10T29/49126
摘要： A method of designing and manufacturing a probe card assembly includes prefabricating one or more elements of the probe card assembly to one or more predefined designs. Thereafter, design data regarding a newly designed semiconductor device is received along with data describing the tester and testing algorithms to be used to test the semiconductor device. Using the received data, one or more of the prefabricated elements is selected. Again using the received data, one or more of the selected prefabricated elements is customized. The probe card assembly is then built using the selected and customized elements.

6. 发明申请

US20070247176A1 Method of Manufacturing a Probe Card 失效
标题翻译：制造探针卡的方法
公开(公告)号：US20070247176A1
公开(公告)日：2007-10-25
申请号：US11692035
申请日：2007-03-27
申请人： Gary Grube , Igor Khandros , Benjamin Eldridge , Gaetan Mathieu , Poya Lotfizadeh , Chih-Chiang Tseng
发明人： Gary Grube , Igor Khandros , Benjamin Eldridge , Gaetan Mathieu , Poya Lotfizadeh , Chih-Chiang Tseng
IPC分类号： G01R31/26 , G01R31/04
CPC分类号： G01R31/2886 , G01R1/07314 , G01R1/07342 , G01R1/07357 , G01R1/07378 , G01R3/00 , Y10T29/49126
摘要： A method of designing and manufacturing a probe card assembly includes prefabricating one or more elements of the probe card assembly to one or more predefined designs. Thereafter, design data regarding a newly designed semiconductor device is received along with data describing the tester and testing algorithms to be used to test the semiconductor device. Using the received data, one or more of the prefabricated elements is selected. Again using the received data, one or more of the selected prefabricated elements is customized. The probe card assembly is then built using the selected and customized elements.
摘要翻译：一种设计和制造探针卡组件的方法包括将探针卡组件的一个或多个元件预制成一个或多个预定的设计。此后，接收关于新设计的半导体器件的设计数据以及描述用于测试半导体器件的测试器和测试算法的数据。使用接收到的数据，选择一个或多个预制元素。再次使用接收的数据，定制一个或多个所选择的预制元素。然后使用选定和定制的元件构建探针卡组件。

7. 发明授权

US08810559B2 Pixel structure and display system utilizing the same 有权
标题翻译：像素结构和显示系统利用它
公开(公告)号：US08810559B2
公开(公告)日：2014-08-19
申请号：US13477674
申请日：2012-05-22
申请人： Du-Zen Peng , Tse-Yuan Chen , Chih-Chiang Tseng , Shou-Cheng Wang , Tsung-Yi Su
发明人： Du-Zen Peng , Tse-Yuan Chen , Chih-Chiang Tseng , Shou-Cheng Wang , Tsung-Yi Su
IPC分类号： G09G3/32
CPC分类号： G09G3/325 , G09G2300/0819
摘要： A pixel structure including a first switching transistor, a setting unit, a capacitor, a driving transistor, a second switching transistor and a luminous element is disclosed. The capacitor is coupled between a first and a second node. The first switching transistor transmits a data signal to the first node according to a scan signal. The driving transistor includes a threshold voltage and a gate coupled to the second node. The second switching transistor includes a gate receiving an emitting signal. The luminous element is coupled to the driving transistor and the second switching transistor in series between a first operation voltage and a second operation voltage. The setting unit controls the voltage levels of the first and the second nodes to compensate the threshold voltage of the driving transistor.
摘要翻译：公开了包括第一开关晶体管，设定单元，电容器，驱动晶体管，第二开关晶体管和发光元件的像素结构。电容器耦合在第一和第二节点之间。第一开关晶体管根据扫描信号将数据信号发送到第一节点。驱动晶体管包括阈值电压和耦合到第二节点的栅极。第二开关晶体管包括接收发射信号的栅极。发光元件在第一操作电压和第二操作电压之间串联连接到驱动晶体管和第二开关晶体管。设置单元控制第一和第二节点的电压电平以补偿驱动晶体管的阈值电压。

8. 发明申请

US20090237109A1 Efficient method for implementing programmable impedance output drivers and programmable input on die termination on a bi-directional data bus 有权
标题翻译：在双向数据总线上实现可编程阻抗输出驱动器和芯片端接上的可编程输入的高效方法
公开(公告)号：US20090237109A1
公开(公告)日：2009-09-24
申请号：US12079100
申请日：2008-03-24
申请人： Robert B. Haig , Patrick T. Chuang , Chih-Chiang Tseng , Kookhwan Kwon
发明人： Robert B. Haig , Patrick T. Chuang , Chih-Chiang Tseng , Kookhwan Kwon
IPC分类号： H03K19/003
CPC分类号： H03K19/0005 , H04L25/0278
摘要： A combined input and termination circuit comprises a fixed portion of impedance and a programmable portion of impedance. The fixed portion is able to be fixed in a driver mode and a termination mode. The programmable portion is able to be configured to have a desired impedance in a driver mode or a termination mode while maintaining minimum associated capacitance.
摘要翻译：组合的输入和终端电路包括阻抗的固定部分和阻抗的可编程部分。固定部分能够以驾驶员模式和终止模式被固定。可编程部分能够被配置为具有在驱动器模式或终止模式下的期望阻抗，同时保持最小相关电容。

9. 发明授权

US07355907B2 Performing read and write operations in the same cycle for an SRAM device 有权
标题翻译：在SRAM器件的同一周期内执行读写操作
公开(公告)号：US07355907B2
公开(公告)日：2008-04-08
申请号：US11404191
申请日：2006-04-14
申请人： Hsin-Ley Suzanne Chen , Chih-Chiang Tseng , Mu-Hsiang Huang
发明人： Hsin-Ley Suzanne Chen , Chih-Chiang Tseng , Mu-Hsiang Huang
IPC分类号： G11C7/00
CPC分类号： G11C11/419
摘要： A decoding signal circuit is configured to generate a dual operation decoding signal that enables a read operation and a write operation to be performed in one clock cycle. The decoding signal circuit is configured such that a read decoding signal and a write decoding signal are generated and multiplexed together to form the dual operation decoding signal. The memory device receives a read address and a write address consecutively in one cycle to generate the dual operation decoding signal. A single operation, such as a read only operation or a write only operation, can be performed as well as the dual operation of performing the read operation and the write operation in the same cycle.
摘要翻译：解码信号电路被配置为生成能够在一个时钟周期中执行读取操作和写入操作的双重操作解码信号。解码信号电路被配置为使得读取解码信号和写入解码信号一起生成并多路复用以形成双重操作解码信号。存储器件在一个周期中连续地接收读取地址和写入地址，以产生双重操作解码信号。可以执行单次操作，例如只读操作或只写操作，以及在相同周期中执行读取操作和写入操作的双重操作。

10. 发明授权

US07646215B2 Efficient method for implementing programmable impedance output drivers and programmable input on die termination on a bi-directional data bus 有权
标题翻译：在双向数据总线上实现可编程阻抗输出驱动器和芯片端接上的可编程输入的高效方法
公开(公告)号：US07646215B2
公开(公告)日：2010-01-12
申请号：US12079100
申请日：2008-03-24
申请人： Robert B. Haig , Patrick T. Chuang , Chih-Chiang Tseng , Kookhwan Kwon
发明人： Robert B. Haig , Patrick T. Chuang , Chih-Chiang Tseng , Kookhwan Kwon
IPC分类号： H03K17/16 , H03K19/003
CPC分类号： H03K19/0005 , H04L25/0278
摘要： A combined input and termination circuit comprises a fixed portion of impedance and a programmable portion of impedance. The fixed portion is able to be fixed in a driver mode and a termination mode. The programmable portion is able to be configured to have a desired impedance in a driver mode or a termination mode while maintaining minimum associated capacitance.
摘要翻译：组合的输入和终端电路包括阻抗的固定部分和阻抗的可编程部分。固定部分能够以驾驶员模式和终止模式被固定。可编程部分能够被配置为具有在驱动器模式或终止模式下的期望阻抗，同时保持最小相关电容。

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