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1. 发明授权

US07995216B2 Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure with image analysis 有权
标题翻译：通过图像分析控制采样过程中样品采集仪与待分析表面之间的位置关系
公开(公告)号：US07995216B2
公开(公告)日：2011-08-09
申请号：US12217224
申请日：2008-07-02
申请人： Gary J. Van Berkel , Vilmos Kertesz
发明人： Gary J. Van Berkel , Vilmos Kertesz
IPC分类号： G01B11/14 , G01N1/02 , H01J37/26
CPC分类号： H01J49/0459
摘要： A system and method utilizes an image analysis approach for controlling the collection instrument-to-surface distance in a sampling system for use, for example, with mass spectrometric detection. Such an approach involves the capturing of an image of the collection instrument or the shadow thereof cast across the surface and the utilization of line average brightness (LAB) techniques to determine the actual distance between the collection instrument and the surface. The actual distance is subsequently compared to a target distance for re-optimization, as necessary, of the collection instrument-to-surface during an automated surface sampling operation.
摘要翻译：系统和方法利用图像分析方法来控制采样系统中的采集仪表到距离，例如用质谱检测。这种方法涉及捕获收集仪器的图像或其横过表面投射的阴影以及利用线平均亮度（LAB）技术来确定收集仪器和表面之间的实际距离。随后将实际距离与目标距离进行比较，以便在自动化表面采样操作期间根据需要重新优化收集仪器到地面。

2. 发明申请

US20100072394A1 PULSED VOLTAGE ELECTROSPRAY ION SOURCE AND METHOD FOR PREVENTING ANALYTE ELECTROLYSIS 有权
标题翻译：脉冲电压离子源和预防分析电解方法
公开(公告)号：US20100072394A1
公开(公告)日：2010-03-25
申请号：US12431461
申请日：2009-04-28
申请人： Vilmos Kertesz , Gary J. Van Berkel
发明人： Vilmos Kertesz , Gary J. Van Berkel
IPC分类号： H01J27/00
CPC分类号： H01J49/165 , H01J49/022
摘要： An electrospray ion source and method of operation includes the application of pulsed voltage to prevent electrolysis of analytes with a low electrochemical potential. The electrospray ion source can include an emitter, a counter electrode, and a power supply. The emitter can include a liquid conduit, a primary working electrode having a liquid contacting surface, and a spray tip, where the liquid conduit and the working electrode are in liquid communication. The counter electrode can be proximate to, but separated from, the spray tip. The power system can supply voltage to the working electrode in the form of a pulse wave, where the pulse wave oscillates between at least an energized voltage and a relaxation voltage. The relaxation duration of the relaxation voltage can range from 1 millisecond to 35 milliseconds. The pulse duration of the energized voltage can be less than 1 millisecond and the frequency of the pulse wave can range from 30 to 800 Hz.
摘要翻译：电喷雾离子源和操作方法包括施加脉冲电压以防止电解电位低的分析物。电喷雾离子源可以包括发射体，对电极和电源。发射器可以包括液体导管，具有液体接触表面的初级工作电极和液体导管和工作电极液体连通的喷射尖端。反电极可以接近喷射尖端但与喷嘴分开。电力系统可以脉冲波的形式向工作电极供电，其中脉冲波至少在通电电压和松弛电压之间振荡。松弛电压的弛豫持续时间可以在1毫秒到35毫秒之间。通电电压的脉冲持续时间可以小于1毫秒，脉冲波的频率可以在30到800赫兹之间。

3. 发明授权

US07295026B2 Automated position control of a surface array relative to a liquid microjunction surface sampler 有权
标题翻译：表面阵列相对于液体微结构表面采样器的自动位置控制
公开(公告)号：US07295026B2
公开(公告)日：2007-11-13
申请号：US11144882
申请日：2005-06-03
申请人： Gary J. Van Berkel , Vilmos Kertesz , Michael James Ford
发明人： Gary J. Van Berkel , Vilmos Kertesz , Michael James Ford
IPC分类号： G01R31/02
CPC分类号： H01J49/0413 , H01J49/0004
摘要： A system and method utilizes an image analysis approach for controlling the probe-to-surface distance of a liquid junction-based surface sampling system for use with mass spectrometric detection. Such an approach enables a hands-free formation of the liquid microjunction used to sample solution composition from the surface and for re-optimization, as necessary, of the microjunction thickness during a surface scan to achieve a fully automated surface sampling system.
摘要翻译：一种系统和方法利用图像分析方法来控制用于质谱检测的基于液体接头的表面采样系统的探针到表面距离。这样一种方法可以实现用于从表面样品溶液组合物的液体微结构的免提形成，并且根据需要在表面扫描期间重新优化微结构厚度以实现全自动表面采样系统。

4. 发明申请

US20120080589A1 SYSTEM AND METHOD FOR LASER ASSISTED SAMPLE TRANSFER TO SOLUTION FOR CHEMICAL ANALYSIS 有权
标题翻译：用于激光辅助样品转移到化学分析解决方案的系统和方法
公开(公告)号：US20120080589A1
公开(公告)日：2012-04-05
申请号：US12896018
申请日：2010-10-01
申请人： Gary J. Van Berkel , Vilmos Kertesz
发明人： Gary J. Van Berkel , Vilmos Kertesz
IPC分类号： H01J49/26 , H01J49/00
CPC分类号： H01J49/0463
摘要： A system and method for laser desorption of an analyte from a specimen and capturing of the analyte in a suspended solvent to form a testing solution are described. The method can include providing a specimen supported by a desorption region of a specimen stage and desorbing an analyte from a target site of the specimen with a laser beam centered at a radiation wavelength (λ). The desorption region is transparent to the radiation wavelength (λ) and the sampling probe and a laser source emitting the laser beam are on opposite sides of a primary surface of the specimen stage. The system can also be arranged where the laser source and the sampling probe are on the same side of a primary surface of the specimen stage. The testing solution can then be analyzed using an analytical instrument or undergo further processing.
摘要翻译：描述了用于从样品中分析物的激光解吸和在悬浮溶剂中捕获分析物以形成测试溶液的系统和方法。该方法可以包括提供由样品台的解吸区域支撑的样品并用以辐射波长（λ）为中心的激光束从样品的靶位点解吸分析物。解吸区域对于辐射波长（λ）是透明的，并且采样探针和发射激光束的激光源位于样品台的主表面的相对侧上。该系统还可以布置在激光源和采样探针位于样品台的主表面的同一侧上。然后可以使用分析仪器分析测试溶液或进行进一步处理。

5. 发明授权

US08117929B2 Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure using a laser sensor 有权
标题翻译：在使用激光传感器的采样过程中控制样品收集器与待分析表面之间的位置关系
公开(公告)号：US08117929B2
公开(公告)日：2012-02-21
申请号：US12217225
申请日：2008-07-02
申请人： Gary J. Van Berkel , Vilmos Kertesz
发明人： Gary J. Van Berkel , Vilmos Kertesz
IPC分类号： G01N35/10
CPC分类号： H01J49/0459
摘要： A system and method utilizes distance-measuring equipment including a laser sensor for controlling the collection instrument-to-surface distance during a sample collection process for use, for example, with mass spectrometric detection. The laser sensor is arranged in a fixed positional relationship with the collection instrument, and a signal is generated by way of the laser sensor which corresponds to the actual distance between the laser sensor and the surface. The actual distance between the laser sensor and the surface is compared to a target distance between the laser sensor and the surface when the collection instrument is arranged at a desired distance from the surface for sample collecting purposes, and adjustments are made, if necessary, so that the actual distance approaches the target distance.
摘要翻译：一种系统和方法利用距离测量设备，包括激光传感器，用于在样品采集过程中控制收集仪器到表面的距离，例如使用质谱检测。激光传感器与收集仪器以固定的位置关系布置，并且通过与激光传感器和表面之间的实际距离对应的激光传感器产生信号。将激光传感器和表面之间的实际距离与激光传感器和表面之间的目标距离进行比较，当采集仪器布置在离表面所需的距离处以进行样品收集时，如果需要，进行调整实际距离接近目标距离。

6. 发明申请

US20100224013A1 Method and system for formation and withdrawal of a sample from a surface to be analyzed 审中-公开
标题翻译：从待分析的表面形成和取出样品的方法和系统
公开(公告)号：US20100224013A1
公开(公告)日：2010-09-09
申请号：US12380980
申请日：2009-03-05
申请人： Gary J. Van Berkel , Vilmos Kertesz
发明人： Gary J. Van Berkel , Vilmos Kertesz
IPC分类号： G01N1/20
CPC分类号： H01J49/0431 , G01N35/1095 , G01N2001/1031 , H01J49/045 , H01J49/0463 , H01J49/167
摘要： A method and system for formation and withdrawal of a sample from a surface to be analyzed utilizes a collection instrument having a port through which a liquid solution is conducted onto the surface to be analyzed. The port is positioned adjacent the surface to be analyzed, and the liquid solution is conducted onto the surface through the port so that the liquid solution conducted onto the surface interacts with material comprising the surface. An amount of material is thereafter withdrawn from the surface. Pressure control can be utilized to manipulate the solution balance at the surface to thereby control the withdrawal of the amount of material from the surface. Furthermore, such pressure control can be coordinated with the movement of the surface relative to the port of the collection instrument within the X-Y plane.
摘要翻译：用于从待分析的表面形成和取出样品的方法和系统利用采集仪器，其具有将液体溶液通过该端口传导到要分析的表面上。端口定位在待分析表面附近，并且液体溶液通过端口传导到表面上，使得被引导到表面上的液体溶液与包含表面的材料相互作用。此后从表面取出一定量的材料。可以使用压力控制来操纵表面处的溶液平衡，从而控制从表面撤出的材料量。此外，这种压力控制可以与表面相对于收集仪器在X-Y平面内的端口的运动相配合。

7. 发明申请

US20100000338A1 Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure using a laser sensor 有权
标题翻译：在使用激光传感器的采样过程中控制样品收集器与待分析表面之间的位置关系
公开(公告)号：US20100000338A1
公开(公告)日：2010-01-07
申请号：US12217225
申请日：2008-07-02
申请人： Gary J. Van Berkel , Vilmos Kertesz
发明人： Gary J. Van Berkel , Vilmos Kertesz
IPC分类号： G01N1/02
CPC分类号： H01J49/0459
摘要： A system and method utilizes distance-measuring equipment including a laser sensor for controlling the collection instrument-to-surface distance during a sample collection process for use, for example, with mass spectrometric detection. The laser sensor is arranged in a fixed positional relationship with the collection instrument, and a signal is generated by way of the laser sensor which corresponds to the actual distance between the laser sensor and the surface. The actual distance between the laser sensor and the surface is compared to a target distance between the laser sensor and the surface when the collection instrument is arranged at a desired distance from the surface for sample collecting purposes, and adjustments are made, if necessary, so that the actual distance approaches the target distance.
摘要翻译：一种系统和方法利用距离测量设备，包括激光传感器，用于在样品采集过程中控制收集仪器到表面的距离，例如使用质谱检测。激光传感器与收集仪器以固定的位置关系布置，并且通过与激光传感器和表面之间的实际距离对应的激光传感器产生信号。将激光传感器和表面之间的实际距离与激光传感器和表面之间的目标距离进行比较，当采集仪器布置在离表面所需的距离处以进行样品收集时，如果需要，进行调整实际距离接近目标距离。

8. 发明申请

US20120079894A1 SYSTEMS AND METHODS FOR LASER ASSISTED SAMPLE TRANSFER TO SOLUTION FOR CHEMICAL ANALYSIS 有权
标题翻译：用于激光辅助样品转移到化学分析方法的系统和方法
公开(公告)号：US20120079894A1
公开(公告)日：2012-04-05
申请号：US13152836
申请日：2011-06-03
申请人： Gary J. Van Berkel , Vilmos Kertesz , Olga S. Ovchinnikova
发明人： Gary J. Van Berkel , Vilmos Kertesz , Olga S. Ovchinnikova
IPC分类号： G01N1/22
CPC分类号： G01N1/04 , G01N1/22 , G01N1/38 , G01N2001/045 , G01N2001/383 , G01Q30/02 , H01J49/0463 , H01J49/165
摘要： Systems and methods are described for laser ablation of an analyte from a specimen and capturing of the analyte in a dispensed solvent to form a testing solution. A solvent dispensing and extraction system can form a liquid microjunction with the specimen. The solvent dispensing and extraction system can include a surface sampling probe. The laser beam can be directed through the surface sampling probe. The surface sampling probe can also serve as an atomic force microscopy probe. The surface sampling probe can form a seal with the specimen. The testing solution including the analyte can then be analyzed using an analytical instrument or undergo further processing.
摘要翻译：描述了用于从样品激光烧蚀分析物并在分配的溶剂中捕获分析物以形成测试溶液的系统和方法。溶剂分配和萃取系统可以与样品形成液体微结构。溶剂分配和提取系统可以包括表面取样探针。激光束可以通过表面取样探针引导。表面采样探头也可以用作原子力显微镜探针。表面采样探头可以与样品形成密封。然后可以使用分析仪器分析包括分析物的测试溶液或进行进一步处理。

9. 发明申请

US20100002905A1 Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure with image analysis 有权
标题翻译：通过图像分析控制采样过程中样品采集仪与待分析表面之间的位置关系
公开(公告)号：US20100002905A1
公开(公告)日：2010-01-07
申请号：US12217224
申请日：2008-07-02
申请人： Gary J. Van Berkel , Vilmos Kertesz
发明人： Gary J. Van Berkel , Vilmos Kertesz
IPC分类号： G06K9/00
CPC分类号： H01J49/0459
摘要： A system and method utilizes an image analysis approach for controlling the collection instrument-to-surface distance in a sampling system for use, for example, with mass spectrometric detection. Such an approach involves the capturing of an image of the collection instrument or the shadow thereof cast across the surface and the utilization of line average brightness (LAB) techniques to determine the actual distance between the collection instrument and the surface. The actual distance is subsequently compared to a target distance for re-optimization, as necessary, of the collection instrument-to-surface during an automated surface sampling operation.
摘要翻译：系统和方法利用图像分析方法来控制采样系统中的采集仪表到距离，例如用质谱检测。这种方法涉及捕获收集仪器的图像或其横过表面投射的阴影以及利用线平均亮度（LAB）技术来确定收集仪器和表面之间的实际距离。随后将实际距离与目标距离进行比较，以便在自动化表面采样操作期间根据需要重新优化收集仪器到地面。

10. 发明授权

US08637813B2 System and method for laser assisted sample transfer to solution for chemical analysis 有权
标题翻译：用于激光辅助样品转移到化学分析溶液的系统和方法
公开(公告)号：US08637813B2
公开(公告)日：2014-01-28
申请号：US12896018
申请日：2010-10-01
申请人： Gary J. Van Berkel , Vilmos Kertesz
发明人： Gary J. Van Berkel , Vilmos Kertesz
IPC分类号： H01J49/26 , H01J49/00
CPC分类号： H01J49/0463
摘要： A system and method for laser desorption of an analyte from a specimen and capturing of the analyte in a suspended solvent to form a testing solution are described. The method can include providing a specimen supported by a desorption region of a specimen stage and desorbing an analyte from a target site of the specimen with a laser beam centered at a radiation wavelength (λ). The desorption region is transparent to the radiation wavelength (λ) and the sampling probe and a laser source emitting the laser beam are on opposite sides of a primary surface of the specimen stage. The system can also be arranged where the laser source and the sampling probe are on the same side of a primary surface of the specimen stage. The testing solution can then be analyzed using an analytical instrument or undergo further processing.
摘要翻译：描述了用于从样品中分析物的激光解吸和在悬浮溶剂中捕获分析物以形成测试溶液的系统和方法。该方法可以包括提供由样品台的解吸区域支撑的样品，并用以辐射波长（λ）为中心的激光束从样品的靶位点解吸分析物。解吸区对于辐射波长（λ）是透明的，并且采样探针和发射激光束的激光源位于样品台的主表面的相对侧上。该系统还可以布置在激光源和采样探针位于样品台的主表面的同一侧上。然后可以使用分析仪器分析测试溶液或进行进一步处理。

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