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1. 发明申请

WO2008085156A1 INTEGRATED INSPECTION SYSTEM AND DEFECT CORRECTION METHOD 审中-公开
标题翻译：综合检测系统和缺陷校正方法
公开(公告)号：WO2008085156A1
公开(公告)日：2008-07-17
申请号：PCT/US2007/000181
申请日：2007-01-08
申请人： GENERAL ELECTRIC COMPANY , CAPALDO, Kevin, Patrick , CHEVERTON, Mark, Allen , COYLE, Dennis, Joseph , DAVIS, Michael, John , TALSANIA, Sameer, Kirti , YAMADA, Masako , YEUNG, Chung-hei
发明人： CAPALDO, Kevin, Patrick , CHEVERTON, Mark, Allen , COYLE, Dennis, Joseph , DAVIS, Michael, John , TALSANIA, Sameer, Kirti , YAMADA, Masako , YEUNG, Chung-hei
IPC分类号： G01N21/95 , H01L21/66
CPC分类号： G01N21/8851 , G01N21/8422 , G01N21/95
摘要： A system for the inspection of and a process for the correction of defects in a microreplicated optical display film manufacturing process. The process steps of manufacturing a master, a plurality of shims from the master, and a multiplicity of display films from each shim are integrated with a systemic defect identification and correction process. Each primary manufacturing step has its own inspection system and correction process where defect information for that step of the process is fed back and analyzed; and from that analysis the subprocess is adjusted to eliminate or reduce the detected defect. The systemic defect is identified as to its source and then fed back and analyzed in the correction step of the respective subprocess in order to cure the root of the defect.
摘要翻译：用于微复制光学显示膜制造工艺中的缺陷校正的检查系统和校正处理。制造主机，来自主机的多个垫片以及来自每个垫片的多个显示胶片的工艺步骤与系统缺陷识别和校正处理相结合。每个主要制造步骤都有自己的检测系统和校正过程，其中反馈和分析该过程的缺陷信息; 并从该分析中调整子过程以消除或减少检测到的缺陷。将系统缺陷确定为其源，然后在相应子过程的校正步骤中反馈并分析，以固化缺陷的根部。

2. 发明申请

WO2012158681A3 METHOD AND SYSTEM FOR EMBEDDED TEMPERATURE AND/OR STRAIN SENSORS 审中-公开
公开(公告)号：WO2012158681A3
公开(公告)日：2012-11-22
申请号：PCT/US2012/037922
申请日：2012-05-15
申请人： GENERAL ELECTRIC COMPANY , SINGH, Prabhjot , WANG, Guanghua , CHEVERTON, Mark, Allen , POPIELARCZYK, Jeffrey, Joseph , SHIANG, Joseph, John
发明人： SINGH, Prabhjot , WANG, Guanghua , CHEVERTON, Mark, Allen , POPIELARCZYK, Jeffrey, Joseph , SHIANG, Joseph, John
IPC分类号： G01K11/20 , G01K3/02 , G01L1/24
摘要： A system and method for monitoring system including an embedded sensor coupled to an article, wherein the embedded sensor is a direct write embedded sensor using a high temperature light emitting material. A camera system detects illumination signals from the embedded sensors. A processing section processes the illumination signals and measures gas/surface temperatures and strain data for the article.

3. 发明申请

WO2015191257A1 SELECTIVE LASER MELTING ADDITIVE MANUFACTURING METHOD WITH SIMULTANEOUS MULTIPLE MELTING LASERS BEAMS AND APPARATUS THEREFOR 审中-公开
标题翻译：选择性激光熔炼添加剂与同时多次熔融激光加工制造方法及其设备
公开(公告)号：WO2015191257A1
公开(公告)日：2015-12-17
申请号：PCT/US2015/031659
申请日：2015-05-20
申请人： GENERAL ELECTRIC COMPANY
发明人： ROCKSTROH, Todd, Jay , GRAY, Daniel, Curtis , CHEVERTON, Mark, Allen , OSTROVERKHOV, Victor, Petrovich
IPC分类号： B22F3/105 , B29C67/00 , B23K26/08
CPC分类号： B23K26/342 , B22F3/1055 , B22F2003/1056 , B23K26/0648 , B23K26/0676 , B23K26/083 , B23K26/705 , B29C64/153 , B33Y10/00 , B33Y30/00 , B33Y40/00 , Y02P10/295
摘要： A method of creating an article of manufacture, the method comprising: (a) directing multiple laser beams to a single galvanometer; and, (b) dynamically repositioning the multiple laser beams in counterpart paths using the single galvanometer to shine the multiple laser beams on and melt a first powder material and, upon solidification of the melted first powder material, forming a first series of duplicate three dimensional structures, where each of the multiple laser beams is used to form at least one of the first series of duplicate three dimensional structures.
摘要翻译：一种制造制品的方法，所述方法包括：（a）将多个激光束引导到单个电流计; 并且（b）使用单个电流计动态地重新定位对应路径中的多个激光束以将多个激光束照射并熔化第一粉末材料，并且在熔化的第一粉末材料凝固时，形成第一系列的三维重复结构，其中每个多个激光束用于形成第一系列重复三维结构中的至少一个。

4. 发明申请

WO2014210408A1 SYSTEMS AND METHODS FOR CREATING COMPENSATED DIGITAL REPRESENTATIONS FOR USE IN ADDITIVE MANUFACTURING PROCESSES 审中-公开
标题翻译：用于创建用于附加制造过程的补偿数字表示的系统和方法
公开(公告)号：WO2014210408A1
公开(公告)日：2014-12-31
申请号：PCT/US2014/044484
申请日：2014-06-27
申请人： GENERAL ELECTRIC COMPANY
发明人： GRAHAM, Michael, Evans , CARTER, William, Thomas , CHEVERTON, Mark, Allen , YANG, Pinghai
IPC分类号： G06T19/00 , B22F3/10
CPC分类号： B29C64/153 , B22F3/1055 , B22F2003/1056 , B22F2003/1057 , B29C64/386 , B29C64/393 , B33Y10/00 , B33Y50/02 , G06T19/00 , Y02P10/295
摘要： A system for fabricating a component includes an additive manufacturing device and a computing device. The additive manufacturing device is configured to fabricate a first component by sequentially forming a plurality of superposed layers based upon a nominal digital representation of a second component, which includes a plurality of nominal digital two-dimensional cross-sections, each corresponding to a layer of the first component. The computing device includes a processor, wherein for an i th layer of the first component, the processor is configured to (a) generate a cumulative compensation transformation; (b) apply the cumulative compensation transformation to the nominal digital two-dimensional cross-section corresponding to the i th layer to create an intermediate digital two-dimensional cross- section corresponding to the i th layer; (c) determine a local compensation transformation; and (d) apply the local compensation transformation to the intermediate digital two-dimensional cross-section corresponding to the i th layer.
摘要翻译：一种用于制造组件的系统包括添加剂制造装置和计算装置。所述添加剂制造装置被配置为基于第二部件的标称数字表示顺序地形成多个叠加层来制造第一部件，所述第二部件包括多个标称数字二维横截面，每一个对应于第一个组件。计算设备包括处理器，其中对于第一组件的第i层，处理器被配置为（a）生成累积补偿变换; （b）将累积补偿变换应用于对应于第i层的标称数字二维横截面，以创建对应于第i层的中间数字二维横截面; （c）确定地方补偿转换; 和（d）将局部补偿变换应用于对应于第i层的中间数字二维横截面。

5. 发明申请

WO2008085160A1 SYSTEM AND METHOD FOR INSPECTION OF FILMS 审中-公开
标题翻译：用于检查薄膜的系统和方法
公开(公告)号：WO2008085160A1
公开(公告)日：2008-07-17
申请号：PCT/US2007/000478
申请日：2007-01-08
申请人： GENERAL ELECTRIC COMPANY , HARDING, Kevin, George , TAIT, Robert, William , CHEVERTON, Mark, Allen
发明人： HARDING, Kevin, George , TAIT, Robert, William , CHEVERTON, Mark, Allen
IPC分类号： G01N21/896 , G01N21/956 , G01N21/958
CPC分类号： G01N21/958 , G01N2021/8825 , G01N2021/9511
摘要： Disclosed herein is a method for inspection of light management films with a plurality of light refractive surface structures, including positioning at least one illumination source, and at least one imaging device are configured to be in a substantially bright field configuration and imaging at least portion of the light management film to provide an acquired image, wherein light from the at least one illumination source is refracted by the film to produce a dark field image at the at least one imaging device. A system for inspection of light management films is also provided. The system includes at least one illumination source to illuminate a first side of the film, at least one imaging device to receive light refracted through an opposite side of the light management film, wherein the illumination source and the imaging device are configured to be in a substantially bright field configuration to acquire a dark field image, a processor-controller, and a computer-readable medium including instructions for automated defect detection. The fixture, the illumination source, the imaging device, the processor-controller and the computer readable medium are operably coupled for automated defect detection.
摘要翻译：本文公开了一种用于检查具有多个光折射表面结构的光管理膜的方法，包括定位至少一个照明源，并且至少一个成像装置被配置为处于基本上明亮的场配置并且成像至少部分所述光管理膜提供获取的图像，其中来自所述至少一个照明源的光被所述胶片折射以在所述至少一个成像装置处产生暗视场图像。还提供了一种用于检查光管理膜的系统。所述系统包括至少一个照明源以照亮所述胶片的第一面，至少一个成像装置，用于接收通过所述光管理膜的相对侧折射的光，其中所述照明源和所述成像装置被配置为处于用于获取暗视场图像的基本上明亮的场配置，处理器控制器和包括用于自动缺陷检测的指令的计算机可读介质。固定装置，照明源，成像装置，处理器控制器和计算机可读介质可操作地耦合用于自动缺陷检测。

6. 发明申请

WO2008082411A1 METHOD FOR EXAMINING MOLDS AND APPARATUS FOR ACCOMPLISHING THE SAME 审中-公开
标题翻译：检查手段的方法和用于实现其的装置
公开(公告)号：WO2008082411A1
公开(公告)日：2008-07-10
申请号：PCT/US2007/000028
申请日：2007-01-03
申请人： GENERAL ELECTRIC COMPANY , CAPALDO, Kevin, Patrick , CHEVERTON, Mark, Allen
发明人： CAPALDO, Kevin, Patrick , CHEVERTON, Mark, Allen
IPC分类号： G01N21/95
CPC分类号： G01N21/8806 , G01N21/94 , G01N21/95684 , G01N2021/8918
摘要： Disclosed herein is a defect detection apparatus comprising a first light source that emits light in a direction parallel to an apex of prismatic structures disposed on a mold; wherein an angle between a central axis of a beam of light emitted by the first light source and a vertical taken at the first light source is about 20 to about 90 degrees; a second light source that emits light in a direction perpendicular to the apex of the prismatic structures disposed on the mold; wherein an angle between a central axis of a beam of light emitted by the second light source and a vertical taken at the second light source is less than 45 degrees; a sample holder for holding the mold; a camera placed directly above the sample holder; and translational stages for supporting the camera and the sample holder.
摘要翻译：本发明公开了一种缺陷检测装置，包括：第一光源，其在平行于设置在模具上的棱镜结构的顶点的方向上发光; 其中由所述第一光源发射的光束的中心轴线与在所述第一光源处拍摄的垂直线之间的角度为大约20度至大约90度; 第二光源，其在垂直于设置在模具上的棱镜结构的顶点的方向上发光; 其中由所述第二光源发射的光束的中心轴线与在所述第二光源处拍摄的垂直线之间的角度小于45度; 用于保持模具的样品架; 放置在样品架上方的相机; 以及用于支持相机和样品架的平移阶段。

7. 发明申请

WO2008085163A1 METHOD FOR DETECTING THE ALIGNMENT OF FILMS FOR AUTOMATED DEFECT DETECTION 审中-公开
标题翻译：用于检测自动缺陷检测的膜的对准方法
公开(公告)号：WO2008085163A1
公开(公告)日：2008-07-17
申请号：PCT/US2007/000535
申请日：2007-01-09
申请人： GENERAL ELECTRIC COMPANY , CHEVERTON, Mark, Allen
发明人： CHEVERTON, Mark, Allen
IPC分类号： G01B11/00 , G01N21/896
CPC分类号： G01B11/002 , G01N21/958 , G01N2021/8861 , G01N2021/9511 , G06T7/0004 , G06T7/73
摘要： Disclosed herein is a method comprising acquiring an image of a display film or a mold with a camera; transferring the image to a computer; detecting an angle of alignment and/or a position of the display film or the mold from the image; detecting coordinates of defects located in the display film or the mold; and correcting the coordinates of the defects by compensating for the angle of alignment and/or the position of the display film or the mold.
摘要翻译：这里公开了一种方法，包括用相机获取显示胶片或模具的图像; 将图像传输到计算机; 从图像中检测显示膜或模具的对准角度和/或位置; 检测位于显示膜或模具中的缺陷的坐标; 以及通过补偿对准的角度和/或显示膜或模具的位置来校正缺陷的坐标。

8. 发明申请

WO2008082414A1 METHODS FOR IMPROVING MOLD QUALITY FOR USE IN THE MANUFACTURE OF LIGHT MANAGEMENT FILM, MANUFACTURED FILM AND CORRESPONDING MOLD 审中-公开
标题翻译：提高模具质量的方法，用于制造光管理薄膜，制造薄膜和相关模具
公开(公告)号：WO2008082414A1
公开(公告)日：2008-07-10
申请号：PCT/US2007/000100
申请日：2007-01-04
申请人： GENERAL ELECTRIC COMPANY , BUCKLEY, Paul, William , CAPAIDO, Kevin, Patrick , CHAKRAVARTI, Jamuna , CHEVERTON, Mark, Allen , CLINNIN, David, Dean , DAVIS, Michael, John , LITTLE, Robert, Douglas , PARUCHURU, Vijay, Krishna , SZE, Micah, Sakiestewa , TALSANIA, Sameer, Kirti , WATKINS, Vicki, Herzi , YAMADA, Masako , YORK, Jana, Sue , ZARNOCH, Kenneth, Paul
发明人： BUCKLEY, Paul, William , CAPAIDO, Kevin, Patrick , CHAKRAVARTI, Jamuna , CHEVERTON, Mark, Allen , CLINNIN, David, Dean , DAVIS, Michael, John , LITTLE, Robert, Douglas , PARUCHURU, Vijay, Krishna , SZE, Micah, Sakiestewa , TALSANIA, Sameer, Kirti , WATKINS, Vicki, Herzi , YAMADA, Masako , YORK, Jana, Sue , ZARNOCH, Kenneth, Paul
IPC分类号： B29C33/72 , B29C33/38
CPC分类号： B29C33/72 , B29C33/3878 , C25F1/00
摘要： Disclosed herein is a method comprising inspecting a mold for a defect; determining a type of defect present on the mold; sorting the mold by type of defect present; treating the mold with a cleaning process that is suitable to remove the defect; and pressing the mold against a polymeric film to produce a series of defect free light management films; wherein the yield of light management films manufactured from the mold is higher than the yield of light management films that are produced from a comparative mold that has not been treated with the cleaning process.
摘要翻译：本文公开了一种检查缺陷的模具的方法; 确定模具上存在的缺陷类型; 按存在的缺陷类型对模具进行分选; 用适合于去除缺陷的清洁工艺处理模具; 并将模具压在聚合物膜上以产生一系列无缺陷的光管理膜; 其中从模具制造的光管理膜的产量高于由未经过清洁处理的比较模具生产的光管理膜的产量。

9. 发明授权

EP2710797B1 METHOD AND SYSTEM FOR EMBEDDED TEMPERATURE AND/OR STRAIN SENSORS 失效
标题翻译：嵌入式温度和/或应变传感器的方法和系统
公开(公告)号：EP2710797B1
公开(公告)日：2018-04-11
申请号：EP12725928.1
申请日：2012-05-15
申请人： General Electric Company
发明人： SINGH, Prabhjot , WANG, Guanghua , CHEVERTON, Mark, Allen , POPIELARCZYK, Jeffrey, Joseph , SHIANG, Joseph, John
IPC分类号： H04N5/30 , H04N7/18 , B23P17/00 , B23P15/00
CPC分类号： G01K11/20 , F01D17/02 , F05D2260/80 , G01B11/165 , G01D5/34 , G01K13/02 , G01K2013/024 , G01L23/16 , G06T7/001 , G06T2207/30164 , Y02T50/671 , Y10T29/49117 , Y10T29/49124 , Y10T29/49336 , Y10T29/49769
摘要： A system and method for monitoring system including a embedded sensor coupled to an article, wherein the embedded sensor is a direct write embedded sensor using a high temperature light emitting material. A camera system detects illumination signals from the embedded sensors. A processing section processes the illumination signals and determines gas/surface temperatures and strain data for the article.

10. 发明公开

EP3594909A1 SYSTEMS AND METHODS FOR CREATING COMPENSATED DIGITAL REPRESENTATIONS FOR USE IN ADDITIVE MANUFACTURING PROCESSES 有权
公开(公告)号：EP3594909A1
公开(公告)日：2020-01-15
申请号：EP19191528.9
申请日：2014-06-27
申请人： General Electric Company
发明人： GRAHAM, Michael, Evans , CARTER, William, Thomas , CHEVERTON, Mark, Allen , YANG, Pinghai
IPC分类号： G06T19/00 , B22F3/10
摘要： A system for fabricating a component includes an additive manufacturing device and a computing device. The additive manufacturing device is configured to fabricate a first component by sequentially forming a plurality of superposed layers based upon a nominal digital representation of a second component, which includes a plurality of nominal digital two-dimensional cross-sections, each corresponding to a layer of the first component. The computing device includes a processor, wherein for an i th layer of the first component, the processor is configured to (a) generate a cumulative compensation transformation; (b) apply the cumulative compensation transformation to the nominal digital two-dimensional cross-section corresponding to the i th layer to create an intermediate digital two-dimensional cross-section corresponding to the i th layer; (c) determine a local compensation transformation; and (d) apply the local compensation transformation to the intermediate digital two-dimensional cross-section corresponding to the i th layer.

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