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1. 发明专利

JPS592935A Feeder rail changeover device 失效
标题翻译：进料器更换装置
公开(公告)号：JPS592935A
公开(公告)日：1984-01-09
申请号：JP11104982
申请日：1982-06-28
申请人： Fujitsu Ltd
发明人： KAWAI SHIGERU , ITOU HARUO
IPC分类号： B65G43/00 , B60M1/32 , B60M7/00 , B65G17/00
CPC分类号： B60M1/32
摘要： PURPOSE:To contrive the simplification of structure of the titled rail, by providing a changeover rail, a carrier part which is on an identical plane with the changeover rail in a right angle direction of the same and a mobile guide component of the changeover rails on an end of feeder rails. CONSTITUTION:A changeover rail 15, a carrier part moving the changeover reail 15 on an identical plane with the carrier part in a right angle direction of the same and a guide component 18 guiding movement of the changeover rail 15 are provided on an end of a plurality of feeder rails 1, 11 and 12, and a mechanism leading the collector 2 on the changeover rail and moving the changeover rail to a position of the other feeder rail through the carrier part when at least one collector 2 on any one of the feeder rails is switched to the other rail is provided as well. The ritled device is made into a feeder rail changeover device which is simple in its mechanism and is safe, by fabricating in this manner.
摘要翻译：目的：为了简化标准轨道的结构，通过提供转换轨道，与转换轨道在与其直角方向相同的平面上的承载部件和切换导轨的移动导向部件馈线的末端。构成：切换导轨15，将转接尾杆15与托架部分沿其直角方向移动在同一平面上的托架部分和引导切换导轨15的运动的引导部件18设置在多个供给轨道1,11和12，以及将收集器2引导到转换轨道上的机构，并且当至少一个收集器2在馈送器中的任何一个上时，将转换轨道移动到另一馈送轨道穿过载体部分的位置还提供轨道切换到另一个轨道。通过以这种方式制造，将该装置制成馈线导轨切换装置，其机构简单且安全。

2. 发明专利

JPH0335699B2 失效
公开(公告)号：JPH0335699B2
公开(公告)日：1991-05-29
申请号：JP6437685
申请日：1985-03-28
申请人： FUJITSU LTD
发明人： KAWAI SHIGERU , MINAMITANI HIRONORI
IPC分类号： G05B19/418 , G06Q10/08 , G06Q50/00 , G06Q50/04 , G06Q50/28

3. 发明专利

JPH0125676B2 失效
公开(公告)号：JPH0125676B2
公开(公告)日：1989-05-18
申请号：JP20160582
申请日：1982-11-17
申请人： FUJITSU LTD
发明人： ITO HARUO , KAWAI SHIGERU , NOBE YASUO
IPC分类号： B25J15/08 , B25J9/16 , B25J13/00 , B25J15/00 , B65H9/08 , G01M99/00

4. 发明专利

JPS5988277A TEST METHOD BY ROBOT 失效
公开(公告)号：JPS5988277A
公开(公告)日：1984-05-22
申请号：JP19726582
申请日：1982-11-10
申请人： FUJITSU LTD
发明人： KAWAI SHIGERU , NOBE YASUO , ITOU HARUO
IPC分类号： B25J9/16 , B25J13/00 , B25J19/00 , G01M99/00 , G05B23/02 , G07D9/00

5. 发明专利

JPS58153185A TESTING OF CUTTING OFF POWER SOURCE 失效
公开(公告)号：JPS58153185A
公开(公告)日：1983-09-12
申请号：JP3548282
申请日：1982-03-06
申请人： FUJITSU LTD
发明人： KAWAI SHIGERU
IPC分类号： G01R31/18
摘要： PURPOSE:To enable the testing of switching ON or OFF depending on the same type of power source by arranging joints at several points in a power source duct so as to supply power ducts on both sides from the same type of power source while the power supply is cut off by running of a receiving trolley. CONSTITUTION:A feeder 14 from a receiving trolley 13 is connected to a power receiving object 15 provided on a base 16 running on a conveyor line 17. In this case, the length of a support wire of the feeder 14 can be adjusted extensionally or flexibly depending on the position of the power receiving object 15. When the power receiving object 15 runs, the power source 12 is turned ON or OFF each time the power receiving trolley 13 passes at a joint 11 of the power source duct 10. Therefore, if the power source duct 10 is made endless or to reciprocate between specified sections, a testing can be performed at a desired frequency of cutting OFF. In other words, this enables the testing for cutting OFF of a power source as desired only by controlling the running with the power receiving object 15 on the conveyor line 17.

6. 发明专利

JPS5821175A TESTING DEVICE FOR TEMPERATURE 失效
公开(公告)号：JPS5821175A
公开(公告)日：1983-02-07
申请号：JP11970581
申请日：1981-07-30
申请人： FUJITSU LTD
发明人： KAWAI SHIGERU
IPC分类号： G01R31/30 , G01N17/00 , G01R31/28
摘要： PURPOSE:To perform high temp./low temp. cycle tests automatically under programmed control and to improve the efficiency of the testing operations by setting the environmental conditions for testing the temp. of printed board units in a control section. CONSTITUTION:A function tester 1 for testing the functions of a printed board unit 23 wherein electronic parts, etc. are packaged on a printed board is provided with a thermal box 7 for covering the unit 23, a heat chamber 4 having a duct 4a for feeding of hot wind into the box 7, a cold chamber 5 having ducts 5a-5c for circulating cold wind in the box 7, and a control section 8 for controlling the chambers 4 and 5 selectively. The temp. of atmosphere in the box 7 is controlled to a required temp. by the selection of the chambers 4 and 5, whereby the unit 23 is tested.

7. 发明专利

JPS61221958A CONTROL METHOD FOR PRODUCTION PROCESS 失效
公开(公告)号：JPS61221958A
公开(公告)日：1986-10-02
申请号：JP6437685
申请日：1985-03-28
申请人： FUJITSU LTD
发明人： KAWAI SHIGERU , MINAMITANI HIRONORI
IPC分类号： G05B19/418 , G06Q10/08 , G06Q50/00 , G06Q50/04 , G06Q50/28
摘要： PURPOSE:To attain the grasp and distribution of the proper ability of manufac turing processes by producing a stock-out request included in the working sched ule taken out of a control file and then producing a stock-out procedure for materials and partially fabricated products based on the data on said stock-out request. CONSTITUTION:A test program processing part 616 extracts the prescribed data out of an OMF file 611, a drawing number master file 612, oand in-process stock file 613, an in-process control file 614 and a calender file 615 respectively. Then a test program file 618 is produced with reference to a drawing number- classified stock file 617. A stock-out sequence program processing part 671 refers to the file 618 to produce a stock-out sequence file 672 to decide the stock-out sequence of the PT plate units to be tested and stored in an automated warehouse.

8. 发明专利

JPS5993281A ROBOT HAND 失效
公开(公告)号：JPS5993281A
公开(公告)日：1984-05-29
申请号：JP20160682
申请日：1982-11-17
申请人： FUJITSU LTD
发明人： ITOU HARUO , KAWAI SHIGERU , NOBE YASUO
IPC分类号： B25J15/00 , B25J15/08

9. 发明专利

JPH04326071A METHOD FOR TESTING IC MOUNTING BOARD 失效
公开(公告)号：JPH04326071A
公开(公告)日：1992-11-16
申请号：JP9653291
申请日：1991-04-26
申请人： FUJITSU LTD
发明人： KAWAI SHIGERU , TASAI KOUJI
IPC分类号： G01R31/02
摘要： PURPOSE:To markedly enhance the test efficiency of an IC mounting board having electronic parts such as an IC, and LSI or the like mounted thereon in high density. CONSTITUTION:The mounting state of electronic parts 30 is tested using a tester 50 equipped with probe pins 51 coming into contact with the respective circuit nets of an IC mounting board 40. By measuring the electric resistance values between the short circuit point P to which all of the probe pins 51 are electrically connected and the leads 31 of the electronic parts 31 mounted on the IC mounting board 40, the quality of the mounting state of the electronic parts 30 is tested.

10. 发明专利

JPH0151312B2 失效
公开(公告)号：JPH0151312B2
公开(公告)日：1989-11-02
申请号：JP20160482
申请日：1982-11-17
申请人： FUJITSU LTD
发明人： ITO HARUO , KAWAI SHIGERU , NOBE YASUO
IPC分类号： B25J15/00 , B25J9/16 , B25J13/00 , B25J15/08 , B65H3/00 , B65H3/26 , G01M99/00

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