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1. 发明申请

US20100042355A1 METHOD FOR MONITORING THERMAL CONTROL 有权
标题翻译：监控热控制的方法
公开(公告)号：US20100042355A1
公开(公告)日：2010-02-18
申请号：US12193497
申请日：2008-08-18
申请人： Francois Aube , Timothy M. Curtis , Matthew S. Grady , Thomas P. Scanlon , Eric N. Smith
发明人： Francois Aube , Timothy M. Curtis , Matthew S. Grady , Thomas P. Scanlon , Eric N. Smith
IPC分类号： G01K13/00
CPC分类号： G01K7/01 , G01K15/00 , G01R31/2874
摘要： A structure has a heat dissipating feature, an internal temperature measurement device, and a memory. The structure generates heat as power is supplied to the structure, and a threshold voltage of the internal temperature measurement device changes as the temperature of the temperature measurement device changes. The embodiments herein establish a linear relationship between temperature and threshold voltage by heating the structure to a first temperature and recording a first threshold voltage, and then heating the structure to a second temperature and recording a second threshold voltage. From this, the embodiments herein calculate a linear relationship between temperature and threshold voltage. Further, the embodiments herein can calculate the temperatures of the structure based only upon the linear relationship and threshold voltages measured from internal temperature measurement device.
摘要翻译：结构具有散热特征，内部温度测量装置和存储器。该结构在向结构供电时产生热量，并且内部温度测量装置的阈值电压随温度测量装置的温度变化而变化。本文的实施例通过将结构加热到第一温度并记录第一阈值电压，然后将结构加热到第二温度并记录第二阈值电压来建立温度和阈值电压之间的线性关系。由此，这里的实施例计算温度和阈值电压之间的线性关系。此外，这里的实施例可以仅基于从内部温度测量装置测量的线性关系和阈值电压来计算结构的温度。

2. 发明授权

US08087823B2 Method for monitoring thermal control 有权
标题翻译：监控热控制的方法
公开(公告)号：US08087823B2
公开(公告)日：2012-01-03
申请号：US12193497
申请日：2008-08-18
申请人： Francois Aube , Timothy M. Curtin , Matthew S. Grady , Thomas P. Scanlon , Eric N. Smith
发明人： Francois Aube , Timothy M. Curtin , Matthew S. Grady , Thomas P. Scanlon , Eric N. Smith
IPC分类号： G01K1/00 , G01K7/00 , G01K3/00 , H01L35/00
CPC分类号： G01K7/01 , G01K15/00 , G01R31/2874
摘要： A structure has a heat dissipating feature, an internal temperature measurement device, and a memory. The structure generates heat as power is supplied to the structure, and a threshold voltage of the internal temperature measurement device changes as the temperature of the temperature measurement device changes. The embodiments herein establish a linear relationship between temperature and threshold voltage by heating the structure to a first temperature and recording a first threshold voltage, and then heating the structure to a second temperature and recording a second threshold voltage. From this, the embodiments herein calculate a linear relationship between temperature and threshold voltage. Further, the embodiments herein can calculate the temperatures of the structure based only upon the linear relationship and threshold voltages measured from internal temperature measurement device.
摘要翻译：结构具有散热特征，内部温度测量装置和存储器。该结构在向结构供电时产生热量，并且内部温度测量装置的阈值电压随温度测量装置的温度变化而变化。本文的实施例通过将结构加热到第一温度并记录第一阈值电压，然后将结构加热到第二温度并记录第二阈值电压来建立温度和阈值电压之间的线性关系。由此，这里的实施例计算温度和阈值电压之间的线性关系。此外，这里的实施例可以仅基于从内部温度测量装置测量的线性关系和阈值电压来计算结构的温度。

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