会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明授权
    • Method for determining bias in an inertial measurement unit of an image acquisition device
    • US11223764B2
    • 2022-01-11
    • US17000698
    • 2020-08-24
    • FotoNation Limited
    • Piotr Stec
    • H04N5/232G01C25/00G06T7/20
    • A method for determining bias in an inertial measurement unit of an image acquisition device comprises mapping at least one reference point within an image frame into a 3D spherical space based on a lens projection model for the image acquisition device to provide a respective anchor point in 3D space for each reference point. For reference points within a given image frame, an estimate of frame-to-frame motion at the reference point between the given frame and a previously acquired frame is obtained; a measure of device orientation for an acquisition time of the reference point in the given frame and the previously acquired frame, the measure including a bias component, is obtained from the inertial measurement unit; a corresponding anchor point is projected in 3D space according to a difference in the measure of device orientation in the given frame and the previously acquired frame to provide a 3D vector Vm; a result of the estimated frame-to-frame motion for the point from the given frame is projected into the previously acquired frame into 3D space to provide a 3D vector Ve; and a cross product Vc of the 3D vectors Vm and Ve is used to update a bias component value.