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1. 发明申请

WO2007008790A2 PROBE CARD ASSEMBLY WITH AN INTERCHANGEABLE PROBE INSERT 审中-公开
标题翻译：探针卡组装与可交换的探头插入
公开(公告)号：WO2007008790A2
公开(公告)日：2007-01-18
申请号：PCT/US2006/026723
申请日：2006-07-07
申请人： FORMFACTOR, INC. , ELDRIDGE, Benjamin, N. , REYNOLDS, Carl, V. , KAWAMATA, Nobuhiro , SAEKI, Takao
发明人： ELDRIDGE, Benjamin, N. , REYNOLDS, Carl, V. , KAWAMATA, Nobuhiro , SAEKI, Takao
IPC分类号： G01R31/02
CPC分类号： G01R31/2889 , G01R31/31905
摘要： A probe card assembly can include an insert holder configured to hold a probe insert, which can include probes disposed in a particular configuration for probing a device to be tested. The probe card assembly can provide an electrical interface to a tester that can control testing of the device, and while attached to the probe card assembly, the insert holder can hold the probe insert such that the probe insert is electrically connected to electrical paths within the probe card assembly that are part of the interface to the tester. The probe insert of the probe card assembly can be replaced by detaching the insert holder, replacing the probe insert with a new probe insert, and then reattaching the insert holder to the probe card assembly. The probe insert and holder can be integrally formed and comprise a single structure that can be detached from a probe card assembly and replaced with a different probe insert and holder.
摘要翻译：探针卡组件可以包括构造成保持探针插入件的插入物保持器，其可以包括以特定构造设置的探针，用于探测待测试的装置。探针卡组件可以向测试器提供电接口，该接口可以控制设备的测试，并且在附接到探针卡组件时，插入物保持器可以保持探针插入件，使得探针插入件电连接到内部的电路径探针卡组件是测试仪接口的一部分。探针卡组件的探针插入可以通过拆卸插入物夹持器，用新的探针插入物代替探针插入物，然后将插入物夹持器重新连接到探针卡组件来代替。探针插入物和保持器可以一体地形成并且包括可以从探针卡组件分离并且用不同的探针插入物和保持器代替的单个结构。

2. 发明申请

WO2008070590A2 PROBING APPARATUS WITH GUARDED SIGNAL TRACES 审中-公开
标题翻译：具有防护信号迹线的探测设备
公开(公告)号：WO2008070590A2
公开(公告)日：2008-06-12
申请号：PCT/US2007/086199
申请日：2007-11-30
申请人： FORMFACTOR, INC. , ELDRIDGE, Benjamin, N. , REYNOLDS, Carl, V. , SAEKI, Takao , URAKAWA, Yoichi
发明人： ELDRIDGE, Benjamin, N. , REYNOLDS, Carl, V. , SAEKI, Takao , URAKAWA, Yoichi
IPC分类号： G01R31/02
CPC分类号： G01R1/18 , G01R1/07307 , G01R31/2889
摘要： probing apparatus can comprise a substrate, conductive signal traces, probes, and electromagnetic shielding. The substrate can have a first surface and a second surface opposite the first surface, and the electrically conductive first signal traces can be disposed on the first surface of the first substrate. The probes can be attached to the first signal traces, and the electromagnetic shielding structures can be disposed about the signal traces.
摘要翻译：探测装置可以包括衬底，导电信号迹线，探针和电磁屏蔽。基板可以具有第一表面和与第一表面相对的第二表面，并且导电的第一信号迹线可以设置在第一基板的第一表面上。探头可以连接到第一条信号线，电磁屏蔽结构可以设置在信号线周围。

3. 发明公开

EP1904861A2 PROBE CARD ASSEMBLY WITH AN INTERCHANGEABLE PROBE INSERT 审中-公开
标题翻译：具有可互换测试插入PRÜFKARTENBAUGRUPPE
公开(公告)号：EP1904861A2
公开(公告)日：2008-04-02
申请号：EP06774597.6
申请日：2006-07-07
申请人： FormFactor, Inc.
发明人： ELDRIDGE, Benjamin, N. , SAEKI, Takao , KAWAMATA, Nobuhiro , REYNOLDS, Carl, V.
IPC分类号： G01R31/02
CPC分类号： G01R1/07364 , G01R1/07378
摘要： A probe card assembly can include an insert holder configured to hold a probe insert, which can include probes disposed in a particular configuration for probing a device to be tested. The probe card assembly can provide an electrical interface to a tester that can control testing of the device, and while attached to the probe card assembly, the insert holder can hold the probe insert such that the probe insert is electrically connected to electrical paths within the probe card assembly that are part of the interface to the tester. The probe insert of the probe card assembly can be replaced by detaching the insert holder, replacing the probe insert with a new probe insert, and then reattaching the insert holder to the probe card assembly. The probe insert and holder can be integrally formed and comprise a single structure that can be detached from a probe card assembly and replaced with a different probe insert and holder.

4. 发明公开

EP2092356A2 PROBING APPARATUS WITH GUARDED SIGNAL TRACES 审中-公开
标题翻译：使用屏蔽信号线探测装置，
公开(公告)号：EP2092356A2
公开(公告)日：2009-08-26
申请号：EP07865067.8
申请日：2007-11-30
申请人： FormFactor, Inc.
发明人： ELDRIDGE, Benjamin N. , REYNOLDS, Carl V. , SAEKI, Takao , URAKAWA, Yoichi
IPC分类号： G01R31/02
CPC分类号： G01R1/18 , G01R1/07307 , G01R31/2889
摘要： probing apparatus can comprise a substrate, conductive signal traces, probes, and electromagnetic shielding. The substrate can have a first surface and a second surface opposite the first surface, and the electrically conductive first signal traces can be disposed on the first surface of the first substrate. The probes can be attached to the first signal traces, and the electromagnetic shielding structures can be disposed about the signal traces.

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