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    • 4. 发明申请
    • Method to characterize material using mathematical propagation models and ultrasonic signal
    • 使用数学传播模型和超声波信号来表征材料的方法
    • US20050102109A1
    • 2005-05-12
    • US10975560
    • 2004-10-28
    • Marc DuboisPeter LorraineRobert Filkins
    • Marc DuboisPeter LorraineRobert Filkins
    • G01N29/24G01N29/44G01N29/48G01B5/28
    • G01N29/48G01N29/0645G01N29/2418G01N29/4418
    • The invention is directed to a system and method for detecting defects in a manufactured object. These defects may include flaws, delaminations, voids, fractures, fissures, or cracks, among others. The system utilizes an ultrasound measurement system, a signal analyzer and an expected result. The signal analyzer compares the signal from the measurement system to the expected result. The analysis may detect a defect or measure an attribute of the manufactured object. Further, the analysis may be displayed or represented. In addition, the expected result may be generated from a model such as a wave propagation model. One embodiment of the invention is a laser ultrasound detection system in which a laser is used to generate an ultrasonic signal. The signal analyzer compares the measured ultrasonic signal to an expected result. This expected result is generated from a wave propagation model. The analysis is then displayed on a monitor.
    • 本发明涉及一种用于检测制造对象中的缺陷的系统和方法。 这些缺陷可能包括缺陷,分层,空隙,裂缝,裂缝或裂纹等。 该系统利用超声测量系统,信号分析仪和预期结果。 信号分析仪将来自测量系统的信号与预期结果进行比较。 分析可以检测缺陷或测量所制造的对象的属性。 此外,可以显示或表示分析。 此外,可以从诸如波传播模型的模型生成预期结果。 本发明的一个实施例是激光超声波检测系统,其中使用激光来产生超声波信号。 信号分析仪将测量的超声信号与预期结果进行比较。 该预期结果是从波传播模型产生的。 然后将分析显示在监视器上。
    • 6. 发明申请
    • Passive broad long wave and mid-wave infrared optical limiting prism
    • 被动宽波长和中波红外光学极化棱镜
    • US20060132905A1
    • 2006-06-22
    • US11012106
    • 2004-12-16
    • Pingfan WuGeorge DalakosBrian LawrencePeter Lorraine
    • Pingfan WuGeorge DalakosBrian LawrencePeter Lorraine
    • G02B5/08G02B5/20
    • G02B5/04G02B5/00G02B5/08G02B5/208
    • Method for limiting the amount of radiation impinging on a radiation sensitive detector that is responsive to signals of interest having infrared wavelengths of approximately 3 to 14 microns, such as an infrared camera. The method includes: directing a radiation signal through a prism and toward the radiation sensitive detector; permitting the radiation signal to impinge upon the radiation sensitive detector, e.g. upon an infrared focal plane array in the camera, when the radiation is below a predetermined threshold; and directing radiation associated with the radiation signal but having wavelengths different from said signals of interest—e.g., wavelengths in the visible and near-infrared range—on a path external to the prism, in order to initiate the limiting of the radiation impinging upon the radiation sensitive detector when the predetermined threshold is exceeded. Also, a Total Internal Reflection device that includes a prism having a thin film coated on the back surface of said prism. The material making up the prism and the thin film are selected so that, in the presence of radiation having an intensity less than a certain threshold, the refractive index of the thin film is lower than that of the prism, and when the radiation has an intensity higher than that certain threshold, the refractive index of the thin film is higher than that of the prism.
    • 用于限制辐射敏感检测器上的辐射量的方法,其响应于红外波长为约3至14微米的感兴趣信号,例如红外相机。 该方法包括:将辐射信号引导通过棱镜并朝向辐射敏感检测器; 允许辐射信号照射在辐射敏感检测器上,例如。 在相机中的红外焦平面阵列上,当辐射低于预定阈值时; 并且引导与辐射信号相关联的辐射,但是具有不同于感兴趣信号的波长(例如在可见光和近红外范围内的波长)在棱镜外部的路径上,以便开始限制辐射入射到 超过预定阈值时的辐射敏感检测器。 另外,全内反射装置,其包括具有涂覆在所述棱镜的后表面上的薄膜的棱镜。 选择构成棱镜和薄膜的材料,使得在存在强度小于某一阈值的辐射的情况下,薄膜的折射率低于棱镜的折射率,并且当辐射具有 强度高于该阈值,薄膜的折射率高于棱镜的折射率。