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    • 1. 发明授权
    • Focal surface and detector for opto-electronic imaging systems, manufacturing method and opto-electronic imaging system
    • 光电成像系统的焦点表面和检测器,制造方法和光电成像系统
    • US06849843B2
    • 2005-02-01
    • US09776343
    • 2001-02-02
    • Fank AnsorgeSiegfried CraubnerMichael FeilWilli PlatzHelmut Riedel
    • Fank AnsorgeSiegfried CraubnerMichael FeilWilli PlatzHelmut Riedel
    • G03B15/00G02B23/06G02B23/12H01L27/14H01L27/146H04N5/335H01L27/00
    • H01L27/14603H01L27/1462H01L27/14625H01L27/14683
    • The focal surface for an opto-electronic imaging system includes an arrangement of detectors for image recording and a detector carrier or a FPA carrier for holding the detectors. The detectors are each made of at least one solid state element that is bonded to a flexible carrier substrate. The focal surface, or the detectors, respectively, exhibits a curvature, such that a curved field of view can be recorded. In a method for manufacturing a focal surface for opto-electronic imaging systems, at least one solid state element is bonded to a flexible carrier substrate to form flexible detectors, whereby a detector carrier provides a curvature and the flexible detectors are adapted to the curvature of the detector carrier. To manufacture a detector according to the present invention, a solid state element is thinned and bonded to a flexible carrier substrate, such that it is formed in a flexible manner and can be adapted to a curvature of a field of view. An opto-electronic imaging system according to the present invention with front optics for capturing an image and a detector arrangement that is arranged in a focal surface of the front optics, in which the detector arrangement is arranged in the focal surface in a curved manner.
    • 用于光电成像系统的焦面包括用于图像记录的检测器的布置以及用于保持检测器的检测器载体或FPA载体。 检测器各自由至少一个固态元件制成,其固定在柔性载体基片上。 焦点表面或检测器分别表现出曲率,使得可以记录弯曲的视场。 在用于制造光电成像系统的焦面的方法中,至少一个固态元件被结合到柔性载体衬底上以形成柔性检测器,由此检测器载体提供曲率,并且柔性检测器适于曲率 检测器载体。 为了制造根据本发明的检测器,固态元件被薄化并结合到柔性载体基底上,使得其以柔性的方式形成并且可以适应于视场的曲率。 根据本发明的光电成像系统具有用于捕获图像的前光学器件和布置在前光学器件的焦面中的检测器装置,其中检测器装置以弯曲的方式布置在焦面中。