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    • 2. 发明申请
    • OFFSET COMPENSATING CIRCUIT
    • 偏移补偿电路
    • WO1980002347A1
    • 1980-10-30
    • PCT/JP1980000084
    • 1980-04-23
    • FUJITSU LTDOHHATA MMATSUMURA TYAMASAWA MCHUJO TTAKAHASHI M
    • FUJITSU LTD
    • H03K13/02
    • H04L25/064H03M1/0602
    • Offset compensating circuit adapted to be built into a circuit to be compensated. The offset compensating circuit (21) is incorporated into a negative feedback loop of the circuit to be compensated, and essentially comprises an integrating circuit. The integrating circuit is composed of switching means (SW) and a switched capacitor-type integrating circuit (23). The switching means (SW) operates to feed either one of a positive reference voltage (+ Vr) and a negative reference voltage (- Vr) in response to the polarity of the output signal from the circuit to be compensated. The positive or negative reference voltage (+ Vr) is applied to the switched capacitor-type integrating circuit (23), which generates an offset compensating voltage (Vc) to be superposed to the input signal of the circuit to be compensated.
    • 偏移补偿电路适用于要补偿的电路。 偏移补偿电路(21)被并入要补偿的电路的负反馈环路中,并且基本上包括积分电路。 积分电路由开关装置(SW)和开关电容型集成电路(23)构成。 开关装置(SW)响应于要补偿的电路的输出信号的极性而进行正参考电压(+ Vr)和负参考电压(-Vr)之一的供给。 正/负参考电压(+ Vr)被施加到开关电容器型积分电路(23),该电路产生将要补偿的电路的输入信号叠加的偏移补偿电压(Vc)。
    • 6. 发明申请
    • LIGHT RECEIVING CIRCUIT
    • 光接收电路
    • WO1982000073A1
    • 1982-01-07
    • PCT/JP1981000138
    • 1981-06-15
    • FUJITSU LTDMINAMI TNISHIMOTO H
    • FUJITSU LTD
    • H04B09/00
    • H04B10/6931H03G3/3084H04B10/6911
    • Dans un circuit de reception de lumiere ou la sortie d'un amplificateur (13) est maintenue a un niveau constant independamment du niveau des sorties lumineuses en commandant le facteur de multiplication d'une photodiode a avalanche (12) et le gain de l'amplificateur (13), le facteur de multiplication M de la photodiode a avalanche (12) et le gain G de l'amplificateur (13) sont changes successivement selon une approximation d'une ligne polygonale de maniere telle que le rapport signal-bruit dans la sortie de l'amplificateur (13) s'approche d'une valeur optimale en utilisant un circuit de commande simple. A cet effet, lorsque le niveau d'entree de lumiere (11) est faible, la VAPD est reglee par l'intermediaire d'un amplificateur differentiel (52), une diode (56) et un circuit generateur de haute tension (54) de maniere a diminuer M et, lorsque le niveau d'entree de lumiere monte et que V2 devient negatif, VAGC est regle de maniere a diminuer G. Lorsque le niveau d'entree de lumiere monte encore plus et que VAGC devient egal a Vreff3, M est encore diminue en ajustant une tension de reference qui alimente un amplificateur differentiel (51), vers un niveau plus bas. Lorsque la sortie V5 d'un amplificateur differentiel (53) est saturee, VAPD est fixe de maniere a maintenir M constant et seul VAGC change de maniere a diminuer G. Ainsi, M et G sont commandes pour suivre des valeurs optimales.
    • 7. 发明申请
    • INFORMATION PROCESSING SYSTEM FOR ERROR PROCESSING,AND ERROR PROCESSING METHOD
    • 用于错误处理的信息处理系统和错误处理方法
    • WO1981000481A1
    • 1981-02-19
    • PCT/JP1980000175
    • 1980-07-29
    • FUJITSU LTDKUBO STANIGUCHI SSHINKE OISHII M
    • FUJITSU LTD
    • G11C29/00
    • G11C29/70F02P5/1506G06F11/1024G06F11/1044Y02T10/46
    • A data processing system for error processing and an error processing method, which system includes a main memory (M), an information processing unit (A), an error processing unit (EP) and an alternate memory. When an error arises in a portion of the main memory, corrected information is stored in the alternate memory. Then, under the control of the error processing unit (EP), the alternate memory is employed instead of the malfunctioning portion of the main memory. The alternate memory is adapted to be used only when the error is a fixed error or a burst error, in order to avoid a system shut-down caused by fixed- and soft-errors or burst- and soft-errors which occur during information processing. The alternate memory, therefore, is not used in a case where the error is a soft error. This imparts an additional advantage in that the size of the memory is reduced.
    • 一种用于错误处理的数据处理系统和错误处理方法,该系统包括主存储器(M),信息处理单元(A),错误处理单元(EP)和备用存储器。 当在主存储器的一部分中出现错误时,校正的信息被存储在备用存储器中。 然后,在错误处理单元(EP)的控制下,使用备用存储器代替主存储器的故障部分。 备用存储器仅适用于仅当错误是固定错误或突发错误时才使用,以避免在信息处理期间发生的固定和软错误或突发和软错误引起的系统关闭 。 因此,在错误是软错误的情况下,不使用备用存储器。 这提供了另外的优点,即存储器的尺寸减小。
    • 10. 发明申请
    • METHOD OF PRODUCING INSULATING FILM FOR SEMICONDUCTOR SURFACES
    • 生产半导体表面绝缘膜的方法
    • WO1980001739A1
    • 1980-08-21
    • PCT/JP1979000039
    • 1979-02-19
    • FUJITSU LTDNOZAKI TITO T
    • FUJITSU LTD
    • H01L21/318
    • H01L21/3185
    • Method of producing an insulating film for semiconductor surfaces, in which a silicon substrate is subjected to direct nitriding to thereby produce a film of silicon nitride. The silicon substrate is first subjected to a direct heat-nitriding treatment to produce a relatively thick film of silicon nitride. The silicon substrate is then subjected to a nitriding treatment in aqueous ammonia or an inert gas atmosphere containing gaseous ammonia, thereby to produce a dense and relatively thick film of silicon nitride. The resultant film of silicon nitride is useful for an insulating film for semiconductor devices and also a mask for impurity diffusion or selective oxidation in the production of the semiconductor devices.
    • 制造用于半导体表面的绝缘膜的方法,其中对硅衬底进行直接氮化,从而制造氮化硅膜。 首先对硅衬底进行直接热氮化处理以产生相对厚的氮化硅膜。 然后将硅衬底在氨水或含有气态氨的惰性气体气氛中进行氮化处理,从而产生致密且较厚的氮化硅膜。 所得到的氮化硅膜可用于半导体器件的绝缘膜,并且在半导体器件的制造中也可用于杂质扩散或选择性氧化的掩模。