专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

WO2016015739A1 TUNABLE AMPERE PHASE PLATE FOR CHARGED PARTICLE IMAGING SYSTEMS 审中-公开
标题翻译：用于充电颗粒成像系统的TUNNABLE AMPERE相位板
公开(公告)号：WO2016015739A1
公开(公告)日：2016-02-04
申请号：PCT/EP2014/002080
申请日：2014-07-30
申请人： FORSCHUNGSZENTRUM JÜLICH GMBH
发明人： TAVABI, Amir , SAVENKO, Aleksei , POZZI, Giulio , DUNIN-BORKOWSKI, Rafal, Edward , MIGUNOV, Vadim
IPC分类号： H01J37/26
CPC分类号： H01J37/26 , H01J2237/2614
摘要： The invention pertains to a phase shifting device for a charged particle imaging system, where the particles may especially be electrons. The characterizing feature of the phase shifting device according to the invention is that it comprises means to pass an electric current in a direction that has a nonzero component parallel to at least one section of the imaging beam. Preferably, the electric current is passed parallel along the section of the imaging beam. The amount of phase shift then centrosymmetrically depends on the distance between the electric current axis and the imaging beam axis. The inventors have found that the magnetic field produced by the electric current exhibits the same effect on the phase of the beam as the localized charge according to the Balossier et al. prior art. Advantageously, because the relation between the current and the magnetic field is given by Ampere's Law and the effect of the magnetic field on the beam is well understood as the Aharanov-Bohm effect, the amount of phase shift and its distribution in space are fully understood and predictable. This means that the invention provides means to apply a pre-determined, specifically desired phase shift to the beam, which was not possible with previous phase plates.
摘要翻译：本发明涉及一种用于带电粒子成像系统的相移装置，其中颗粒可以特别地是电子。根据本发明的相移装置的特征在于它包括使电流沿具有平行于成像束的至少一个部分的非零分量的方向传递的装置。优选地，电流沿着成像光束的部分平行地通过。然后相移量的中心对称取决于电流轴与成像光束轴之间的距离。发明人已经发现，通过电流产生的磁场对于根据Balossier等人的局部电荷对波束的相位具有相同的影响。现有技术有利地，由于电流和磁场之间的关系由安培定律给出，并且磁场对光束的影响被很好地理解为Aharanov-Bohm效应，相移量及其在空间中的分布被完全理解并可预测。这意味着本发明提供了将预定的，特别期望的相移施加到梁的手段，这对于先前的相位板是不可能的。

2. 发明申请

WO2023020700A1 MAGNETIZATION DEVICE FOR AN ELECTRON MICROSCOPE AND METHOD 审中-公开
公开(公告)号：WO2023020700A1
公开(公告)日：2023-02-23
申请号：PCT/EP2021/073100
申请日：2021-08-20
申请人： FORSCHUNGSZENTRUM JÜLICH GMBH
发明人： TAVABI, Amir Hossein , SOLTNER, Helmut , SCHAAF, Michael , KRUTH, Maximilian , DUNIN-BORKOWSKI, Rafal, Edward
IPC分类号： H01J37/20
摘要： The invention refers to a Magnetization device (1, 11) for an electron microscope with a coil (2), with a yoke carrying the coil (2), with a sample holder for holding a sample, and with two poles (26, 27) of the yoke adjoining the sample holder. A gap is present in the yoke between each pole and the coil (2). Further, the invention refers to a method of operation of a Magnetization device (1, 11), wherein the Magnetization device (1, 11) comprises a coil (2), a yoke carrying the coil (2), and a sample holder for holding a sample, wherein two poles (26, 27) of the yoke adjoin the sample holder, wherein a gap is present in the yoke between each pole and the coil (2), wherein at least a part of the yoke carrying one or more coils (2) is separated from a part of the Magnetization device (1, 11) comprising the sample holder. A sample is placed on the sample holder by means of an optical microscope and subsequently the part of the Magnetization device (1, 11) comprising the sample holder is connected to the part of the Magnetization device (1, 11) comprising one or more coils (2).

3. 发明授权

EP3175473B1 TUNABLE AMPERE PHASE PLATE FOR CHARGED PARTICLE IMAGING SYSTEMS 有权
公开(公告)号：EP3175473B1
公开(公告)日：2020-04-15
申请号：EP14747517.2
申请日：2014-07-30
申请人： Forschungszentrum Jülich GmbH
发明人： TAVABI, Amir , SAVENKO, Aleksei , POZZI, Giulio , DUNIN-BORKOWSKI, Rafal, Edward , MIGUNOV, Vadim
IPC分类号： H01J37/26

4. 发明公开

EP4388573A1 MAGNETIZATION DEVICE FOR AN ELECTRON MICROSCOPE AND METHOD 审中-公开
公开(公告)号：EP4388573A1
公开(公告)日：2024-06-26
申请号：EP21762718.1
申请日：2021-08-20
申请人： Forschungszentrum Jülich GmbH
发明人： TAVABI, Amir Hossein , SOLTNER, Helmut , SCHAAF, Michael , KRUTH, Maximilian , DUNIN-BORKOWSKI, Rafal, Edward
IPC分类号： H01J37/20
CPC分类号： H01J37/20 , H01J2237/200120130101 , H01J2237/200820130101 , H01J2237/280220130101

5. 发明公开

EP3175473A1 TUNABLE AMPERE PHASE PLATE FOR CHARGED PARTICLE IMAGING SYSTEMS 有权
标题翻译：用于带电粒子成像系统的可调安培相位板
公开(公告)号：EP3175473A1
公开(公告)日：2017-06-07
申请号：EP14747517.2
申请日：2014-07-30
申请人： Forschungszentrum Jülich GmbH
发明人： TAVABI, Amir , SAVENKO, Aleksei , POZZI, Giulio , DUNIN-BORKOWSKI, Rafal, Edward , MIGUNOV, Vadim
IPC分类号： H01J37/26
摘要： A phase shifting device for a charged particle imaging system includes means for passing an electric current in a direction that has a nonzero component parallel to at least one section of the imaging beam. Preferably, the electric current is passed parallel along the section of the imaging beam. The amount of phase shift then centrosymmetrically depends on the distance between the electric current axis and the imaging beam axis. The magnetic field produced by the electric current exhibits the same effect on the phase of the beam as a localized charge according to the prior art.
摘要翻译：本发明涉及用于带电粒子成像系统的相移装置，其中粒子尤其可以是电子。根据本发明的相移装置的特征在于，它包括使电流在具有平行于成像光束的至少一个部分的非零分量的方向上通过的装置。优选地，电流沿着成像光束的截面平行传递。相移的中心对称取决于电流轴和成像光束轴之间的距离。本发明人已经发现，由电流产生的磁场与根据Balossier等人的局部电荷对束的相位表现出相同的影响。现有技术。有利地，因为电流和磁场之间的关系由安培定律给出，并且磁场对于光束的影响被理解为Aharanov-Bohm效应，所以完全理解相移量及其在空间中的分布并可预测。这意味着本发明提供了将预定的，特别期望的相移应用于光束的手段，这对于先前的相位板来说是不可能的。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式