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    • 3. 发明专利
    • Resin for chemically amplified photoresist composition
    • 用于化学放大的光电组合物的树脂
    • JP2003342323A
    • 2003-12-03
    • JP2003134823
    • 2003-05-13
    • Everlight Usa Incエバーライトユーエスエー インコーポレイティッド
    • CHEN CHI-SHENGLI YEN-CHENGCHENG MENG-HSUM
    • C08F20/10C08F220/30G03F7/039H01L21/027
    • C08F220/30G03F7/0395G03F7/0397
    • PROBLEM TO BE SOLVED: To provide a resin for a chemically amplified photoresist composition.
      SOLUTION: The polymer has a structure of a unit (II) represented by the chemical formula 166 (wherein R
      1 is H or a 1-4C alkyl group; R
      2 is a hydroxy group, a 1-8C alkoxy group or a 1-8C thioalkyl group; G is (CH
      2 )
      n , O, or S; n is an integer of 0-4; Rc is a lactone group; and m is an integer of 1-3). The polymer exhibits excellent characteristics such as hydrophilicity and dry etching resistance, and is used for manufacturing a chemically amplified photoresist composition. The chemically amplified photoresist composition is used in a lithography process, particularly in a lithography process using a light source of a wavelength of 193 nm and is quite excellent in resolution, profiles and photosensitivity.
      COPYRIGHT: (C)2004,JPO
    • 要解决的问题:提供一种用于化学放大光致抗蚀剂组合物的树脂。 解决方案:聚合物具有由化学式166表示的单元(II)的结构(其中R 1 为H或1-4C烷基; R 2 < SP>是羟基,1-8C烷氧基或1-8C硫代烷基; G是(CH 2 ),N或S; n是 0-4的整数; R c为内酯基; m为1-3的整数)。 该聚合物表现出优异的特性,例如亲水性和耐干蚀刻性,并且用于制造化学放大光致抗蚀剂组合物。 化学放大光致抗蚀剂组合物用于光刻工艺,特别是在使用波长为193nm的光源的光刻工艺中,并且在分辨率,型材和光敏性方面非常优异。 版权所有(C)2004,JPO