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    • 1. 发明授权
    • Liquid crystal panel inspection method
    • 液晶面板检查方法
    • US5339093A
    • 1994-08-16
    • US801356
    • 1991-12-02
    • Eryohei KumagaiKaoru HiiroHarumi ShimizuTooru Takahashi
    • Eryohei KumagaiKaoru HiiroHarumi ShimizuTooru Takahashi
    • G01M11/00G01N21/95G01N21/956G02F1/13G09G3/36
    • G01N21/95607G01N2021/9513Y10S345/904
    • The present invention makes it possible for unskilled to inspect the total surface of a liquid crystal panel accurately in short time. It is defined that a liquid crystal panel can be divided into a single part which is a constituent, isolable, and an inspectable area, and that the single part to be "unit area of image" which is defined as a pattern to be inspected. Before the inspection, a unit area of an image without defect is selected from a liquid crystal panel to be inspected. The upper limit reference pattern and the lower limit reference pattern are generated by giving the maximal brightness in a convolution and adding the predetermined brightness and by giving the minimal brightness in the convolution and subtracting the predetermined brightness, respectively, to each pixel of the convolution. Comparing a brightness of each pixel of the upper limit and the lower limit reference pattern with a brightness of a pixel of a pattern to be inspected corresponding to it, the liquid crystal panel to be inspected is judged to be up to standard when more than a predetermined number of pixels are within the range between the upper limit and the lower limit brightness of the reference pattern.
    • 本发明使得无需熟练地在短时间内精确地检查液晶面板的总表面成为可能。 定义为可以将液晶面板划分为构成,可隔离和可检查区域的单个部分,并且将被定义为待检查图案的“单位图像区域”的单个部分划分为单个部分。 在检查之前,从要检查的液晶面板中选择没有缺陷的图像的单位面积。 通过给出卷积中的最大亮度并添加预定亮度并且通过给出卷积中的最小亮度并分别将卷积的每个像素减去预定亮度来生成上限参考图案和下限参考图案。 将上限和下限参考图案的每个像素的亮度与对应于待检查图案的像素的亮度进行比较,当被检查的液晶面板多于一个 预定数量的像素在参考图案的上限和下限亮度之间的范围内。