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1. 发明申请

US20090274359A1 SPECIMEN OBSERVATION METHOD 有权
标题翻译：标本观察方法
公开(公告)号：US20090274359A1
公开(公告)日：2009-11-05
申请号：US12501822
申请日：2009-07-13
申请人： Eiko NAKAZAWA , Masahiro Tomita , Hiroyuki Kobayashi
发明人： Eiko NAKAZAWA , Masahiro Tomita , Hiroyuki Kobayashi
IPC分类号： G06K9/00
CPC分类号： G01N23/2252 , H01J37/222 , H01J37/226 , H01J37/228 , H01J37/256 , H01J37/28 , H01J2237/221 , H01J2237/2807
摘要： It is an object of the present invention to provide a specimen observation method, an image processing device, and a charged-particle beam device which are preferable for selecting, based on an image acquired by an optical microscope, an image area that should be acquired in a charged-particle beam device the representative of which is an electron microscope. In the present invention, in order to accomplish the above-described object, there are provided a method and a device for determining the position for detection of charged particles by making the comparison between a stained optical microscope image and an elemental mapping image formed based on X-rays detected by irradiation with the charged-particle beam.
摘要翻译：本发明的目的是提供一种样本观察方法，图像处理装置和带电粒子束装置，其优选用于基于由光学显微镜获取的图像来选择应当获取的图像区域在带电粒子束装置中，其代表是电子显微镜。在本发明中，为了实现上述目的，提供了一种方法和装置，用于通过对染色的光学显微镜图像和基于图像形成的基本映射图像进行比较来确定带电粒子的检测位置通过用带电粒子束照射检测X射线。

2. 发明授权

US08164058B2 Specimen observation method 有权
标题翻译：标本观察法
公开(公告)号：US08164058B2
公开(公告)日：2012-04-24
申请号：US12501822
申请日：2009-07-13
申请人： Eiko Nakazawa , Masahiro Tomita , Hiroyuki Kobayashi
发明人： Eiko Nakazawa , Masahiro Tomita , Hiroyuki Kobayashi
IPC分类号： G21K7/00
CPC分类号： G01N23/2252 , H01J37/222 , H01J37/226 , H01J37/228 , H01J37/256 , H01J37/28 , H01J2237/221 , H01J2237/2807
摘要： It is an object of the present invention to provide a specimen observation method, an image processing device, and a charged-particle beam device which are preferable for selecting, based on an image acquired by an optical microscope, an image area that should be acquired in a charged-particle beam device the representative of which is an electron microscope. In the present invention, in order to accomplish the above-described object, there are provided a method and a device for determining the position for detection of charged particles by making the comparison between a stained optical microscope image and an elemental mapping image formed based on X-rays detected by irradiation with the charged-particle beam.
摘要翻译：本发明的目的是提供一种样本观察方法，图像处理装置和带电粒子束装置，其优选用于基于由光学显微镜获取的图像来选择应当获取的图像区域在带电粒子束装置中，其代表是电子显微镜。在本发明中，为了实现上述目的，提供了一种方法和装置，用于通过对染色的光学显微镜图像和基于图像形成的基本映射图像进行比较来确定带电粒子的检测位置通过用带电粒子束照射检测X射线。

3. 发明授权

US08410440B2 Specimen observation method 失效
公开(公告)号：US08410440B2
公开(公告)日：2013-04-02
申请号：US13398451
申请日：2012-02-16
申请人： Eiko Nakazawa , Masahiro Tomita , Hiroyuki Kobayashi
发明人： Eiko Nakazawa , Masahiro Tomita , Hiroyuki Kobayashi
IPC分类号： G21K7/00
CPC分类号： G01N23/2252 , H01J37/222 , H01J37/226 , H01J37/228 , H01J37/256 , H01J37/28 , H01J2237/221 , H01J2237/2807
摘要： It is an object of the present invention to provide a specimen observation method, an image processing device, and a charged-particle beam device which are preferable for selecting, based on an image acquired by an optical microscope, an image area that should be acquired in a charged-particle beam device the representative of which is an electron microscope. In the present invention, in order to accomplish the above-described object, there are provided a method and a device for determining the position for detection of charged particles by making the comparison between a stained optical microscope image and an elemental mapping image formed based on X-rays detected by irradiation with the charged-particle beam.

4. 发明申请

US20120138795A1 SPECIMEN OBSERVATION METHOD 失效
标题翻译：标本观察方法
公开(公告)号：US20120138795A1
公开(公告)日：2012-06-07
申请号：US13398451
申请日：2012-02-16
申请人： Eiko NAKAZAWA , Masahiro Tomita , Hiroyuki Kobayashi
发明人： Eiko NAKAZAWA , Masahiro Tomita , Hiroyuki Kobayashi
IPC分类号： H01J37/28 , H04N7/18
CPC分类号： G01N23/2252 , H01J37/222 , H01J37/226 , H01J37/228 , H01J37/256 , H01J37/28 , H01J2237/221 , H01J2237/2807
摘要： It is an object of the present invention to provide a specimen observation method, an image processing device, and a charged-particle beam device which are preferable for selecting, based on an image acquired by an optical microscope, an image area that should be acquired in a charged-particle beam device the representative of which is an electron microscope. In the present invention, in order to accomplish the above-described object, there are provided a method and a device for determining the position for detection of charged particles by making the comparison between a stained optical microscope image and an elemental mapping image formed based on X-rays detected by irradiation with the charged-particle beam.
摘要翻译：本发明的目的是提供一种样本观察方法，图像处理装置和带电粒子束装置，其优选用于基于由光学显微镜获取的图像来选择应当获取的图像区域在带电粒子束装置中，其代表是电子显微镜。在本发明中，为了实现上述目的，提供了一种方法和装置，用于通过对染色的光学显微镜图像和基于图像形成的基本映射图像进行比较来确定带电粒子的检测位置通过用带电粒子束照射检测X射线。

5. 发明授权

US07573030B2 Specimen observation method 失效
标题翻译：标本观察法
公开(公告)号：US07573030B2
公开(公告)日：2009-08-11
申请号：US11717155
申请日：2007-03-13
申请人： Eiko Nakazawa , Masahiro Tomita , Hiroyuki Kobayashi
发明人： Eiko Nakazawa , Masahiro Tomita , Hiroyuki Kobayashi
IPC分类号： G21K7/00
CPC分类号： G01N23/2252 , H01J37/222 , H01J37/226 , H01J37/228 , H01J37/256 , H01J37/28 , H01J2237/221 , H01J2237/2807
摘要： It is an object of the present invention to provide a specimen observation method, an image processing device, and a charged-particle beam device which are preferable for selecting, based on an image acquired by an optical microscope, an image area that should be acquired in a charged-particle beam device the representative of which is an electron microscope. In the present invention, in order to accomplish the above-described object, there are provided a method and a device for determining the position for detection of charged particles by making the comparison between a stained optical microscope image and an elemental mapping image formed based on X-rays detected by irradiation with the charged-particle beam.
摘要翻译：本发明的目的是提供一种样本观察方法，图像处理装置和带电粒子束装置，其优选用于基于由光学显微镜获取的图像来选择应当获取的图像区域在带电粒子束装置中，其代表是电子显微镜。在本发明中，为了实现上述目的，提供了一种方法和装置，用于通过对染色的光学显微镜图像和基于图像形成的基本映射图像进行比较来确定带电粒子的检测位置通过用带电粒子束照射检测X射线。

6. 发明申请

US20080073527A1 Specimen observation method 失效
标题翻译：标本观察法
公开(公告)号：US20080073527A1
公开(公告)日：2008-03-27
申请号：US11717155
申请日：2007-03-13
申请人： Eiko Nakazawa , Masahiro Tomita , Hiroyuki Kobayashi
发明人： Eiko Nakazawa , Masahiro Tomita , Hiroyuki Kobayashi
IPC分类号： G01N23/00
CPC分类号： G01N23/2252 , H01J37/222 , H01J37/226 , H01J37/228 , H01J37/256 , H01J37/28 , H01J2237/221 , H01J2237/2807
摘要： It is an object of the present invention to provide a specimen observation method, an image processing device, and a charged-particle beam device which are preferable for selecting, based on an image acquired by an optical microscope, an image area that should be acquired in a charged-particle beam device the representative of which is an electron microscope. In the present invention, in order to accomplish the above-described object, there are provided a method and a device for determining the position for detection of charged particles by making the comparison between a stained optical microscope image and an elemental mapping image formed based on X-rays detected by irradiation with the charged-particle beam.
摘要翻译：本发明的目的是提供一种样本观察方法，图像处理装置和带电粒子束装置，其优选用于基于由光学显微镜获取的图像来选择应当获取的图像区域在带电粒子束装置中，其代表是电子显微镜。在本发明中，为了实现上述目的，提供了一种方法和装置，用于通过对染色的光学显微镜图像和基于图像形成的基本映射图像进行比较来确定带电粒子的检测位置通过用带电粒子束照射检测X射线。

7. 发明申请

US20090218507A1 CHARGED PARTICLE BEAM DEVICE 失效
标题翻译：充电颗粒光束装置
公开(公告)号：US20090218507A1
公开(公告)日：2009-09-03
申请号：US12389838
申请日：2009-02-20
申请人： Akiko Fujisawa , Hiroyuki Kobayashi , Eiko Nakazawa
发明人： Akiko Fujisawa , Hiroyuki Kobayashi , Eiko Nakazawa
IPC分类号： H01J3/14
CPC分类号： H01J37/1471 , H01J37/26 , H01J2237/024 , H01J2237/065 , H01J2237/1501 , H01J2237/2802
摘要： The present invention provides a charged particle beam device which can effectively restrain misalignment of an optical axis even if a position of an anode is changed. The present invention is a charged particle beam device comprising a cathode provided with a charged particle source which emits a charged particle, an anode which applies an electric field to the emitted charged particle, a charged particle beam deflector which deflects an orbit of a charged particle beam having passed the anode, and a charged particle beam detector which detects the charged particle beam from a sample to which the charged particle is irradiated, wherein a distance changing mechanism which changes a distance between the cathode and the anode, corresponding to a charged particle amount emitted from the charged particle source and a deflection amount control mechanism which detects a condition of the deflector under which the charged particle dose detected from the sample scanned by deflecting the charged particle beam in the changed distance becomes a desired size and controls deflection of the deflector at sample measurement on the basis of the condition are provided.
摘要翻译：本发明提供一种带电粒子束装置，即使改变阳极的位置，也能够有效地抑制光轴的未对准。本发明是一种带电粒子束装置，它包括一个阴极，该阴极设有带电粒子源，该粒子源发射一个带电粒子，一个向发射的带电粒子施加电场的阳极，一个带电粒子束偏转器，它使带电粒子的轨道偏转通过阳极的光束和从被照射带电粒子的样品检测带电粒子束的带电粒子束检测器，其中改变对应于带电粒子的阴极和阳极之间的距离的距离改变机构从所述带电粒子源发射的量;以及偏转量控制机构，其检测所述偏转器的状态，在所述偏转量条件下，通过使所述带电粒子束在变化的距离偏转而被扫描的样本中检测到的带电粒子剂量成为期望的尺寸，提供了基于条件的样品测量的偏转器。

8. 发明申请

US20080283750A1 Sample Observation Method and Transmission Electron Microscope 有权
标题翻译：样品观察方法和透射电子显微镜
公开(公告)号：US20080283750A1
公开(公告)日：2008-11-20
申请号：US12119916
申请日：2008-05-13
申请人： Eiko NAKAZAWA , Hiroyuki Kobayashi
发明人： Eiko NAKAZAWA , Hiroyuki Kobayashi
IPC分类号： G01N23/04
CPC分类号： H01J37/265 , H01J2237/245 , H01J2237/282
摘要： There is provided a transmission electron microscope capable of a capturing continuous field-of-view image without having an influence of aberration. In order to obtain an electron beam image of the whole of a predetermined range of a sample, the transmission electron microscope specifies a region with little aberration in a field of view of an image pickup device, moves a sample stage in units of the specified regions, captures the whole of the predetermined range as a plurality of continuous field-of-view images.
摘要翻译：提供了能够捕获连续视野图像而不会产生像差影响的透射电子显微镜。为了获得样品的整个预定范围的电子束图像，透射电子显微镜在图像拾取装置的视野中指定几乎没有像差的区域，以指定区域为单位移动样品台捕获整个预定范围作为多个连续的视野图像。

9. 发明申请

US20110205353A1 METHOD FOR OBSERVING SAMPLE AND ELECTRONIC MICROSCOPE 有权
标题翻译：观察样品和电子显微镜的方法
公开(公告)号：US20110205353A1
公开(公告)日：2011-08-25
申请号：US13126638
申请日：2009-10-19
申请人： Akiko Fujisawa , Hiroyuki Kobayashi , Eiko Nakazawa
发明人： Akiko Fujisawa , Hiroyuki Kobayashi , Eiko Nakazawa
IPC分类号： G06K9/00 , H04N7/18
CPC分类号： G02B21/008 , H01J37/222 , H01J37/28 , H01J2237/221 , H01J2237/226
摘要： A sample observation method of the present invention comprises a step of defining, with respect to an electron microscope image, an outline of an observation object with respect to a sample (3), or a plurality of points located along the outline, and a step of arranging a plurality of fields of view for an electron microscope along the outline, wherein electron microscope images of the plurality of fields of view that have been defined and arranged along the shape of the observation object through each of the above-mentioned steps are acquired. It is thus made possible to provide a sample observation method that is capable of selectively acquiring, with respect to observation objects of various shapes, an electron microscope image based on a field of view definition that is in accordance with the shape of the observation object, as well as an electron microscope apparatus that realizes such a sample observation method.
摘要翻译：本发明的样本观察方法包括相对于电子显微镜图像定义关于样本（3）的观察对象的轮廓或沿着轮廓的多个点的步骤，以及步骤沿着轮廓布置电子显微镜的多个视野，其中通过上述步骤沿着观察对象的形状定义和布置的多个视场的电子显微镜图像被获取。因此，能够提供一种能够根据与观察对象的形状相对应的视场定义，针对各种形状的观察对象选择性地获取电子显微镜图像的样本观察方法，以及实现这种样品观察方法的电子显微镜装置。

10. 发明授权

US09013572B2 Method for observing sample and electronic microscope 有权
标题翻译：观察样品和电子显微镜的方法
公开(公告)号：US09013572B2
公开(公告)日：2015-04-21
申请号：US13126638
申请日：2009-10-19
申请人： Akiko Fujisawa , Hiroyuki Kobayashi , Eiko Nakazawa
发明人： Akiko Fujisawa , Hiroyuki Kobayashi , Eiko Nakazawa
IPC分类号： G06K9/00 , H04N7/18 , H01J37/28 , H01J37/22
CPC分类号： G02B21/008 , H01J37/222 , H01J37/28 , H01J2237/221 , H01J2237/226
摘要： A sample observation method of the present invention comprises a step of defining, with respect to an electron microscope image, an outline of an observation object with respect to a sample (3), or a plurality of points located along the outline, and a step of arranging a plurality of fields of view for an electron microscope along the outline, wherein electron microscope images of the plurality of fields of view that have been defined and arranged along the shape of the observation object through each of the above-mentioned steps are acquired. It is thus made possible to provide a sample observation method that is capable of selectively acquiring, with respect to observation objects of various shapes, an electron microscope image based on a field of view definition that is in accordance with the shape of the observation object, as well as an electron microscope apparatus that realizes such a sample observation method.
摘要翻译：本发明的样本观察方法包括相对于电子显微镜图像定义关于样本（3）的观察对象的轮廓或沿着轮廓的多个点的步骤，以及步骤沿着轮廓布置电子显微镜的多个视野，其中通过上述步骤沿着观察对象的形状定义和布置的多个视场的电子显微镜图像被获取。因此，能够提供一种能够根据与观察对象的形状相对应的视场定义，针对各种形状的观察对象选择性地获取电子显微镜图像的样本观察方法，以及实现这种样品观察方法的电子显微镜装置。

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