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    • 1. 发明申请
    • METHODS, SYSTEMS, AND ARTICLES OF MANUFACTURE FOR CONSTRAINT VERIFICATION FOR IMPLEMENTING ELECTRONIC CIRCUIT DESIGNS WITH ELECTRICAL AWARENESS
    • 用于实现电子电路设计的电路认证的制造方法,系统和制造与电气意识
    • US20120023468A1
    • 2012-01-26
    • US12982732
    • 2010-12-30
    • Ed FISCHERMichael MCSHERRYDavid WHITEBruce YANAGIDAAkshat SHAH
    • Ed FISCHERMichael MCSHERRYDavid WHITEBruce YANAGIDAAkshat SHAH
    • G06F17/50
    • G06F17/5081G06F17/5068G06F17/5077
    • Disclosed are methods, systems, and articles of manufacture for constraint verification for implementing electronic circuit designs with electrical awareness. Some embodiments identify or set parasitic constraint(s) and compare the electrical parasitic(s) with corresponding parasitic constraint(s) to determine whether the parasitic constraints are met. Some embodiments first identify, determine, or update the physical data of a component of a partial layout and characterize the electrical parasitics associated with the physical data of the component. Some embodiments identify or determine some schematic level performance constraints and estimate parasitic constraints based on schematic simulation results and the performance constraints; the estimated parasitic constraints are then compared with the corresponding electrical parasitics to determine whether the constraints are satisfied. Some embodiments further map schematic level parasitic constraints to a physical design representation and then compares the mapped parasitic constraints with corresponding electrical constraints to determine whether the mapped constraints are met.
    • 公开了用于实现具有电气意识的电子电路设计的约束验证的方法,系统和制造。 一些实施例识别或设置寄生约束,并将电子寄生与相应的寄生约束进行比较,以确定是否满足寄生约束。 一些实施例首先识别,确定或更新部分布局的部件的物理数据,并表征与部件的物理数据相关联的电寄生效应。 一些实施例基于示意性模拟结果和性能约束来识别或确定一些示意图级性能约束并且估计寄生约束; 然后将估计的寄生约束与相应的电寄生效应进行比较,以确定是否满足约束。 一些实施例还将原理层级寄生约束映射到物理设计表示,然后将映射的寄生约束与对应的电限制进行比较,以确定是否满足映射的约束。