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    • 1. 发明申请
    • Thin film transistor array substrate
    • 薄膜晶体管阵列基板
    • US20070046336A1
    • 2007-03-01
    • US11479860
    • 2006-06-29
    • Dong KangSoung EomBong KimKi Yang
    • Dong KangSoung EomBong KimKi Yang
    • H03K19/00
    • G02F1/1345G02F1/13458G02F2001/136254G09G3/006G09G3/3648G09G2300/0426
    • A thin film transistor array substrate comprises thin film transistors and pixel electrodes formed at respective pixels that are defined by gate lines and data lines that orthogonally intersect each other. The thin film transistor array substrate further comprises a plurality of gate pad units that group a plurality of gate pads extended from the gate lines, and a plurality of data pad units that groups a plurality of data pads extended from the data lines. The thin film transistor array substrate further includes a plurality of gate test terminals connected to the gate pad units and beside at least one side of the respective gate pad units, and a plurality of data test terminals connected to the data pad units and located beside at least one side of the respective data pad units.
    • 薄膜晶体管阵列基板包括薄膜晶体管和形成在各个像素处的像素电极,栅极线和彼此正交相交的数据线限定。 薄膜晶体管阵列基板还包括对从栅极线延伸的多个栅极焊盘进行分组的多个栅极焊盘单元,以及对从数据线延伸的多个数据焊盘进行分组的多个数据焊盘单元。 所述薄膜晶体管阵列基板还包括多个栅极测试端子,所述多个栅极测试端子连接到所述栅极焊盘单元并且位于各个栅极焊盘单元的至少一侧旁边,以及多个数据测试端子,所述多个数据测试端子连接到所述数据焊盘单元并位于 相应数据垫单元的最少一侧。
    • 2. 发明申请
    • Method and apparatus for testing liquid crystal display
    • 液晶显示器测试方法及装置
    • US20070046320A1
    • 2007-03-01
    • US11443113
    • 2006-05-31
    • Dong KangSoung EomBong KimKi Yang
    • Dong KangSoung EomBong KimKi Yang
    • G01R31/00
    • G09G3/006G02F1/1309G09G3/3666G09G2300/0426
    • An LCD test method and apparatus for reducing the number of channels of a probe unit is provided. An apparatus for testing a liquid crystal display including: a stage on which a liquid crystal panel is placed; a plurality of vertically divided blocks, wherein each of the vertically divided blocks include a plurality of adjacent data lines; a data probe unit that provides test pattern signals respectively to groups of at least two of the plurality of vertically divided blocks of the liquid crystal panel; a plurality of horizontally divided blocks, wherein each of the horizontally divided blocks include a plurality of adjacent gate lines; a gate probe unit that provides scanning signals respectively to the plurality of horizontally divided blocks of the liquid crystal panel; and a controller that provides test pattern signals to the data probe unit and provides scanning signals to the gate probe unit.
    • 提供了用于减少探针单元的通道数量的LCD测试方法和设备。 一种用于测试液晶显示器的装置,包括:放置液晶面板的阶段; 多个垂直分割块,其中每个垂直分割块包括多个相邻的数据线; 数据探测单元,分别向液晶面板的多个垂直分割块中的至少两个的组提供测试图形信号; 多个水平分割块,其中每个水平分割块包括多个相邻的栅极线; 栅极探针单元,其分别向液晶面板的多个水平分割块提供扫描信号; 以及控制器,其向所述数据探测单元提供测试图案信号,并向所述门探针单元提供扫描信号。
    • 4. 发明申请
    • TFT array substrate for inspection and method for inspection using the same
    • 用于检查的TFT阵列基板及使用其的检查方法
    • US20070052896A1
    • 2007-03-08
    • US11449783
    • 2006-06-09
    • Soung EomDong KangBong KimKi Yang
    • Soung EomDong KangBong KimKi Yang
    • G02F1/1343
    • G02F1/136259G02F2203/69
    • A TFT substrate for inspection for shorts, includes a substrate defined by a display area and a non-display area outside the display area; a plurality of first and second lines formed in the display area on the substrate; pad lines formed to be extended from one side of each of the first lines to the non-display area; a plurality of signal inspection bars formed in the non-display area to cross the pad lines at one side of the pad lines; a shorting inspection bar spaced apart from the outermost signal inspection bar at a predetermined interval and substantially parallel with the signal inspection bar and connected to the pad lines; and a plurality of transparent electrode patterns partially overlapped with the pad lines and connected to one of the signal inspection bars.
    • 用于检查短路的TFT基板包括由显示区域和显示区域外部的非显示区域限定的基板; 形成在所述基板上的所述显示区域中的多个第一和第二线; 衬垫线形成为从每个第一行的一侧延伸到非显示区域; 形成在所述非显示区域中的多个信号检查条,以跨越所述焊盘线的一侧的所述焊盘线; 一个与最外面的信号检查条隔开预定间隔并基本上与信号检查条平行并连接到焊盘线的短路检查条; 以及多个透明电极图案,其与所述焊盘线部分地重叠并且连接到所述信号检查条之一。
    • 7. 发明申请
    • Apparatus and method for inspecting liquid crystal display
    • 液晶显示器检测装置及方法
    • US20070046318A1
    • 2007-03-01
    • US11442144
    • 2006-05-30
    • Dong KangSoung EomBong KimKi Yang
    • Dong KangSoung EomBong KimKi Yang
    • G01R31/00
    • G09G3/006G02F1/1303G02F1/1309G09G3/3406
    • The liquid crystal display (LCD) inspection apparatus for inspecting an LCD panel includes a worktable which supports the LCD panel to be seated on a front side of the worktable, probe units which are electrically connected to the LCD panel, a backlight unit which supplies light to the LCD panel, an imaging unit which photographs an image of the LCD panel supported by the worktable, a first polarizing plate which is arranged between the imaging unit and the LCD panel to polarize the light, a second polarizing plate which is arranged between the LCD panel and the backlight unit to polarize the light, an illumination unit which emits illumination light to surfaces of the LCD panel, and an image processor which receives the image photographed by the imaging unit, and extracts defect information from the received image.
    • 用于检查LCD面板的液晶显示(LCD)检查装置包括:工作台,其支撑待置于工作台前侧的LCD面板,电连接到LCD面板的探针单元;提供光 向所述LCD面板照射由所述工作台支撑的所述LCD面板的图像的摄像单元,配置在所述摄像单元与所述LCD面板之间以使所述光偏振的第一偏振板,配置在所述第一偏振板之间的第二偏振板 LCD面板和背光单元以使光偏振,向LCD面板的表面发射照明光的照明单元和接收由成像单元拍摄的图像的图像处理器,并从接收到的图像中提取缺陷信息。