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1. 发明申请

US20130088905A1 DEAD-TIME COMPENSATION ALGORITHM FOR 3-PHASE INVERTER USING SVPWM 审中-公开
标题翻译：使用SVPWM的三相逆变器的死时补偿算法
公开(公告)号：US20130088905A1
公开(公告)日：2013-04-11
申请号：US13295146
申请日：2011-11-14
申请人： Dong Hee LEE , Hong Min KIM
发明人： Dong Hee LEE , Hong Min KIM
IPC分类号： H02M7/537
CPC分类号： H02M7/53875 , H02M2001/385 , H02M2007/53876
摘要： Disclosed is a dead-time compensation method of a 3-phase inverter using an SVPWM scheme. The dead-time compensation method includes generating a switching signal having dead-time with respect to the power semiconductor switches of the upper and lower arms in order to obtain a predetermined output through the SVPWM scheme, detecting medium phase current from each phase current output through the switching signal, determining polarity of the medium phase current, and generating a switching signal by calculating switching time in order to compensate for time to apply effective voltage according to the polarity of the medium phase current. Through the dead-time compensation method, the distortion of the output voltage and the reduction of voltage having a fundamental wave in the output voltage, which are caused by the dead-time, are minimized through the switching of compensating for the time to apply effective voltage based on the polarity of the load current.
摘要翻译：公开了使用SVPWM方案的三相逆变器的死区补偿方法。死区补偿方法包括产生相对于上臂和下臂的功率半导体开关具有死区时间的切换信号，以便通过SVPWM方案获得预定的输出，从每个相电流输出通过切换信号，确定中间相电流的极性，并通过计算开关时间来产生开关信号，以便根据中间相电流的极性补偿施加有效电压的时间。通过死区补偿方法，由死区时间引起的输出电压的失真和输出电压中具有基波的电压的降低通过切换补偿施加时间来最小化基于负载电流的极性的电压。

2. 发明申请

US20100120182A1 MANUFACTURING METHOD OF LIGHT EMITTING DIODE PACKAGE 有权
标题翻译：发光二极管封装的制造方法
公开(公告)号：US20100120182A1
公开(公告)日：2010-05-13
申请号：US12618445
申请日：2009-11-13
申请人： Hong Min KIM
发明人： Hong Min KIM
IPC分类号： H01L21/56
CPC分类号： H01L33/486 , H01L33/46 , H01L33/62 , H01L2224/48091 , H01L2224/48247 , H01L2224/48257 , H01L2924/01046 , H01L2924/01078 , H01L2924/01079 , H01L2924/00014
摘要： The invention provides a side-view LED having an LED window opened to a side to emit light sideward. A pair of lead frames each act as a terminal. An LED chip is attached to a portion of the lead frame and electrically connected thereto. A package body houses the lead frames and has a concave formed around the LED chip. Also, a high reflective metal layer is formed integrally on a wall of the concave. A transparent encapsulant is filled in the concave to encapsulate the LED chip, while forming the LED window. In addition, an insulating layer is formed on a predetermined area of the lead frames so that the lead frames are insulated from the high reflective metal layer. The side-view LED of the invention enhances light efficiency and heat release efficiency with an improved side-wall reflection structure.
摘要翻译：本发明提供一种侧视LED，其具有向侧面开口的LED窗口，以向侧面发光。一对引线框架各自作为终端。 LED芯片附接到引线框架的一部分并与其电连接。封装体容纳引线框架，并且在LED芯片周围形成凹部。此外，高反射金属层一体地形成在凹面的壁上。在形成LED窗口的同时，在凹部中填充透明密封剂以封装LED芯片。此外，在引线框架的预定区域上形成绝缘层，使得引线框架与高反射金属层绝缘。本发明的侧视LED通过改进的侧壁反射结构提高了光效率和放热效率。

3. 发明申请

US20100246936A1 LED TESTING APPARATUS AND TESTING METHOD THEREOF 有权
标题翻译： LED测试装置及其测试方法
公开(公告)号：US20100246936A1
公开(公告)日：2010-09-30
申请号：US12630448
申请日：2009-12-03
申请人： Won Soo JI , Wook Hee LEE , Ho Young SONG , Chong Wook CHO , Sung Jae KIM , Young Su YUN , Hong Min KIM
发明人： Won Soo JI , Wook Hee LEE , Ho Young SONG , Chong Wook CHO , Sung Jae KIM , Young Su YUN , Hong Min KIM
IPC分类号： G06K9/00
CPC分类号： G06K9/2018 , G01R31/2635 , G01R31/2656 , G06T7/0004 , G06T2207/30148
摘要： There is provided an LED testing apparatus. An LED testing apparatus according to an aspect of the invention may include: a first lighting unit generating first light and irradiating the first light onto an LED having an encapsulant including a fluorescent material excited by the first light to emit light having a longer wavelength than the first light; a second lighting unit generating second light having a longer wavelength than the first light to irradiate the second light onto the LED; an image acquisition unit receiving the light emitted from the fluorescent material and the second light reflected off the LED to acquire images of the LED; and an LED state determination unit determining whether the LED is acceptable or defective using the images of the LED acquired by the image acquisition unit.There is further provided an LED testing method using the LED testing apparatus.
摘要翻译：提供了LED测试装置。根据本发明的一个LED测试装置可以包括：第一照明单元，其产生第一光并将第一光照射到具有包含由第一光激发的荧光材料的密封剂的LED上，以发射具有比第第一光; 第二照明单元产生具有比第一光更长的波长的第二光，以将第二光照射到LED上; 接收从荧光材料发射的光和从LED反射的第二光的图像获取单元，以获取LED的图像; 以及LED状态确定单元，使用由图像获取单元获取的LED的图像确定LED是否可接受或有缺陷。还提供了使用LED测试装置的LED测试方法。

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