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1. 发明申请

WO2010088077A1 FLAT PLUNGER ROUND BARREL TEST PROBE 审中-公开
标题翻译：平底锅圆环测试探头
公开(公告)号：WO2010088077A1
公开(公告)日：2010-08-05
申请号：PCT/US2010/021252
申请日：2010-01-15
申请人： DELAWARE CAPITAL FORMATION, INC. , SWART, Mark, A. , SARGEANT, Steve, B. , JOHNSTON, Charles, J.
发明人： SWART, Mark, A. , SARGEANT, Steve, B. , JOHNSTON, Charles, J.
IPC分类号： G01R31/06
CPC分类号： G01R1/06722 , G01R1/06738
摘要： A spring probe utilizing a flat plunger and a round barrel having a compression spring positioned within the barrel and a wiper for internal contact between the plunger and the inside of the barrel.
摘要翻译：使用扁平柱塞的弹簧探针和具有位于筒内的压缩弹簧的圆筒和用于柱塞与筒体内部之间内部接触的擦拭器。

2. 发明申请

WO2009039205A1 SPRING CONTACT ASSEMBY 审中-公开
标题翻译：弹簧接触组件
公开(公告)号：WO2009039205A1
公开(公告)日：2009-03-26
申请号：PCT/US2008/076720
申请日：2008-09-17
申请人： DELAWARE CAPITAL FORMATION, INC. , JOHNSTON, Charles, J. , CHABINEAU, Scott , TREIBERGS, Valts , YAKUSHEV, Sergey , SWART, Mark , KOTTMEYER, Edward, A.
发明人： JOHNSTON, Charles, J. , CHABINEAU, Scott , TREIBERGS, Valts , YAKUSHEV, Sergey , SWART, Mark , KOTTMEYER, Edward, A.
IPC分类号： H01R43/00
CPC分类号： H01R13/2421 , G01R1/06722 , H01R12/714 , Y10S439/908
摘要： A spring contact assembly having a first plunger with a tail portion having a flat contact surface and a second plunger having a tail portion with a flat contact surface wherein the flat contact surfaces are overlapping and are surrounded by an external compression spring such that the sliding engagement of the flat surfaces increases during compression of the spring.
摘要翻译：弹簧接触组件，其具有第一柱塞，其具有带有平坦接触表面的尾部的第一柱塞和具有平坦接触表面的尾部的第二柱塞，其中平坦接触表面重叠并被外部压缩弹簧包围，使得滑动接合在压缩弹簧期间平坦表面增加。

3. 发明申请

WO2003031995A1 COAXIAL TILT PIN FIXTURE FOR TESTING HIGH FREQUENCY CIRCUIT BOARDS 审中-公开
标题翻译：用于测试高频电路板的同轴倾斜引脚固定
公开(公告)号：WO2003031995A1
公开(公告)日：2003-04-17
申请号：PCT/US2001/031500
申请日：2001-10-10
申请人： DELAWARE CAPITAL FORMATION, INC. , JOHNSTON, Charles, J.
发明人： JOHNSTON, Charles, J.
IPC分类号： G01R1/067
CPC分类号： G01R1/07328 , G01R1/06772 , G01R1/07357 , G01R1/07378
摘要： A translator fixture for use in testing high frequency or high speed digital circuit boards. The fixture has a pin supporting top plate (29) and base plate (32) and coaxial constant impedance test pins (23) incorporated into the fixture to provide a signal path from a test analyzer to the circuit board (16) under test. The board under test is coupled to an upper surface of the top plate. The impedance of the coaxial pins is matched to the impedance of the board under test as well as the impedance of the test analyzer. Force exerted on the coaxial pins ensures contact of the pins with test points on the circuit board under test. The force may be exerted by spring loaded probes (12) mounted on a compliant test interface (10) below the base plate. The force may also be exerted by Euler buckling the pins by relative movement between the circuit board under test and a second circuit board coupled to the base plate or to the test analyzer.
摘要翻译：用于测试高频或高速数字电路板的翻译夹具。固定装置具有支撑顶板（29）和底板（32）的引脚支撑和并入固定装置中的同轴恒定阻抗测试引脚（23），以提供从测试分析仪到被测电路板（16）的信号路径。被测板被耦合到顶板的上表面。同轴引脚的阻抗与被测试板的阻抗以及测试分析仪的阻抗相匹配。施加在同轴引脚上的力确保了引脚与被测电路板上的测试点的接触。力可以由安装在基板下方的柔性测试界面（10）上的弹簧加载的探针（12）施加。欧拉也可以通过在被测电路板和连接到基板或测试分析器的第二电路板之间的相对运动来屈曲引脚。

4. 发明公开

EP2384443A1 FLAT PLUNGER ROUND BARREL TEST PROBE 审中-公开
标题翻译：带扁平臀部和圆柱体探头
公开(公告)号：EP2384443A1
公开(公告)日：2011-11-09
申请号：EP10736210.5
申请日：2010-01-15
申请人： Delaware Capital Formation, Inc.
发明人： SWART, Mark, A. , SARGEANT, Steve, B. , JOHNSTON, Charles, J.
IPC分类号： G01R31/06
CPC分类号： G01R1/06722 , G01R1/06738
摘要： A spring probe utilizing a flat plunger and a round barrel having a compression spring positioned within the barrel and a wiper for internal contact between the plunger and the inside of the barrel.

5. 发明公开

EP2191544A1 SPRING CONTACT ASSEMBY 失效转让
标题翻译：弹簧触头组件
公开(公告)号：EP2191544A1
公开(公告)日：2010-06-02
申请号：EP08831781.3
申请日：2008-09-17
申请人： Delaware Capital Formation, Inc.
发明人： JOHNSTON, Charles, J. , CHABINEAU, Scott , TREIBERGS, Valts , YAKUSHEV, Sergey , SWART, Mark , KOTTMEYER, Edward, A.
IPC分类号： H01R43/00
CPC分类号： H01R13/2421 , G01R1/06722 , H01R12/714 , Y10S439/908
摘要： A spring contact assembly having a first plunger with a tail portion having a flat contact surface and a second plunger having a tail portion with a flat contact surface wherein the flat contact surfaces are overlapping and are surrounded by an external compression spring such that the sliding engagement of the flat surfaces increases during compression of the spring.

6. 发明公开

EP1438591A1 COAXIAL TILT PIN FIXTURE FOR TESTING HIGH FREQUENCY CIRCUIT BOARDS 审中-公开
标题翻译：倾斜同轴引脚测试高频电路板等
公开(公告)号：EP1438591A1
公开(公告)日：2004-07-21
申请号：EP01977631.9
申请日：2001-10-10
申请人： Delaware Capital Formation, Inc.
发明人： JOHNSTON, Charles, J.
IPC分类号： G01R1/067
CPC分类号： G01R1/07328 , G01R1/06772 , G01R1/07357 , G01R1/07378
摘要： A translator fixture for use in testing high frequency or high speed digital circuit boards. The fixture has a pin supporting top plate (29) and base plate (32) and coaxial constant impedance test pins (23) incorporated into the fixture to provide a signal path from a test analyzer to the circuit board (16) under test. The board under test is coupled to an upper surface of the top plate. The impedance of the coaxial pins is matched to the impedance of the board under test as well as the impedance of the test analyzer. Force exerted on the coaxial pins ensures contact of the pins with test points on the circuit board under test. The force may be exerted by spring loaded probes (12) mounted on a compliant test interface (10) below the base plate. The force may also be exerted by Euler buckling the pins by relative movement between the circuit board under test and a second circuit board coupled to the base plate or to the test analyzer.

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