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    • 1. 发明授权
    • System and method for providing program credentials
    • 用于提供程序凭据的系统和方法
    • US07890643B2
    • 2011-02-15
    • US12163881
    • 2008-06-27
    • Dean Jason JustusJosh D. BenalohNathan James FinkMichael HowardDaniel R. SimonMatthew W. Thomlinson
    • Dean Jason JustusJosh D. BenalohNathan James FinkMichael HowardDaniel R. SimonMatthew W. Thomlinson
    • G06F15/173
    • H04L63/0815
    • A system for providing a client's credentials to a computer program comprises a database remote from the client and a single signon server module. The single signon server module can receive a request for the client's credentials from the computer program, determine whether the client's credentials are stored in the database, and send the client's credentials from the database to the computer program in response to a determination that the client's credentials are stored in the database. The single signon server module can store the client's credentials in the database in response to a determination that the client's credentials are not stored in the database. The single signon server module can encrypt the client's credentials prior to storing the client's credentials in the database and can decrypt the client's credentials prior to sending the client's credentials to the computer program.
    • 用于向计算机程序提供客户端凭据的系统包括远离客户端的数据库和单个登录服务器模块。 单一登录服务器模块可以从计算机程序接收对客户端凭据的请求,确定客户端的凭据是否存储在数据库中,并且响应于确定客户端的凭据将客户端的凭据从数据库发送到计算机程序 存储在数据库中。 响应于确定客户端的凭据未存储在数据库中,单一登录服务器模块可以将客户端凭据存储在数据库中。 单一登录服务器模块可以在将客户端凭据存储在数据库中之前加密客户端的凭据,并且可以在将客户端的凭据发送到计算机程序之前解密客户端的凭据。
    • 4. 发明授权
    • Transition delay test function logic
    • 转换延迟测试功能逻辑
    • US08356221B2
    • 2013-01-15
    • US12861991
    • 2010-08-24
    • Mark T. KuoMichael HowardDaniel C. Murray
    • Mark T. KuoMichael HowardDaniel C. Murray
    • G01R31/28
    • G01R31/31858G01R31/318544G11C29/32
    • A method and apparatus for conducting transition testing using scan elements are disclosed. In one embodiment, an integrated circuit (IC) includes a scan chain having first and second subsets of scannable flops, the first subset having respective data inputs coupled to a memory array. The scannable flops of the second subset may each have a respective data input coupled to circuitry other than the memory array (e.g., to a logic circuit). The scannable flops of the first subset may be enabled for scan shifting during a transition test mode. The scannable flops of the second subset are inhibited from scanning during the transition test mode. The transition test mode may include at least two functional clock cycles in which the scannable flops of the first subset provide complementary first and second logic values to logic circuits coupled to respective data outputs.
    • 公开了一种使用扫描元件进行转换测试的方法和装置。 在一个实施例中,集成电路(IC)包括具有可扫描触发器的第一和第二子集的扫描链,第一子集具有耦合到存储器阵列的相应数据输入。 第二子集的可扫描触发器可以各自具有耦合到除了​​存储器阵列之外的电路(例如,到逻辑电路)的相应数据输入。 在转换测试模式期间,可以启用第一子集的可扫描的触发器用于扫描移位。 在转换测试模式期间禁止第二子集的可扫描触发器扫描。 转换测试模式可以包括至少两个功能时钟周期,其中第一子集的可扫描触发器为耦合到相应数据输出的逻辑电路提供互补的第一和第二逻辑值。