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    • 1. 发明授权
    • Thermal sensing method and apparatus using existing ESD devices
    • 使用现有ESD器件的热感测方法和设备
    • US07519498B2
    • 2009-04-14
    • US11242675
    • 2005-10-04
    • David W. BoerstlerEskinder HailuKazuhiko MikiJieming Qi
    • David W. BoerstlerEskinder HailuKazuhiko MikiJieming Qi
    • G06F3/00
    • G01K7/01G01K2217/00
    • The present invention provides a method, an apparatus, and a computer program product for measuring the temperature of a microprocessor through the use of ESD circuitry. The present invention uses diodes and an I/O pad within ESD circuits to determine the temperature at the location of the ESD circuitry. First, a current measuring device connects to a diode. A user or a computer program disables the protected component or circuitry, and subsequently applies a predetermined voltage to the I/O pad. This creates a reverse saturation current through the diode, which is measured by the current measuring device. From this current the user or a computer program determines the temperature of the microprocessor at the diode through the use of a graphical representation of diode reverse saturation current and corresponding temperature.
    • 本发明提供了一种通过使用ESD电路来测量微处理器的温度的方法,装置和计算机程序产品。 本发明在ESD电路中使用二极管和I / O焊盘来确定ESD电路位置处的温度。 首先,电流测量装置连接到二极管。 用户或计算机程序禁用受保护的组件或电路,然后将预定电压施加到I / O焊盘。 这通过二极管产生反向饱和电流,由电流测量装置测量。 从该电流,用户或计算机程序通过使用二极管反向饱和电流和相应温度的图形表示来确定微处理器在二极管处的温度。
    • 2. 发明授权
    • Level shifter apparatus and method for minimizing duty cycle distortion
    • 用于最小化占空比失真的电平移位器装置和方法
    • US07245172B2
    • 2007-07-17
    • US11269245
    • 2005-11-08
    • David W. BoerstlerEskinder HailuKazuhiko MikiJieming Qi
    • David W. BoerstlerEskinder HailuKazuhiko MikiJieming Qi
    • H03L5/00
    • H03K19/018521
    • A level shifter apparatus and method for minimizing duty cycle distortion are provided. The level shifter includes a bank of comparators each having an associated threshold built into it. The comparators compare a difference in source voltages for two power domains to these built-in thresholds and output a signal indicative of whether the threshold is exceeded. The output signals from the comparators are provided to a thermometric decoder which generates control signals based on these output signals. The control signals are used to control stages in a level shifter for modifying the voltage output of the level shifter. Individual stages may be enabled to thereby monotonically modify the voltage output of the level shifter and thereby decrease a time required to achieve a voltage having a level that causes a state change in a driven circuit. As a result, duty cycle distortion is minimized and maximum operational frequency is increased.
    • 提供了一种用于最小化占空比失真的电平移位器装置和方法。 电平移位器包括一组比较器,每个比较器具有内置在其中的相关联的阈值。 比较器将两个功率域的源电压差与这些内置阈值进行比较,并输出一个指示阈值是否超过的信号。 来自比较器的输出信号被提供给基于这些输出信号产生控制信号的温度测量解码器。 控制信号用于控制电平移位器中用于修改电平移位器的电压输出的级。 单个级可以被使能,从而单调地修改电平转换器的电压输出,从而减少实现具有使驱动电路中的状态变化的电平的电压所需的时间。 结果,占空比失真被最小化并且最大的操作频率增加。
    • 4. 发明授权
    • Structure for interleaved voltage controlled oscillator
    • 交错压控振荡器的结构
    • US08037431B2
    • 2011-10-11
    • US12126076
    • 2008-05-23
    • David W. BoerstlerEskinder HailuJieming QiMike Shen
    • David W. BoerstlerEskinder HailuJieming QiMike Shen
    • G06F17/50H03K3/03
    • H03L7/0995H03K3/0315H03K5/133
    • A design structure embodied in a machine readable medium used in a design process includes an interleaved voltage-controlled oscillator, including a ring circuit of main logic inverter gates; a plurality of delay elements connected in parallel with a selected sequence of the main logic inverter gates; wherein each delay element comprises a feedforward section, comprising controls for regulating signal transmission through feedforward elements responsive to one or more control voltages; and a proportional section for regulating signal transmission through at least one logic inverter gate; at least one temperature compensation circuit responsive to a compensating voltage input that is proportional to temperature; an electronic circuit in communication with the temperature compensation circuit and configured to provide a voltage signal responsive to temperature; an amplifier in connection with the electronic circuit to amplify the voltage signal; and a DC offset generator configured to adjust the voltage of the amplified voltage signal.
    • 体现在设计过程中使用的机器可读介质中的设计结构包括交错压控振荡器,包括主逻辑逆变器门的环形电路; 多个延迟元件,与所述主逻辑反相器门的选定序列并联连接; 其中每个延迟元件包括前馈部分,其包括用于响应于一个或多个控制电压来调节通过前馈元件的信号传输的控制; 以及用于调节通过至少一个逻辑反相器门的信号传输的比例部分; 响应于与温度成比例的补偿电压输入的至少一个温度补偿电路; 与所述温度补偿电路通信并且被配置为提供响应于温度的电压信号的电子电路; 与电子电路相连的放大器,用于放大电压信号; 以及配置成调整放大的电压信号的电压的DC偏移发生器。
    • 6. 发明授权
    • Systems and methods for level shifting using AC coupling
    • 使用交流耦合进行电平转换的系统和方法
    • US07511554B2
    • 2009-03-31
    • US11764262
    • 2007-06-18
    • Masaaki KanekoDavid W. BoerstlerEskinder HailuJieming Qi
    • Masaaki KanekoDavid W. BoerstlerEskinder HailuJieming Qi
    • H03L5/00
    • H03K19/01812H03K19/01831
    • Systems and methods for conveying signals between integrated circuit (IC) components in domains having different supply voltages. AC coupling is used to increase the speed at which the common mode voltage of a signal is shifted from one level to another. One embodiment comprises a method for level shifting a binary signal in an IC. This method includes receiving an input binary signal and decoupling its AC component from its common mode component. A second common mode component is added to the AC component, providing a binary output signal. The common mode voltage of the input signal may be greater (or smaller) than that of the output signal. In one embodiment of the method, duty cycle compensation (DCC) is performed. The DCC drives the duty cycle toward a desired value.
    • 在具有不同电源电压的域中的集成电路(IC)组件之间传送信号的系统和方法。 AC耦合用于增加信号的共模电压从一个电平转移到另一个电平的速度。 一个实施例包括用于电平移位IC中的二进制信号的方法。 该方法包括接收输入二进制信号并将其AC分量与其共模分量去耦。 第二共模分量被添加到AC分量,提供二进制输出信号。 输入信号的共模电压可以大于(或更小)输出信号的共模电压。 在该方法的一个实施例中,执行占空比补偿(DCC)。 DCC将占空比驱动到所需的值。
    • 9. 发明申请
    • Duty Cycle Correction Circuit Whose Operation is Largely Independent of Operating Voltage and Process
    • 占空比校正电路,其操作与工作电压和工艺大不相同
    • US20080246524A1
    • 2008-10-09
    • US12140335
    • 2008-06-17
    • David W. BoerstlerEskinder HailuJieming Qi
    • David W. BoerstlerEskinder HailuJieming Qi
    • H03K3/017
    • H03K5/1565
    • A Duty Cycle Correction (DCC) circuit is provide in which pairs of field effect transistors (FETs) in known DCC circuit topologies are replaced with linear resistors coupled to switches of the DCC circuit such that when the switch is open, the input signal is routed through the linear resistors. The linear resistors are more tolerant of process, voltage and temperature (PVT) fluctuations than FETs and thus, the resulting DCC circuit provides a relatively smaller change in DCC correction range with PVT fluctuations than the known DCC circuit topology that employs FETs. The linear resistors may be provided in parallel with the switches and in series with a pair of FETs having relatively large resistance values. The linear resistors provide resistance that pulls-up or pulls-down the pulse width of the input signal so as to provide correction to the duty cycle of the input signal.
    • 提供了一种占空比校正(DCC)电路,其中已知DCC电路拓扑中的成对的场效应晶体管(FET)被连接到DCC电路的开关的线性电阻器代替,使得当开关断开时,输入信号被路由 通过线性电阻。 线性电阻器比FET更容忍工艺,电压和温度(PVT)波动,因此,所得到的DCC电路与使用FET的已知DCC电路拓扑结构相比,具有PVT波动的DCC校正范围相对较小的变化。 线性电阻器可以与开关并联设置并且与具有相对较大电阻值的一对FET串联。 线性电阻器提供上拉或下拉输入信号的脉冲宽度的电阻,以便对输入信号的占空比提供校正。
    • 10. 发明授权
    • Apparatus and method for automatically self-calibrating a duty cycle circuit for maximum chip performance
    • 用于自动自校准占空比电路以实现最大芯片性能的装置和方法
    • US07322001B2
    • 2008-01-22
    • US11242677
    • 2005-10-04
    • David W. BoerstlerEskinder HailuJieming Qi
    • David W. BoerstlerEskinder HailuJieming Qi
    • G01R31/28H03K3/017
    • H03K5/1565G01R31/31727G01R31/3187
    • An apparatus and method for automatically calibrating a duty cycle circuit for maximum performance. A chip level built-in circuit automatically calibrates the duty cycle correction (DCC) circuit setting for each chip. The chip level built-in circuit includes a clock generation macro unit, a simple duty cycle correction (DCC) circuit, an array slice and built-in self test unit, and a DCC circuit controller. A built-in self-test provides results, i.e. pass or fail, of an array to the DCC circuit controller. If the result of the built-in self test is a pass, then the current DCC circuit controller's DCC control bit setting is set as the setting for the chip. If the result from the built-in self test is a fail, the DCC circuit controller's DCC control bits setting is incremented to a next setting and the self-test is performed again.
    • 一种用于自动校准占空比电路以实现最大性能的装置和方法。 芯片级内置电路自动校准每个芯片的占空比校正(DCC)电路设置。 芯片级内置电路包括时钟生成宏单元,简单占空比校正(DCC)电路,阵列片和内置自检单元以及DCC电路控制器。 内置的自检向DCC电路控制器提供阵列的结果,即通过或失败。 如果内置自检的结果是通过,则将当前DCC电路控制器的DCC控制位设置设置为芯片的设置。 如果内置自检的结果为失败,DCC电路控制器的DCC控制位设置将增加到下一个设置,并再次执行自检。