会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 5. 发明授权
    • Method to form self-aligned gate structures and focus rings
    • 形成自对准栅极结构和聚焦环的方法
    • US5259799A
    • 1993-11-09
    • US977477
    • 1992-11-17
    • Trung T. DoanTyler A. LowreyDavid A. CatheyJ. Brett Rolfson
    • Trung T. DoanTyler A. LowreyDavid A. CatheyJ. Brett Rolfson
    • H01J9/02H01J9/04
    • H01J9/025H01J2209/0226H01J2329/00
    • A selective etching and chemical mechanical planarization process for the formation of self-aligned gate and focus ring structures surrounding an electron emission tip for use in field emission displays in which the emission tip is i) optionally sharpened through oxidation, ii) deposited with a first conformal layer, iii) deposited with a conductive material layer, iv) deposited with a second conformal insulating layer, v) deposited with a focus electrode ring material layer, vi) optionally deposited with a buffering material, vii) planarized with a chemical mechanical planarization (CMP) step, to expose a portion of the second conformal layer, viii) etched to form a self-aligned gate and focus ring, and thereby expose the emitter tip, afterwhich xi) the emitter tip may be coated with a low work function material.
    • 用于形成围绕用于场发射显示器中的电子发射尖端的自对准栅极和聚焦环结构的选择性蚀刻和化学机械平面化工艺,其中发射尖端i)可选地通过氧化锐化,ii)沉积有第一 保留层,iii)沉积有导电材料层,iv)沉积有第二共形绝缘层,v)沉积有焦点电极环材料层,vi)任选地沉积有缓冲材料,vii)用化学机械平面化 (CMP)步骤,以暴露第二共形层的一部分,viii)蚀刻以形成自对准栅极和聚焦环,从而暴露发射极尖端,之后xi)发射极尖端可以被涂覆有低功函数 材料。