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    • 7. 发明授权
    • Method and apparatus for elastic shorts testing, a hardware-assisted wire test mechanism
    • 弹性短裤测试方法和装置,硬件辅助线测试机构
    • US06711706B2
    • 2004-03-23
    • US09746610
    • 2000-12-20
    • Steven Michael DouskeyFrank David FerraioloMichael Stephen Floyd
    • Steven Michael DouskeyFrank David FerraioloMichael Stephen Floyd
    • G01R3128
    • G06F11/24G01R31/2812
    • A method, program and system for electrical shorts testing are provided. The invention comprises setting any chips to be tested to drive 0's on their drive interfaces, and setting all receive interfaces on the chips to receive 0's and log any failures. Next a single receive interface is selected for testing. A hardware shift register is associated with each drive side interface, wherein each bit of the register is connected to an off-chip driver on the interface. This hardware shift register for the selected interface is then set to all 0's, and the first bit of the shift register is loaded to a 1. The invention then performs a pause count. After this count, the 1 is shifted to the next bit in the register and another pause count is performed. This process is repeated until the 1 is walked completely through the register and all pins on the interface have been tested. The walking 1 test is then repeated for any additional interfaces that require testing. Any nets not controlled by the new Electrical Shorts Test (EST) should ideally be set to drive 1 during this walking 1 test. In addition, an inverted shorts test can be performed in which the 1 and 0 values are reversed and a walking 0 test is performed through the register, thus allowing the interfaces to be tested at both polarities. Nets not controlled by the new EST should be driven to 0 during the Inverted test.
    • 提供了一种用于电气短路测试的方法,程序和系统。 本发明包括设置要测试的任何芯片在其驱动器接口上驱动0,并且设置芯片上的所有接收接口以接收0并记录任何故障。 接下来,选择单个接收界面进行测试。 硬件移位寄存器与每个驱动器侧接口相关联,其中寄存器的每个位都连接到接口上的片外驱动器。 然后将所选接口的该硬件移位寄存器设置为全0,并且移位寄存器的第一位被加载到1.本发明然后执行暂停计数。 在该计数之后,1被移位到寄存器中的下一个位,并执行另一个暂停计数。 重复此过程,直到1完全通过寄存器,并且接口上的所有引脚都已经过测试。 然后对需要测试的任何其他接口重复步行1测试。 理想情况下,任何不受新电气短裤测试(EST)控制的网络在此步行1测试期间应设置为驱动1。 此外,可以执行反转短路测试,其中1和0值相反,并且通过寄存器执行步行0测试,从而允许在两个极性下测试接口。 反向测试期间,由新的EST控制的网络应该被驱动为0。
    • 10. 发明授权
    • Method and system for data transfer
    • 数据传输方法和系统
    • US06442223B1
    • 2002-08-27
    • US09299716
    • 1999-04-26
    • Daniel Mark DrepsFrank David FerraioloKevin Charles GowerToru KobayashiBradley David McCredieHideo Sawamoto
    • Daniel Mark DrepsFrank David FerraioloKevin Charles GowerToru KobayashiBradley David McCredieHideo Sawamoto
    • H04L700
    • H04L25/05H04L7/0012H04L7/02H04L7/046
    • A method and system for increasing speeds of transferring data in a data transfer system which includes a data source and data sink. Both the data source and data sink include clocks which are synchronized to a common clock frequency. A buffer is provided at the data sink and this buffer is utilized to received data from the data source. A control circuit is provided at the data sink and this control circuit receives a bus clock signal from the data source. An N segment dynamic shift register is provided within the data sink which includes at least two segments. A selectable shift control is provided for passing the data through an M segment subset of the N segment shift register, where M is less than N. Additionally, the length of the M segment subset is determined by the phase of a clock within the data sink at the time which the bus clock signal from the data source is received at the data sink. By selectively passing the data through an M segment subset of the N segment shift register, the data is accessible at the data sink at a controllable predetermined time.
    • 一种用于在包括数据源和数据宿的数据传输系统中提高传输数据速度的方法和系统。 数据源和数据宿均包含与公共时钟频率同步的时钟。 在数据接收器处提供缓冲器,并且该缓冲器用于从数据源接收数据。 在数据宿提供控制电路,该控制电路从数据源接收总线时钟信号。 N段动态移位寄存器提供在数据宿内,其包括至少两个段。 提供了可选择的移位控制,用于使数据通过N段移位寄存器的M段子集,其中M小于N.另外,M段子集的长度由数据宿内的时钟的相位确定 在数据接收器处接收到来自数据源的总线时钟信号的时间。 通过选择性地将数据通过N段移位寄存器的M段子集,可以在可控的预定时间在数据宿处访问数据。