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1. 发明申请

US20100080356A1 CHARGED PARTICLE BEAM DECELERATING DEVICE AND METHOD, AND X-RAY GENERATING APPARATUS USING THE SAME 有权
标题翻译：充电颗粒光束衰减装置和方法，以及使用其的X射线发生装置
公开(公告)号：US20100080356A1
公开(公告)日：2010-04-01
申请号：US12528386
申请日：2008-03-18
申请人： Daisuke Ishida , Hiroyuki Nose , Namio Kaneko , Yasuo Sakai , Masashi Yamamoto , Mitsuru Uesaka , Katsuhiro Dobashi , Fumito Sakamoto
发明人： Daisuke Ishida , Hiroyuki Nose , Namio Kaneko , Yasuo Sakai , Masashi Yamamoto , Mitsuru Uesaka , Katsuhiro Dobashi , Fumito Sakamoto
IPC分类号： H05H7/00 , H01J35/00
CPC分类号： H05H7/12 , G21K1/087 , H05G2/00 , H05H15/00
摘要： A charged particle beam decelerating device includes a high-frequency cavity 34 provided on an orbit of a charged particle beam 1, and a phase synchronizing device 40 for synchronizing the charged particle beam 1 in the high-frequency cavity with a phase of a high-frequency electric field 4. By moving the high-frequency cavity 34 or changing an orbit length of the charged particle beam 1, the charged particle beam in the high-frequency cavity is synchronized with a phase of the high-frequency electric field 4.
摘要翻译：带电粒子束减速装置包括设置在带电粒子束1的轨道上的高频腔体34和用于使高频腔体中的带电粒子束1与高频腔体的相位同步的相位同步装置40，通过移动高频腔34或改变带电粒子束1的轨道长度，高频腔中的带电粒子束与高频电场4的相位同步。

2. 发明授权

US08138678B2 Charged particle beam decelerating device and method, and X-ray generating apparatus using the same 有权
标题翻译：带电粒子束减速装置和方法，以及使用其的X射线产生装置
公开(公告)号：US08138678B2
公开(公告)日：2012-03-20
申请号：US12528386
申请日：2008-03-18
申请人： Daisuke Ishida , Hiroyuki Nose , Namio Kaneko , Yasuo Sakai , Masashi Yamamoto , Mitsuru Uesaka , Katsuhiro Dobashi , Fumito Sakamoto
发明人： Daisuke Ishida , Hiroyuki Nose , Namio Kaneko , Yasuo Sakai , Masashi Yamamoto , Mitsuru Uesaka , Katsuhiro Dobashi , Fumito Sakamoto
IPC分类号： H01J35/00 , H01J49/20 , H01J49/44 , H05H7/08
CPC分类号： H05H7/12 , G21K1/087 , H05G2/00 , H05H15/00
摘要： A charged particle beam decelerating device includes a high-frequency cavity 34 provided on an orbit of a charged particle beam 1, and a phase synchronizing device 40 for synchronizing the charged particle beam 1 in the high-frequency cavity with a phase of a high-frequency electric field 4. By moving the high-frequency cavity 34 or changing an orbit length of the charged particle beam 1, the charged particle beam in the high-frequency cavity is synchronized with a phase of the high-frequency electric field 4.
摘要翻译：带电粒子束减速装置包括设置在带电粒子束1的轨道上的高频腔体34和用于使高频腔体中的带电粒子束1与高频腔体的相位同步的相位同步装置40，通过移动高频腔34或改变带电粒子束1的轨道长度，高频腔中的带电粒子束与高频电场4的相位同步。

3. 发明申请

US20110007875A1 DEVICE AND METHOD FOR ADJUSTING COLLISION TIMING BETWEEN ELECTRON BEAM AND LASER LIGHT 有权
标题翻译：用于调整电子束和激光之间的碰撞时间的装置和方法
公开(公告)号：US20110007875A1
公开(公告)日：2011-01-13
申请号：US12667367
申请日：2008-07-01
申请人： Hiroyuki Nose , Daisuke Ishida , Namio Kaneko , Yasuo Sakai , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
发明人： Hiroyuki Nose , Daisuke Ishida , Namio Kaneko , Yasuo Sakai , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
IPC分类号： H05G1/52 , H01J35/00
CPC分类号： H05G2/00
摘要： An electron beam detection device (34) is arranged on an electron beam passing path so that a beam delay time tB from a passing moment of an electron beam (1) to a moment when the beam reaches a predicted collision point (9a) is longer than a laser delay time tL from a moment when a command for generating laser light (3) is issued to the moment when the laser light reaches the predicted collision point (9a) by at least a predetermined delay time Δt. The device (34) may detect passing therethrough without affecting the electron beam and output a laser light generation command from a laser light command delay circuit (36) when the predetermined delay time Δt (=tB−tL) has elapsed after the detection.
摘要翻译：电子束检测装置（34）被布置在电子束通过路径上，使得从电子束（1）的通过时刻到光束到达预测碰撞点（9a）的时刻的光束延迟时间tB较长比从激光发光指令（3）发出激光到达预测的碰撞点（9a）至少一个预定的延迟时间＆Dgr; t的时刻的激光延迟时间tL为止。当检测到预定的延迟时间＆Dgr; t（= tB-tL）时，器件（34）可以检测通过其中而不影响电子束并从激光指令延迟电路（36）输出激光生成命令。

4. 发明授权

US08102968B2 High brightness X-ray generating device and method 有权
标题翻译：高亮度X射线发生装置及方法
公开(公告)号：US08102968B2
公开(公告)日：2012-01-24
申请号：US12667509
申请日：2008-07-01
申请人： Hiroyuki Nose , Daisuke Ishida , Namio Kaneko , Yasuo Sakai , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
发明人： Hiroyuki Nose , Daisuke Ishida , Namio Kaneko , Yasuo Sakai , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
IPC分类号： H05G2/00
CPC分类号： H05G2/00
摘要： A high brightness X-ray generator and a high brightness X-ray generating method are provided which are able to promote an increase in X-ray brightness (i.e., an increase in an X-ray output) while suppressing an excessive increase in the cost of optical elements such as a laser unit, a mirror, and a lens. A high brightness X-ray generator generates an X-ray by inverse Compton scattering by colliding an electron beam with pulse laser light. There are provided a plurality of pulse laser units (32A, 32B) which emits a plurality of pulse laser lights (3a, 3b ) in predetermined periods, an optical-path matching unit (34) which matches optical paths of the plurality of pulse laser lights, and a timing control unit (40) which controls timings of the optical-path matching unit and the pulse laser units, wherein the plurality of pulse laser lights is emitted from the same optical path at different timings.
摘要翻译：提供一种高亮度X射线发生器和高亮度X射线产生方法，其能够在抑制成本的过度增加的同时促进X射线亮度的增加（即，X射线输出的增加）诸如激光单元，反射镜和透镜的光学元件。高亮度X射线发生器通过使电子束与脉冲激光相撞而通过反Compton散射产生X射线。提供了多个以预定周期发射多个脉冲激光（3a，3b）的脉冲激光器单元（32A，32B），与多个脉冲激光器的光路相匹配的光路匹配单元（34）灯和定时控制单元（40），其控制光路匹配单元和脉冲激光单元的定时，其中多个脉冲激光在不同的定时从相同的光路发射。

5. 发明授权

US08000448B2 Device and method for adjusting collision timing between electron beam and laser light 有权
标题翻译：调整电子束和激光之间的碰撞定时的装置和方法
公开(公告)号：US08000448B2
公开(公告)日：2011-08-16
申请号：US12667367
申请日：2008-07-01
申请人： Hiroyuki Nose , Daisuke Ishida , Namio Kaneko , Yasuo Sakai , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
发明人： Hiroyuki Nose , Daisuke Ishida , Namio Kaneko , Yasuo Sakai , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
IPC分类号： H05G2/00 , H01J35/00
CPC分类号： H05G2/00
摘要： An electron beam detection device (34) is arranged on an electron beam passing path so that a beam delay time tB from a passing moment of an electron beam (1) to a moment when the beam reaches a predicted collision point (9a) is longer than a laser delay time tL from a moment when a command for generating laser light (3) is issued to the moment when the laser light reaches the predicted collision point (9a) by at least a predetermined delay time Δt. The device (34) may detect passing therethrough without affecting the electron beam and output a laser light generation command from a laser light command delay circuit (36) when the predetermined delay time Δt (=tB−tL) has elapsed after the detection.
摘要翻译：电子束检测装置（34）被布置在电子束通过路径上，使得从电子束（1）的通过时刻到光束到达预测碰撞点（9a）的时刻的光束延迟时间tB较长比从激光发光指令（3）发出激光到达预测的碰撞点（9a）至少一个预定的延迟时间＆Dgr; t的时刻的激光延迟时间tL为止。当检测到预定的延迟时间＆Dgr; t（= tB-tL）时，器件（34）可以检测通过其中而不影响电子束并从激光指令延迟电路（36）输出激光生成命令。

6. 发明申请

US20110013749A1 HIGH BRIGHTNESS X-RAY GENERATING DEVICE AND METHOD 有权
标题翻译：高亮度X射线发生装置及方法
公开(公告)号：US20110013749A1
公开(公告)日：2011-01-20
申请号：US12667509
申请日：2008-07-01
申请人： Hiroyuki Nose , Daisuke Ishida , Namio Kaneko , Yasuo Sakai , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
发明人： Hiroyuki Nose , Daisuke Ishida , Namio Kaneko , Yasuo Sakai , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
IPC分类号： H05G2/00
CPC分类号： H05G2/00
摘要： A high brightness X-ray generator and a high brightness X-ray generating method are provided which are able to promote an increase in X-ray brightness (i.e., an increase in an X-ray output) while suppressing an excessive increase in the cost of optical elements such as a laser unit, a mirror, and a lens. A high brightness X-ray generator generates an X-ray by inverse Compton scattering by colliding an electron beam with pulse laser light. There are provided a plurality of pulse laser units (32A, 32B) which emits a plurality of pulse laser lights (3a, 3b) in predetermined periods, an optical-path matching unit (34) which matches optical paths of the plurality of pulse laser lights, and a timing control unit (40) which controls timings of the optical-path matching unit and the pulse laser units, wherein the plurality of pulse laser lights is emitted from the same optical path at different timings.
摘要翻译：提供一种高亮度X射线发生器和高亮度X射线产生方法，其能够在抑制成本的过度增加的同时促进X射线亮度的增加（即，X射线输出的增加）诸如激光单元，反射镜和透镜的光学元件。高亮度X射线发生器通过使电子束与脉冲激光相撞而通过反Compton散射产生X射线。提供了多个以预定周期发射多个脉冲激光（3a，3b）的脉冲激光器单元（32A，32B），与多个脉冲激光器的光路相匹配的光路匹配单元（34）灯和定时控制单元（40），其控制光路匹配单元和脉冲激光单元的定时，其中多个脉冲激光在不同的定时从相同的光路发射。

7. 发明申请

US20110026679A1 X-RAY METERING APPARATUS, AND X-RAY METERING METHOD 有权
标题翻译： X射线测距仪，X射线测距仪
公开(公告)号：US20110026679A1
公开(公告)日：2011-02-03
申请号：US12667500
申请日：2008-07-01
申请人： Hiroyuki Nose , Daisuke Ishida , Namio Kaneko , Yasuo Sakai , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
发明人： Hiroyuki Nose , Daisuke Ishida , Namio Kaneko , Yasuo Sakai , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
IPC分类号： H05G2/00
CPC分类号： H05G2/00
摘要： An X-ray waveform is generated by validating detection data corresponding to when an X-ray (4) is generated at a collision point (9) among X-ray detection data and invalidating other data. For example, when laser light (3) is pulse laser light and an electron beam (1) is a continuous electron beam or a pulse-like electron beam having a pulse width equal to or greater than that of the pulse laser light, the X-ray waveform is generated by detecting the laser light (3) and multiplying the X-ray detection data by laser light detection data after making time axes coincident with respect to the collision point (9).
摘要翻译：通过验证与在X射线检测数据中的碰撞点（9）生成X射线（4）并使其他数据无效的检测数据，生成X射线波形。例如，当激光（3）是脉冲激光并且电子束（1）是连续的电子束或具有等于或大于脉冲激光的脉冲宽度的脉冲状电子束时，X 通过检测激光（3）并且在使相对于碰撞点（9）重合的时间轴之后乘以激光检测数据来生成X射线波形。

8. 发明授权

US08345824B2 X-ray metering apparatus, and X-ray metering method 有权
标题翻译： X射线计量装置和X射线计量方法
公开(公告)号：US08345824B2
公开(公告)日：2013-01-01
申请号：US12667500
申请日：2008-07-01
申请人： Hiroyuki Nose , Daisuke Ishida , Namio Kaneko , Yasuo Sakai , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
发明人： Hiroyuki Nose , Daisuke Ishida , Namio Kaneko , Yasuo Sakai , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
IPC分类号： G21G4/00
CPC分类号： H05G2/00
摘要： An X-ray waveform is generated by validating detection data corresponding to when an X-ray (4) is generated at a collision point (9) among X-ray detection data and invalidating other data. For example, when laser light (3) is pulse laser light and an electron beam (1) is a continuous electron beam or a pulse-like electron beam having a pulse width equal to or greater than that of the pulse laser light, the X-ray waveform is generated by detecting the laser light (3) and multiplying the X-ray detection data by laser light detection data after making time axes coincident with respect to the collision point (9).
摘要翻译：通过验证与在X射线检测数据中的碰撞点（9）生成X射线（4）并使其他数据无效的检测数据，生成X射线波形。例如，当激光（3）是脉冲激光并且电子束（1）是连续的电子束或具有等于或大于脉冲激光的脉冲宽度的脉冲状电子束时，X 通过检测激光（3）并且在使相对于碰撞点（9）重合的时间轴之后乘以激光检测数据来生成X射线波形。

9. 发明授权

US07817288B2 Device and method for measuring profiles of electron beam and laser beam 有权
标题翻译：用于测量电子束和激光束轮廓的装置和方法
公开(公告)号：US07817288B2
公开(公告)日：2010-10-19
申请号：US12162912
申请日：2007-03-07
申请人： Daisuke Ishida , Hiroyuki Nose , Namio Kaneko , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
发明人： Daisuke Ishida , Hiroyuki Nose , Namio Kaneko , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
IPC分类号： G01B11/14 , G01B11/02
CPC分类号： H05G2/00
摘要： A device for measuring profiles of an electron beam and a laser beam is provided with a profile measuring device 30 for measuring cross-section profiles of the beams in the vicinity of a collision position where an electron beam 1 and a laser beam 3 are brought into frontal collision, and a moving device 40 for continuously moving the profile measuring device in a predetermined direction which substantially coincides with the axial directions of the beams. Furthermore, based on the cross-section profiles measured by the profile measuring device, the position of the profile measuring device in the predetermined direction, and the oscillation timings of the beams, temporal changes in three-dimensional profiles of the electron beam and the laser beam are created by a profile creating device 50.
摘要翻译：用于测量电子束和激光束的轮廓的装置设置有轮廓测量装置30，用于测量在电子束1和激光束3进入的碰撞位置附近的梁的横截面轮廓正面碰撞，以及移动装置40，用于沿着与梁的轴向大致重合的预定方向连续地移动轮廓测量装置。此外，基于由型材测量装置测量的横截面轮廓，轮廓测量装置在预定方向上的位置和梁的振动定时，电子束和激光器的三维轮廓的时间变化光束由简档创建设备50创建。

10. 发明申请

US20090051937A1 Device and method for measuring profiles of electron beam and laser beam 有权
标题翻译：用于测量电子束和激光束轮廓的装置和方法
公开(公告)号：US20090051937A1
公开(公告)日：2009-02-26
申请号：US12162912
申请日：2007-03-07
申请人： Daisuke Ishida , Hiroyuki Nose , Namio Kaneko , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
发明人： Daisuke Ishida , Hiroyuki Nose , Namio Kaneko , Mitsuru Uesaka , Fumito Sakamoto , Katsuhiro Dobashi
IPC分类号： G01B11/14
CPC分类号： H05G2/00
摘要： A device for measuring profiles of an electron beam and a laser beam is provided with a profile measuring device 30 for measuring cross-section profiles of the beams in the vicinity of a collision position where an electron beam 1 and a laser beam 3 are brought into frontal collision, and a moving device 40 for continuously moving the profile measuring device in a predetermined direction which substantially coincides with the axial directions of the beams. Furthermore, based on the cross-section profiles measured by the profile measuring device, the position of the profile measuring device in the predetermined direction, and the oscillation timings of the beams, temporal changes in three-dimensional profiles of the electron beam and the laser beam are created by a profile creating device 50.
摘要翻译：用于测量电子束和激光束的轮廓的装置设置有轮廓测量装置30，用于测量在电子束1和激光束3进入的碰撞位置附近的梁的横截面轮廓正面碰撞，以及移动装置40，用于沿着与梁的轴向大致重合的预定方向连续移动轮廓测量装置。此外，基于由型材测量装置测量的横截面轮廓，轮廓测量装置在预定方向上的位置和梁的振动定时，电子束和激光器的三维轮廓的时间变化光束由简档创建设备50创建。

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