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1. 发明专利

JP2011064673A Thermal detecting element and spectroscopic detector 审中-公开
标题翻译：热检测元件和光谱检测器
公开(公告)号：JP2011064673A
公开(公告)日：2011-03-31
申请号：JP2010155346
申请日：2010-07-08
申请人： Daikin Industries Ltd , Kobe Univ , ダイキン工業株式会社 , 国立大学法人神戸大学
发明人： ISHIDA KENJI , HORIE SATOSHI , UEDA HIROKIYO , FURUKAWA MASASHI , KOTANI TETSUHIRO , KO MEITEN , KANEMURA TAKASHI
IPC分类号： G01J1/02 , G01J3/36
摘要： PROBLEM TO BE SOLVED: To provide a spectroscopic detector in a diffraction photometer system dispensing with a drive shaft, and to provide a thermal detecting element used for the spectroscopic detector. SOLUTION: The thermal detecting element including not less than two light reception sections having different light absorption peak wavelengths on one surface is provided. The light reception sections have a configuration where a film made of a pyroelectric material is interposed between electrodes, and the film thicknesses of the film are made different for the respective light reception sections. Also, the thermal detecting element is constituted by arranging the respective light reception sections on a bendable, flexible substrate in a one-dimensional array form. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：在分散有驱动轴的衍射光度计系统中提供光谱检测器，并提供用于光谱检测器的热检测元件。解决方案：提供在一个表面上包括不少于两个具有不同吸光峰值波长的光接收部分的热检测元件。光接收部分具有将由热电材料制成的膜插入电极之间的构造，并且使各个光接收部分的膜的膜厚不同。此外，热检测元件是通过将各个光接收部分以一维阵列形式布置在可弯曲的柔性基板上而构成的。版权所有（C）2011，JPO＆INPIT

2. 发明专利

JP2011181554A Polarization treatment method and polarization treatment device 审中-公开
标题翻译：极化处理方法和极化处理装置
公开(公告)号：JP2011181554A
公开(公告)日：2011-09-15
申请号：JP2010041667
申请日：2010-02-26
申请人： Daikin Industries Ltd , Kobe Univ , ダイキン工業株式会社 , 国立大学法人神戸大学
发明人： HORIE SATOSHI , ISHIDA KENJI , UEDA HIROKIYO , NAKAJIMA NAOYA , KOTANI TETSUHIRO , KO MEITEN , KANEMURA TAKASHI
IPC分类号： H01L41/26 , H01L21/8246 , H01L27/105 , H01L27/28 , H01L41/08 , H01L41/09 , H01L41/22 , H01L41/257 , H01L41/45 , H01L51/05
摘要： PROBLEM TO BE SOLVED: To provide a polarization treatment method for a vinylidene fluoride oligomer film, suitable to mass-production. SOLUTION: The polarization treatment method is provided in which a predetermined voltage with magnitude repeatedly changed on one of positive and negative sides to the vinylidene fluoride oligomer film 22 to perform corona polling. In the method, the predetermined voltage is a superposition voltage generated by superposing DC and AC voltages one over the other. Laminates 4A and 4B are made in each of which the vinylidene fluoride oligomer film 22 is sandwiched between an upper electrode 21 and a lower electrode 23, and in this state, corona polling is carried out by application of the predetermined voltage. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供适合于批量生产的偏二氟乙烯低聚物膜的偏振处理方法。解决方案：提供了一种极化处理方法，其中正偏压和负侧之一上的反复改变幅度的预定电压到偏二氟乙烯低聚物膜22以进行电晕轮询。在该方法中，预定电压是通过将DC和AC电压叠加在一起而产生的叠加电压。制造层叠体4A和4B，其中偏二氟乙烯低聚物膜22夹在上电极21和下电极23之间，并且在该状态下，通过施加预定电压进行电晕轮询。版权所有（C）2011，JPO＆INPIT

3. 发明专利

JP2012108058A Infrared photo-detection apparatus 有权
标题翻译：红外光电检测装置
公开(公告)号：JP2012108058A
公开(公告)日：2012-06-07
申请号：JP2010258441
申请日：2010-11-19
申请人： Kobe Univ , 国立大学法人神戸大学
发明人： HORIE SATOSHI , ISHIDA KENJI , UEDA HIROKIYO
IPC分类号： G01V8/20 , G01J1/02
摘要： PROBLEM TO BE SOLVED: To provide an infrared photo-detection apparatus which is easily installed and with which a human body or the like can be accurately detected over a wide range.SOLUTION: An infrared photo-detection apparatus 1 includes: a pyroelectric substrate in which a plurality of photo-detection elements 16a-16e each composed of a pyroelectric body are disposed on a surface of a supporting base at intervals; a condenser lens which is provided correspondingly to each of the photo-detection elements 16a-16e; and a casing which holds the pyroelectric substrate and the condenser lens while spacing them in a thickness direction. For the photo-detection elements 16a-16e, detection areas E1-E5 are divided into a plurality of areas, and the casing is curved in the thickness direction in such a manner that a plurality of preset spatial areas S11-S15 and the detection areas E1-E5 are overlapped by the photo-detection elements 16a-16e which are different for each of the spatial areas S11-S15.
摘要翻译：要解决的问题：提供一种容易安装的红外光检测装置，能够在宽范围内精确地检测人体等。解决方案：红外光检测装置1包括：热电基板，其中多个由热电体构成的光检测元件16a-16e间隔地设置在支撑基座的表面上; 对应于每个光检测元件16a-16e设置的聚光透镜; 以及保持热电基板和聚光透镜同时在厚度方向上隔开的壳体。对于光检测元件16a-16e，检测区域E1-E5被分成多个区域，并且壳体在厚度方向上弯曲，使得多个预设空间区域S11-S15和检测区域 E1-E5与对于空间区域S11-S15中的每一个不同的光检测元件16a-16e重叠。版权所有（C）2012，JPO＆INPIT

4. 发明专利

JP2011179976A Polarization inspection method and polarization inspection device 审中-公开
标题翻译：偏振检测方法和极化检测装置
公开(公告)号：JP2011179976A
公开(公告)日：2011-09-15
申请号：JP2010044587
申请日：2010-03-01
申请人： Kobe Univ , 国立大学法人神戸大学
发明人： HORIE SATOSHI , ISHIDA KENJI , UEDA HIROKIYO
IPC分类号： G01R29/22 , H01L41/22 , H01L41/257
摘要： PROBLEM TO BE SOLVED: To provide a polarization inspection method inspecting a polarization state due to polarization processing of a ferroelectricity organic thin film by a simple method applicable for mass production. SOLUTION: A process is for applying electric field to the ferroelectricity thin film 30 subjected to polarization processing, and includes performance of: an electric field application process in which a value of the applied electric field is changed from a predetermined original point to a positive value or a negative value, and changed to the negative value or the positive value in a direction opposite to the changed direction; and, in the first electric field application process after the polarization processing, an observation process for observing the polarity of the application electric field, a peak current value or a peak current total amount when peak current flows to the thin film. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供通过适用于批量生产的简单方法来检查由于铁电性有机薄膜的偏振处理引起的偏振状态的偏振检查方法。解决方案：一种用于对经过偏振处理的铁电薄膜30施加电场的过程，并且包括以下性能：施加电场的值从预定原点改变到正值或负值，并且在与改变的方向相反的方向上变为负值或正值; 并且在极化处理之后的第一电场施加处理中，观察当峰值电流流向薄膜时的施加电场的极性，峰值电流值或峰值电流总量的观察处理。版权所有（C）2011，JPO＆INPIT

5. 发明专利

JP2008240025A Apparatus and method for thin film formation, method for enabling polarization reversal, method for measuring ferroelectric property, thin film and capacitor structure 有权
标题翻译：用于薄膜形成的装置和方法，用于实现极化反转的方法，用于测量电性能，薄膜和电容器结构的方法
公开(公告)号：JP2008240025A
公开(公告)日：2008-10-09
申请号：JP2007079132
申请日：2007-03-26
申请人： Daikin Ind Ltd , Kyoto Univ , ダイキン工業株式会社 , 国立大学法人京都大学
发明人： HORIE SATOSHI , ISHIDA KENJI , MATSUSHIGE KAZUMI , KOTANI TETSUHIRO , KO MEITEN
IPC分类号： C23C14/12 , C23C14/24 , H01G4/18
摘要： PROBLEM TO BE SOLVED: To provide an apparatus 1 for thin film formation, capable of efficiently forming a thin film 51 in a short period of time.
SOLUTION: An evaporation source 30 in which a VDF oligomer 33 is disposed and a substrate 10 to be subjected to vapor deposition are separated from each other while the evaporation source 30 is heated. Then, a separated state in which the substrate 10 and the evaporation source 30 are separated from each other is shifted into a neighboring state in which a thin film formation surface 11 of the substrate 10 and a VDF oligomer supplying surface 32 of the evaporation source 30 come close to and face each other across a heat-insulating mask 20 by moving the substrate 10 and/or the evaporation source 30. In the neighboring state, the thin film 51 of the VDF oligomer 33 is deposited onto the thin film formation surface 11.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：为了提供能够在短时间内有效地形成薄膜51的薄膜形成装置1。解决方案：在蒸发源30被加热的同时，其中设置有VDF低聚物33的蒸发源30和要进行气相沉积的基板10彼此分离。然后，基板10和蒸发源30彼此分离的分离状态转移到基板10的薄膜形成表面11和蒸发源30的VDF低聚物供应表面32的相邻状态通过移动基板10和/或蒸发源30而靠近隔热掩模20并相互面对。在相邻状态下，将VDF低聚物33的薄膜51沉积到薄膜形成表面11上版权所有（C）2009，JPO＆INPIT

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