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1. 发明申请

WO2002077680A1 APPARATUS AND METHOD FOR MEASURING POLARIZATION-DEPENDENT LOSS USING REPEATED HIGH SPEED POLARIZATION SCRAMBLING 审中-公开
标题翻译：使用重复的高速极化扫描测量极化依赖性损失的装置和方法
公开(公告)号：WO2002077680A1
公开(公告)日：2002-10-03
申请号：PCT/KR2002/000195
申请日：2002-02-07
申请人： DONAM SYSTEMS INC. , KOH, Yeon-Wan , LEE, Bong-Wan , KIM, Jung-Won
发明人： KOH, Yeon-Wan , LEE, Bong-Wan , KIM, Jung-Won
IPC分类号： G02B5/30
CPC分类号： G01M11/337 , G02B6/105
摘要： Disclosed is an apparatus and method for measuring a changing amount of insertion loss of an optical device depending on a polarization state of an incident light, i.e., a polarization-dependent loss. An incident light that is periodically subject to all polarization states passes through a testing optical device by a polarization scrambler including a piezoelectric element type optical fiber birefringence modulator, and an optical detector measures intensity of the passing light, in which the measured intensity values are averaged for birefringence modulation having a constant period, and then the polarization-dependent loss is computed from a ratio of maximum power to minimum power for the period. Use of the birefringence modulator shortens measuring time, and decreases an affect of external disturbance to the incident light that is incident into the testing optical component or occurrence probability of the external disturbance, so that the polarization-dependent loss can be precisely measured.
摘要翻译：公开了一种用于根据入射光的偏振状态即偏振相关损耗来测量光学器件的插入损耗的变化量的装置和方法。周期性地受到所有极化状态的入射光通过包括压电元件型光纤双折射调制器的偏振加扰器通过测试光学器件，并且光学检测器测量通过光的强度，其中测量的强度值被平均对于具有恒定周期的双折射调制，然后根据该周期的最大功率与最小功率的比率来计算偏振相关损耗。双折射调制器的使用缩短了测量时间，并且减小了入射到测试光学部件中的入射光的外部干扰的影响或外部干扰的发生概率，从而可以精确地测量偏振相关损耗。

2. 发明公开

EP1060419A1 OPTICAL FIBER FOR BROADBAND OPTICAL DEVICES AND OPTICAL FIBER DEVICES USING THEREOF 审中-公开
标题翻译：光纤，宽带光纤元素，并且该二手光学纤维元件
公开(公告)号：EP1060419A1
公开(公告)日：2000-12-20
申请号：EP99959976.4
申请日：1999-12-10
申请人： Donam Systems Inc.
发明人： KOH, Yeon-Wan , KIM, Jin-Ha , LEE, Bong-Wan , YUN, Seok-Hyun , KIM, Byoung-Yoon , OH, Kyung-Hwan
IPC分类号： G02B6/18
CPC分类号： G02F1/0134 , G02B6/14 , G02B6/2793 , G02B6/29377
摘要： The present invention relates to an optical fiber having a normalized frequency applicable to a broadband optical device, and to a broadband, polarization-independent, low-loss optical fiber device made by using the aforementioned optical fiber. The optical fiber of the present invention has a normalized frequency value V, structural parameters of which including a core radius, a core refractive index and a cladding refractive index are adjusted to minimize the beat dispersion between first and second modes in a predetermined frequency range. Various optical fiber devices may be achieved if the aforementioned optical fiber is used along with acoustic wave generating means and a mode dropper or a mode selective coupler.

3. 发明授权

EP1368678B1 APPARATUS AND METHOD FOR MEASURING POLARIZATION DEPENDENT LOSS USING REPEATED HIGH SPEED POLARIZATION SCRAMBLING 有权
标题翻译：装置和方法用于确定偏振相关损耗反复HIGH SPEED偏振干涉
公开(公告)号：EP1368678B1
公开(公告)日：2005-10-19
申请号：EP02700829.1
申请日：2002-02-07
申请人： Donam Systems Inc.
发明人： KOH, Yeon-Wan , LEE, Bong-Wan , KIM, Jung-Won
IPC分类号： G02B5/30 , G01M11/00
CPC分类号： G01M11/337 , G02B6/105

4. 发明公开

EP1368678A1 APPARATUS AND METHOD FOR MEASURING POLARIZATION DEPENDENT LOSS USING REPEATED HIGH SPEED POLARIZATION SCRAMBLING 有权
标题翻译：使用重复的高速极化扰乱来测量极化相关损耗的装置和方法
公开(公告)号：EP1368678A1
公开(公告)日：2003-12-10
申请号：EP02700829.1
申请日：2002-02-07
申请人： Donam Systems Inc.
发明人： KOH, Yeon-Wan , LEE, Bong-Wan , KIM, Jung-Won
IPC分类号： G02B5/30
CPC分类号： G01M11/337 , G02B6/105
摘要： Disclosed is an apparatus and method for measuring a changing amount of insertion loss of an optical device depending on a polarization state of an incident light, i.e., a polarization-dependent loss. An incident light that is periodically subject to all polarization states passes through a testing optical device by a polarization scrambler including a piezoelectric element type optical fiber birefringence modulator, and an optical detector measures intensity of the passing light, in which the measured intensity values are averaged for birefringence modulation having a constant period, and then the polarization-dependent loss is computed from a ratio of maximum power to minimum power for the period. Use of the birefringence modulator shortens measuring time, and decreases an affect of external disturbance to the incident light that is incident into the testing optical component or occurrence probability of the external disturbance, so that the polarization-dependent loss can be precisely measured.
摘要翻译：公开了一种用于根据入射光的偏振状态，即偏振相关损耗来测量光学器件的插入损耗的改变量的设备和方法。周期性地经受所有偏振态的入射光通过包括压电元件型光纤双折射调制器的偏振扰偏器穿过测试光学装置，并且光学检测器测量通过光的强度，其中测量的强度值被平均化对于具有恒定周期的双折射调制，然后根据该周期的最大功率与最小功率的比率来计算偏振相关损耗。使用双折射调制器缩短了测量时间，并降低了外部干扰对入射到测试光学部件中的入射光的影响或外部干扰的发生概率，从而可以精确测量偏振相关损耗。

5. 发明公开

EP1173736A1 APPARATUS AND METHOD FOR DETECTING POLARIZATION 审中-公开
标题翻译：检测极化的装置和方法
公开(公告)号：EP1173736A1
公开(公告)日：2002-01-23
申请号：EP00966578.7
申请日：2000-10-06
申请人： Donam Systems Inc.
发明人： JEONG, Ho-Jin , LEE, Bong-Wan
IPC分类号： G01J4/00 , G01N21/21
CPC分类号： G01J4/04
摘要： An apparatus and method for detecting the state of polarization (SOP). The apparatus of the present invention includes a phase retarder and a polarizer which rotate with different speeds. In the method of the present invention, optical signals passed through the rotating phase retarder and the rotating polarizer are detected and their harmonic components related to rotating frequencies of phase retarder and polarizer are analyzed, which gives the Stokes parameters representing the state of polarization. According to the present invention, the amount of phase retardation at the phase retarder can be obtained together with the state of polarization using frequency component analysis, reducing measurement errors. The present invention has advantages in SOP measurement of wide wavelength range, increasing the measurement accuracy.
摘要翻译：一种用于检测极化状态（SOP）的设备和方法。本发明的设备包括以不同速度旋转的相位延迟器和偏振器。在本发明的方法中，检测通过旋转相位延迟器和旋转偏振器的光学信号，并分析它们与相位延迟器和偏振器的旋转频率有关的谐波分量，从而给出表示偏振状态的斯托克斯参数。根据本发明，可以利用频率分量分析与偏振态一起获得相位延迟器处的相位延迟量，从而减少测量误差。本发明在宽波长范围的SOP测量中具有优势，提高了测量精度。

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