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    • 2. 发明申请
    • TERBIUM BASED DETECTOR SCINTILLATOR
    • 基于TERBIUM的检测器扫描仪
    • US20140177783A1
    • 2014-06-26
    • US14234639
    • 2012-07-03
    • Cornelis Reinder RondaNorbert ConradsHenning OhlandHerbert Schreinemacher
    • Cornelis Reinder RondaNorbert ConradsHenning OhlandHerbert Schreinemacher
    • G01T1/20G01N23/04
    • G01T1/2006C09K11/7771G01N23/046G01T1/2023G21K4/00
    • An imaging system (100) includes a radiation source (110) and a radiation sensitive detector array (116), which includes a scintillator array (118) and a photosensor array (120) optically coupled to the scintillator array, wherein the scintillator array includes Gd2O2S:Pr,Tb,Ce. A method includes detecting radiation with a radiation sensitive detector array (116) of an imaging system (100), wherein the radiation sensitive detector array includes a Gd2O2S:Pr,Tb,Ce based scintillator array (118). A radiation sensitive detector array (116) includes a scintillator array (118) and a photosensor array (120) optically coupled to the scintillator array, wherein the scintillator array includes Gd2O2S:Pr,Tb,Ce, and an amount of Tb3+ in the Gd2O2S:Pr,Tb,Ce is equal to or less than two hundred mole parts per million.
    • 成像系统(100)包括辐射源(110)和辐射敏感检测器阵列(116),其包括闪烁体阵列(118)和光学耦合到闪烁体阵列的光电传感器阵列(120),其中所述闪烁体阵列包括 Gd2O2S:Pr,Tb,Ce。 一种方法包括用成像系统(100)的辐射敏感检测器阵列(116)检测辐射,其中所述辐射敏感检测器阵列包括Gd 2 O 2 S:Pr,Tb,Ce基闪烁体阵列(118)。 辐射敏感检测器阵列(116)包括闪烁体阵列(118)和光学耦合到闪烁体阵列的光电传感器阵列(120),其中闪烁体阵列包括Gd 2 O 2 S:Pr,Tb,Ce和Gd 2 O 2 S中的Tb 3+ :Pr,Tb,Ce等于或小于百万分之二百摩尔。
    • 10. 发明申请
    • Method of reading out the sensor elements of a sensor, and a sensor
    • US20050218332A1
    • 2005-10-06
    • US11142767
    • 2005-06-01
    • Walter RuttenFalko BusseNorbert Conrads
    • Walter RuttenFalko BusseNorbert Conrads
    • G01T1/20G01T1/24G01T1/29H01L27/14H01L31/09H04N5/32H04N5/347H04N5/374H04N7/18G01J1/00H01L25/00H01L27/00
    • H04N5/32H01L2924/0002H04N5/347H04N5/374H01L2924/00
    • The invention relates to a method of reading out the sensor elements of a sensor (1) with a matrix of light-sensitive or X-ray-sensitive sensor elements (S1,2; S1,2 . . . ) which are arranged in rows and columns and generate charges in dependence on the incident quantity of radiation, the switches (3) of the relevant sensor elements being activated via address lines (4, . . . , 8, . . . ) and the charges of the respective activated sensor elements being drained via read-out lines (9, 10, 11, . . . ) so as to be processed further by way of amplifiers (14, . . . , 18, . . . ) and transfer means (19). The invention also relates to a corresponding sensor as well as to an X-ray examination apparatus which includes an X-ray source for emitting an X-ray beam for irradiating an object in order to form an X-ray image, as well as a detector for generating an electrical image signal from said X-ray image. Despite the small incident X-ray doses, adequate amounts of charge, and hence electrical signals, are provided so as to form the image in that ingoing address lines (4, . . . , 8, . . . ) are selectably connected, by way of individually controllable switch elements (27, . . . , 30, . . . ) and by means of a switching operation, to each time the respective next address line and the sensor elements of at least two neighboring lines are activated by means of one ingoing signal, and corresponding outgoing read-out lines (9, . . . , 13, . . . ) are selectably connected, by way of individually controllable switch elements (31, . . . , 34, . . . ) and by means of a switching operation, to the respective next read-out line in such a manner that the charge signals read out from the activated sensor elements of at least two neighboring columns are combined so as to form one output signal.