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    • 1. 发明授权
    • Tape roll in-series package machine
    • 卷筒式串联包装机
    • US5732536A
    • 1998-03-31
    • US739072
    • 1996-10-28
    • Ching-Lin LinChia-Hung HuangDo-Yu Lee
    • Ching-Lin LinChia-Hung HuangDo-Yu Lee
    • B65B5/10B65B35/30
    • B65B5/106
    • A tape roll in-series package machine for neatly packing a plurality of tape rolls into a paper box. In includes (a) a conveying device, (b) an in-series filling device, and (c) a paper box elevating device. The in-series filling device contains first, second, and third pneumatic cylinder each of which is connected to a receiving plate to cooperatively pack a row of the tape rolls into a paper box. The paper elevating device contains (i) a paper box conveyor which is divided into front section, middle and rear sections, each of the sections is driven by a separate mechanism; (ii) an elevating frame disposed above the middle section of the paper box conveyor, wherein the elevating frame contains a pair of fending plates each being driven by a revolving pneumatic cylinder for holding the paper box in place and facilitating the incoming and outgoing motions of the paper box; and (iii) a Z-axis stepping motor which is provided to control an up-and-down motion of the elevating frame so as to adjust a vertical position of the paper box.
    • 一种用于将多个带卷整齐地包装在纸盒中的胶带卷筒式包装机。 包括(a)输送装置,(b)串联充填装置,和(c)纸盒升降装置。 串联式灌装装置包括第一,第二和第三气缸,每个气缸连接到接收板,以将一排带卷协同地包装在纸盒中。 纸张升降装置包括:(i)纸箱输送机,其分为前段,中间和后段,每个区段由单独的机构驱动; (ii)设置在纸箱输送机的中间部分上方的升降框架,其中升降架包括一对防火板,每个挡板由用于将纸盒保持在适当位置的旋转气动缸驱动,并且有利于进入和离开运动 纸盒; 和(iii)Z轴步进电机,其被设置为控制升降框架的上下运动,以调节纸盒的垂直位置。
    • 7. 发明授权
    • Light emitting diode chip and method of manufacturing the same
    • 发光二极管芯片及其制造方法
    • US08461619B2
    • 2013-06-11
    • US13397688
    • 2012-02-16
    • Chia-Hung HuangShih-Cheng HuangPo-Min TuShun-Kuei Yang
    • Chia-Hung HuangShih-Cheng HuangPo-Min TuShun-Kuei Yang
    • H01L33/36
    • H01L33/38H01L33/14H01L33/20H01L33/42H01L2933/0016
    • An LED chip includes a substrate, a first type semiconductor layer, a light-emitting layer, a second type semiconductor layer, a first electrode and a second electrode formed on the substrate in sequence. A surface of the first type semiconductor layer away from the substrate comprises an exposed first area and a second area covered by the light-emitting layer. The first electrode is formed on the exposed first area of the substrate. A number of recesses are defined in the second area of the surface of the first type semiconductor layer. The recesses are spaced apart from each other and arranged in sequence in a direction away from the first electrode; depths of the recesses gradually decrease following an increase of a distance between the recesses and the first electrode. The second electrode is formed on the second type semiconductor layer.
    • LED芯片依次包括基板,第一类型半导体层,发光层,第二类型半导体层,第一电极和第二电极。 离开衬底的第一类型半导体层的表面包括暴露的第一区域和被发光层覆盖的第二区域。 第一电极形成在基板的暴露的第一区域上。 在第一类型半导体层的表面的第二区域中限定多个凹部。 凹部彼此间隔开并且沿远离第一电极的方向依次布置; 随着凹部和第一电极之间的距离的增加,凹部的深度逐渐减小。 第二电极形成在第二类型半导体层上。
    • 10. 发明授权
    • Method for a bin ratio forecast at new tape out stage
    • 新磁带出站时的比例预测方法
    • US08082055B2
    • 2011-12-20
    • US12499345
    • 2009-07-08
    • Chun-Hsien LinAndy TsenJui-Long ChenSunny WuJong-I MouChia-Hung Huang
    • Chun-Hsien LinAndy TsenJui-Long ChenSunny WuJong-I MouChia-Hung Huang
    • G06F19/00
    • G06Q10/06G06Q30/0202
    • A method for providing a bin ratio forecast at an early stage of integrated circuit device manufacturing processes is disclosed. The method comprises collecting historical data from one or more processed wafer lots; collect measurement data from one or more skew wafer lots; generating an estimated baseline distribution from the collected historical data and collected measurement data; generating an estimated performance distribution based on one or more specified parameters and the generated estimated baseline distribution; determining a bin ratio forecast by applying a bin definition and a yield degradation factor estimation to the generated estimated performance distribution; determining one or more production targets based on the bin ratio forecast; and processing one or more wafers based on the one or more determined production targets.
    • 公开了一种用于在集成电路器件制造工艺的早期阶段提供容量比预测的方法。 该方法包括从一个或多个处理的晶片批次收集历史数据; 从一个或多个偏斜晶片批量收集测量数据; 从收集的历史数据和收集的测量数据生成估计的基线分布; 基于一个或多个指定参数和所生成的估计基线分布产生估计的性能分布; 通过对所生成的估计性能分布应用仓定义和产量退化因子估计来确定仓比预测; 根据仓比预测确定一个或多个生产目标; 以及基于所述一个或多个确定的生产目标来处理一个或多个晶圆。