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1. 发明授权

US09130269B2 Wireless communication device having metal end portion of housing thereof 有权
标题翻译：无线通信装置，其具有壳体的金属端部
公开(公告)号：US09130269B2
公开(公告)日：2015-09-08
申请号：US13655492
申请日：2012-10-19
申请人： Chih-Yang Tsai , Hao-Ying Chang , Chuan-Chou Chi
发明人： Chih-Yang Tsai , Hao-Ying Chang , Chuan-Chou Chi
IPC分类号： H01Q1/24 , H01Q9/42 , H01Q5/371
CPC分类号： H01Q1/243 , H01Q5/371 , H01Q9/42
摘要： An exemplary wireless communication device includes a circuit board, a metal end portion, an antenna, and a connecting member. The antenna is positioned on the circuit board. The connecting member interconnects the circuit board and the end portion. The connecting member serves as a feeding point of the antenna. The end portion is a portion of a housing of the wireless communication device and further serves as a radiating portion of the antenna.
摘要翻译：示例性无线通信设备包括电路板，金属端部，天线和连接部件。天线位于电路板上。连接构件将电路板和端部部分互连。连接构件用作天线的馈电点。端部是无线通信设备的壳体的一部分，并且还用作天线的辐射部分。

2. 发明授权

US08884829B2 Wireless communication device 有权
标题翻译：无线通信设备
公开(公告)号：US08884829B2
公开(公告)日：2014-11-11
申请号：US13647482
申请日：2012-10-09
申请人： Chuan-Chou Chi , Chih-Yang Tsai , Pai-Cheng Huang , Hao-Ying Chang
发明人： Chuan-Chou Chi , Chih-Yang Tsai , Pai-Cheng Huang , Hao-Ying Chang
IPC分类号： H01Q1/24 , H01Q21/28
CPC分类号： H01Q1/243 , H01Q3/24 , H01Q9/42 , H01Q21/28
摘要： A wireless communication device includes a first antenna, a second antenna, a first light sensor adjacent to the first antenna, a second light sensor adjacent to the second antenna, a controller, and a magnetic member movably located between the first antenna and the second antenna. When one of the first and second antennas in a state of receiving/transmitting wireless signals is covered by a user's hand, the nearby light sensor sends a pulse signal to the controller. The controller receiving the pulse signal controls the first and second antennas to change their magnetic polarity, enabling the magnetic member to be separated from one of the first and second antennas and attached to the another one, thereby choosing one of the first and second antennas, or a combination of one of the two antennas and the magnetic member to receive/transmit the wireless signals.
摘要翻译：无线通信设备包括第一天线，第二天线，与第一天线相邻的第一光传感器，与第二天线相邻的第二光传感器，控制器和可移动地位于第一天线和第二天线之间的磁性部件。当接收/发送无线信号状态的第一和第二天线中的一个被用户的手覆盖时，附近的光传感器向控制器发送脉冲信号。接收脉冲信号的控制器控制第一和第二天线以改变它们的磁极性，使得磁性构件能够与第一和第二天线中的一个分离，并附接到另一个天线，从而选择第一和第二天线之一，或两个天线中的一个和磁性构件的组合来接收/发送无线信号。

3. 发明授权

US09219303B2 Earphone antenna, earphone and electronic device employing the same 有权
标题翻译：耳机天线，耳机和采用该耳机的电子设备
公开(公告)号：US09219303B2
公开(公告)日：2015-12-22
申请号：US13226034
申请日：2011-09-06
申请人： Chih-Yang Tsai , Hao-Ying Chang
发明人： Chih-Yang Tsai , Hao-Ying Chang
IPC分类号： H01Q1/04 , H01Q1/44 , H01Q9/30 , H01Q21/28 , H01Q21/30 , H04R1/10
CPC分类号： H01Q1/44 , H01Q9/30 , H01Q21/28 , H01Q21/30 , H04R1/1091
摘要： One or more antennas within an earphone arrangement used in an electronic device includes a plurality of coaxial cables, a first antenna unit, a second antenna unit, and a third antenna unit. The coaxial cables carry radio frequency (RF) signals of different frequency bands. The first antenna unit, the second antenna unit, and the third antenna unit each include a radiating member. Each radiating member can receive and transmit RF signals of at least one frequency band, and the coaxial cables carry the RF signals to the device for processing.
摘要翻译：在电子设备中使用的耳机装置内的一个或多个天线包括多个同轴电缆，第一天线单元，第二天线单元和第三天线单元。同轴电缆承载不同频段的射频（RF）信号。第一天线单元，第二天线单元和第三天线单元各自包括散热构件。每个辐射构件可以接收和发送至少一个频带的RF信号，同轴电缆将RF信号传送到设备进行处理。

4. 发明申请

US20110151597A1 Analysis method for semiconductor device 有权
标题翻译：半导体器件分析方法
公开(公告)号：US20110151597A1
公开(公告)日：2011-06-23
申请号：US12653864
申请日：2009-12-18
申请人： Chih-Chung Chang , Jian-Chang Lin , Wen-Sheng Wu , Ching-Lin Chang , Chih-Yang Tsai
发明人： Chih-Chung Chang , Jian-Chang Lin , Wen-Sheng Wu , Ching-Lin Chang , Chih-Yang Tsai
IPC分类号： H01L21/66 , G01N23/04 , H01J37/26 , G01N23/00 , G01R31/08
CPC分类号： H01J37/26 , G01R31/2894 , G01R31/303 , H01J37/252 , H01J37/3056 , H01J2237/3109 , H01J2237/31745 , H01L22/14 , H01L22/20
摘要： An analysis method for a semiconductor device is described. The semiconductor device having an abnormal region is provided. Thereafter, a focused ion beam microscope analysis process is performed to the abnormal region, wherein the result of the focused ion beam microscope analysis process shows that the abnormal region has a defect therein. After the focused ion beam microscope analysis process, an electrical property measurement step is performed to the abnormal region, so as to determine whether the defect in the abnormal region is a device failure root cause or not.
摘要翻译：对半导体装置的分析方法进行说明。提供具有异常区域的半导体器件。此后，对异常区域进行聚焦离子束显微镜分析处理，其中聚焦离子束显微镜分析处理的结果表明异常区域具有缺陷。在聚焦离子束显微镜分析处理之后，对异常区域进行电性能测量步骤，以确定异常区域中的缺陷是否是设备故障根本原因。

5. 发明授权

US08093074B2 Analysis method for semiconductor device 有权
标题翻译：半导体器件分析方法
公开(公告)号：US08093074B2
公开(公告)日：2012-01-10
申请号：US12653864
申请日：2009-12-18
申请人： Chih-Chung Chang , Jian-Chang Lin , Wen-Sheng Wu , Ching-Lin Chang , Chih-Yang Tsai
发明人： Chih-Chung Chang , Jian-Chang Lin , Wen-Sheng Wu , Ching-Lin Chang , Chih-Yang Tsai
IPC分类号： H01L21/66
CPC分类号： H01J37/26 , G01R31/2894 , G01R31/303 , H01J37/252 , H01J37/3056 , H01J2237/3109 , H01J2237/31745 , H01L22/14 , H01L22/20
摘要： An analysis method for a semiconductor device is described. The semiconductor device having an abnormal region is provided. Thereafter, a focused ion beam microscope analysis process is performed to the abnormal region, wherein the result of the focused ion beam microscope analysis process shows that the abnormal region has a defect therein. After the focused ion beam microscope analysis process, an electrical property measurement step is performed to the abnormal region, so as to determine whether the defect in the abnormal region is a device failure root cause or not.
摘要翻译：对半导体装置的分析方法进行说明。提供具有异常区域的半导体器件。此后，对异常区域进行聚焦离子束显微镜分析处理，其中聚焦离子束显微镜分析处理的结果表明异常区域具有缺陷。在聚焦离子束显微镜分析处理之后，对异常区域进行电性能测量步骤，以确定异常区域中的缺陷是否是设备故障根本原因。

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