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1. 发明授权

US07391644B2 Phase-changeable memory device and read method thereof 有权
标题翻译：相变存储器件及其读取方法
公开(公告)号：US07391644B2
公开(公告)日：2008-06-24
申请号：US11605212
申请日：2006-11-29
申请人： Woo-Yeong Cho , Byung-Gil Choi , Du-Eung Kim , Hyung-Rok Oh , Beak-Hyung Cho , Yu-Hwan Ro
发明人： Woo-Yeong Cho , Byung-Gil Choi , Du-Eung Kim , Hyung-Rok Oh , Beak-Hyung Cho , Yu-Hwan Ro
IPC分类号： G11C11/00
CPC分类号： G11C8/10 , G11C13/0004 , G11C13/004 , G11C2013/0054 , G11C2213/72
摘要： Disclosed is a phase-changeable memory device and a related method of reading data. The memory device is comprised of memory cells, a high voltage circuit, a precharging circuit, a bias circuit, and a sense amplifier. Each memory cell includes a phase-changeable material and a diode connected to a bitline. The high voltage circuit provides a high voltage from a power source. The precharging circuit raises the bitline up to the high voltage after charging the bitline up to the power source voltage. The bias circuit supplies a read current to the bitline by means of the high voltage. The sense amplifier compares a voltage of the bitline with a reference voltage by means of the high voltage, and reads data from the memory cell. The memory device is able to reduce the burden on the high voltage circuit during the precharging operation, thus assuring a sufficient sensing margin during the sensing operation.
摘要翻译：公开了一种可变相存储器件和读取数据的相关方法。存储器件包括存储器单元，高压电路，预充电电路，偏置电路和读出放大器。每个存储单元包括相位可变材料和连接到位线的二极管。高压电路从电源提供高电压。预充电电路将位线充电至电源电压后，将位线升高至高电压。偏置电路通过高电压向位线提供读取电流。读出放大器通过高电压将位线的电压与参考电压进行比较，并从存储单元读取数据。存储器件能够减少在预充电操作期间对高压电路的负担，从而在感测操作期间确保足够的感测余量。

2. 发明申请

US20070133271A1 Phase-changeable memory device and read method thereof 有权
标题翻译：相变存储器件及其读取方法
公开(公告)号：US20070133271A1
公开(公告)日：2007-06-14
申请号：US11605212
申请日：2006-11-29
申请人： Woo-Yeong Cho , Byung-Gil Choi , Du-Eung Kim , Hyung-Rok Oh , Beak-Hyung Cho , Yu-Hwan Ro
发明人： Woo-Yeong Cho , Byung-Gil Choi , Du-Eung Kim , Hyung-Rok Oh , Beak-Hyung Cho , Yu-Hwan Ro
IPC分类号： G11C11/00
CPC分类号： G11C8/10 , G11C13/0004 , G11C13/004 , G11C2013/0054 , G11C2213/72
摘要： Disclosed is a phase-changeable memory device and a related method of reading data. The memory device is comprised of memory cells, a high voltage circuit, a precharging circuit, a bias circuit, and a sense amplifier. Each memory cell includes a phase-changeable material and a diode connected to a bitline. The high voltage circuit provides a high voltage from a power source. The precharging circuit raises the bitline up to the high voltage after charging the bitline up to the power source voltage. The bias circuit supplies a read current to the bitline by means of the high voltage. The sense amplifier compares a voltage of the bitline with a reference voltage by means of the high voltage, and reads data from the memory cell. The memory device is able to reduce the burden on the high voltage circuit during the precharging operation, thus assuring a sufficient sensing margin during the sensing operation.
摘要翻译：公开了一种可变相存储器件和读取数据的相关方法。存储器件包括存储器单元，高压电路，预充电电路，偏置电路和读出放大器。每个存储单元包括相位可变材料和连接到位线的二极管。高压电路从电源提供高电压。预充电电路将位线充电至电源电压后，将位线升高至高电压。偏置电路通过高电压向位线提供读取电流。读出放大器通过高电压将位线的电压与参考电压进行比较，并从存储单元读取数据。存储器件能够减少在预充电操作期间对高压电路的负担，从而在感测操作期间确保足够的感测余量。

3. 发明授权

US07668007B2 Memory system including a resistance variable memory device 有权
标题翻译：存储器系统包括电阻变量存储器件
公开(公告)号：US07668007B2
公开(公告)日：2010-02-23
申请号：US12124523
申请日：2008-05-21
申请人： Byung-Gil Choi , Woo-Yeong Cho , Du-Eung Kim , Hyung-Rok Oh , Beak-Hyung Cho , Yu-Hwan Ro
发明人： Byung-Gil Choi , Woo-Yeong Cho , Du-Eung Kim , Hyung-Rok Oh , Beak-Hyung Cho , Yu-Hwan Ro
IPC分类号： G11C11/00
CPC分类号： G11C8/10 , G11C13/0004 , G11C13/004 , G11C2013/0054 , G11C2213/72
摘要： A memory system includes a resistance variable memory device, and a memory controller for controlling the resistance variable memory device. The resistance variable memory device includes a memory cell connected to a bitline, a high voltage circuit adapted to generate a high voltage from an externally provided power source voltage, where the high voltage is higher than the power source voltage, a precharging circuit adapted to charge the bitline to the power source voltage and further charge the bitline to the high voltage, a bias circuit adapted to provide a read current to the bitline with using the high voltage, and a sense amplifier adapted to detect a voltage level of the bitline with using the high voltage.
摘要翻译：存储器系统包括电阻可变存储器件和用于控制电阻变化存储器件的存储器控制器。电阻可变存储器件包括连接到位线的存储单元，适于从外部提供的电源电压产生高电压的高压电路，其中高电压高于电源电压，预充电电路适于充电位线到电源电压并进一步将位线充电到高电压，偏置电路适于使用高电压向位线提供读取电流;以及读出放大器，其适于使用来检测位线的电压电平高电压。

4. 发明申请

US20080232161A1 RESISTANCE VARIABLE MEMORY DEVICE AND READ METHOD THEREOF 有权
标题翻译：电阻可变存储器件及其读取方法
公开(公告)号：US20080232161A1
公开(公告)日：2008-09-25
申请号：US12124523
申请日：2008-05-21
申请人： Byung-Gil Choi , Woo-Yeong Cho , Du-Eung Kim , Hyung-Rok Oh , Beak-Hyung Cho , Yu-Hwan Ro
发明人： Byung-Gil Choi , Woo-Yeong Cho , Du-Eung Kim , Hyung-Rok Oh , Beak-Hyung Cho , Yu-Hwan Ro
IPC分类号： G11C11/00
CPC分类号： G11C8/10 , G11C13/0004 , G11C13/004 , G11C2013/0054 , G11C2213/72
摘要： A memory system includes a resistance variable memory device, and a memory controller for controlling the resistance variable memory device. The resistance variable memory device includes a memory cell connected to a bitline, a high voltage circuit adapted to generate a high voltage from an externally provided power source voltage, where the high voltage is higher than the power source voltage, a precharging circuit adapted to charge the bitline to the power source voltage and further charge the bitline to the high voltage, a bias circuit adapted to provide a read current to the bitline with using the high voltage, and a sense amplifier adapted to detect a voltage level of the bitline with using the high voltage.
摘要翻译：存储器系统包括电阻可变存储器件和用于控制电阻变化存储器件的存储器控制器。电阻可变存储器件包括连接到位线的存储单元，适于从外部提供的电源电压产生高电压的高压电路，其中高电压高于电源电压，预充电电路适于充电位线到电源电压并进一步将位线充电到高电压，偏置电路适于使用高电压向位线提供读取电流;以及读出放大器，其适于使用来检测位线的电压电平高电压。

5. 发明申请

US20070230239A1 Phase change memory devices and program methods 有权
标题翻译：相变存储器件和程序方法
公开(公告)号：US20070230239A1
公开(公告)日：2007-10-04
申请号：US11723354
申请日：2007-03-19
申请人： Byung-Gil Choi , Du-Eung Kim , Yu-Hwan Ro , Joon-Yong Choi , Beak-Hyung Cho , Woo-Yeong Cho
发明人： Byung-Gil Choi , Du-Eung Kim , Yu-Hwan Ro , Joon-Yong Choi , Beak-Hyung Cho , Woo-Yeong Cho
IPC分类号： G11C11/00
CPC分类号： G11C13/0069 , G11C13/0004 , G11C2013/0078 , G11C2213/72
摘要： A phase change memory device is disclosed. It includes a memory cell array including a plurality of memory cells programmed in relation to a phase change material, and a write driver circuit configured to provide a set current and a reset current to a selected memory cell. The write driver circuit includes a set current driver configured to provide the set current and a reset current driver configured to provide the reset current.
摘要翻译：公开了一种相变存储器件。其包括存储单元阵列，其包括相对于相变材料编程的多个存储器单元，以及写入驱动器电路，其被配置为向所选存储单元提供置位电流和复位电流。写驱动器电路包括配置成提供设定电流的设定电流驱动器和被配置为提供复位电流的复位电流驱动器。

6. 发明授权

US07499316B2 Phase change memory devices and program methods 有权
标题翻译：相变存储器件和程序方法
公开(公告)号：US07499316B2
公开(公告)日：2009-03-03
申请号：US11723354
申请日：2007-03-19
申请人： Byung-Gil Choi , Du-Eung Kim , Yu-Hwan Ro , Joon-Yong Choi , Beak-Hyung Cho , Woo-Yeong Cho
发明人： Byung-Gil Choi , Du-Eung Kim , Yu-Hwan Ro , Joon-Yong Choi , Beak-Hyung Cho , Woo-Yeong Cho
IPC分类号： G11C11/00
CPC分类号： G11C13/0069 , G11C13/0004 , G11C2013/0078 , G11C2213/72
摘要： A phase change memory device is disclosed. It includes a memory cell array including a plurality of memory cells programmed in relation to a phase change material, and a write driver circuit configured to provide a set current and a reset current to a selected memory cell. The write driver circuit includes a set current driver configured to provide the set current and a reset current driver configured to provide the reset current.
摘要翻译：公开了一种相变存储器件。其包括存储单元阵列，其包括相对于相变材料编程的多个存储器单元，以及写入驱动器电路，其被配置为向所选存储单元提供置位电流和复位电流。写驱动器电路包括配置成提供设定电流的设定电流驱动器和被配置为提供复位电流的复位电流驱动器。

7. 发明授权

US07838862B2 Phase random access memory with high density 有权
标题翻译：高密度相位随机存取存储器
公开(公告)号：US07838862B2
公开(公告)日：2010-11-23
申请号：US11177115
申请日：2005-07-08
申请人： Hyung-Rok Oh , Beak-Hyung Cho , Du-Eung Kim , Woo-Yeong Cho
发明人： Hyung-Rok Oh , Beak-Hyung Cho , Du-Eung Kim , Woo-Yeong Cho
IPC分类号： H01L47/00
CPC分类号： G11C13/0004 , G11C11/5678 , G11C2213/79 , H01L27/2436 , H01L27/2472 , H01L45/06 , H01L45/122 , H01L45/144
摘要： A phase random access memory including a plurality of access transistors, each access transistor including a drain region and a phase-changeable film shared by the plurality of access transistors. The phase-changeable film is connected to a bitline through a first electrode and connected to each respective drain region through at least one of a plurality of second electrodes.
摘要翻译：一种包括多个存取晶体管的相位随机存取存储器，每个存取晶体管包括漏区和由多个存取晶体管共享的相变膜。相变膜通过第一电极连接到位线，并通过多个第二电极中的至少一个连接到每个相应的漏极区域。

8. 发明申请

US20050247922A1 Phase random access memory with high density 有权
标题翻译：高密度相位随机存取存储器
公开(公告)号：US20050247922A1
公开(公告)日：2005-11-10
申请号：US11177115
申请日：2005-07-08
申请人： Hyung-Rok Oh , Beak-Hyung Cho , Du-Eung Kim , Woo-Yeong Cho
发明人： Hyung-Rok Oh , Beak-Hyung Cho , Du-Eung Kim , Woo-Yeong Cho
IPC分类号： G11C13/00 , G11B7/24 , G11C11/56 , G11C16/02 , H01L27/10 , H01L27/105 , H01L27/24 , H01L29/76 , H01L45/00 , H01L47/00
CPC分类号： G11C13/0004 , G11C11/5678 , G11C2213/79 , H01L27/2436 , H01L27/2472 , H01L45/06 , H01L45/122 , H01L45/144
摘要： A phase random access memory including a plurality of access transistors, each access transistor including a drain region, and a phase-changeable film shared by the plurality of access transistors. The phase-changeable film is connected to a bitline through a first electrode and connected to each respective drain region through at least one of a plurality of second electrodes.
摘要翻译：一种包括多个存取晶体管的相位随机存取存储器，每个存取晶体管包括漏极区域，以及由多个存取晶体管共享的可相位改变的薄膜。相变膜通过第一电极连接到位线，并通过多个第二电极中的至少一个连接到每个相应的漏极区域。

9. 发明授权

US07317655B2 Memory cell array biasing method and a semiconductor memory device 有权
标题翻译：存储单元阵列偏置方法和半导体存储器件
公开(公告)号：US07317655B2
公开(公告)日：2008-01-08
申请号：US11327967
申请日：2006-01-09
申请人： Beak-Hyung Cho , Du-Eung Kim , Choong-Keun Kwak , Sang-Beom Kang , Woo-Yeong Cho , Hyung-Rok Oh
发明人： Beak-Hyung Cho , Du-Eung Kim , Choong-Keun Kwak , Sang-Beom Kang , Woo-Yeong Cho , Hyung-Rok Oh
IPC分类号： G11C8/00
CPC分类号： G11C13/0004 , G11C11/5678 , G11C13/004 , G11C13/0069 , G11C2013/009 , G11C2213/72
摘要： A method of biasing a memory cell array during a data writing operation and a semiconductor memory device are provided. The semiconductor memory device includes: a memory cell array including a plurality of memory cells in which a first terminal of a memory cell is connected to a corresponding first line among a plurality of first lines and a second terminal of a memory cell is connected to a corresponding second line among a plurality of second lines; and a bias circuit for biasing a selected second line to a first voltage and non-selected second lines to a second voltage.
摘要翻译：提供了一种在数据写入操作期间偏置存储单元阵列的方法和半导体存储器件。半导体存储器件包括：存储单元阵列，其包括多个存储单元，其中存储单元的第一端子连接到多条第一线路中的相应第一线路，而存储器单元的第二端子连接到多个第二行中的对应的第二行; 以及用于将所选择的第二线偏压到第一电压和未选择的第二线到第二电压的偏置电路。

10. 发明申请

US20060164896A1 Memory cell array biasing method and a semiconductor memory device 有权
标题翻译：存储单元阵列偏置方法和半导体存储器件
公开(公告)号：US20060164896A1
公开(公告)日：2006-07-27
申请号：US11327967
申请日：2006-01-09
申请人： Beak-Hyung Cho , Du-Eung Kim , Choong-Keun Kwak , Sang-Beom Kang , Woo-Yeong Cho , Hyung-Rok Oh
发明人： Beak-Hyung Cho , Du-Eung Kim , Choong-Keun Kwak , Sang-Beom Kang , Woo-Yeong Cho , Hyung-Rok Oh
IPC分类号： G11C7/00
CPC分类号： G11C13/0004 , G11C11/5678 , G11C13/004 , G11C13/0069 , G11C2013/009 , G11C2213/72
摘要： A method of biasing a memory cell array during a data writing operation and a semiconductor memory device are provided. The semiconductor memory device includes: a memory cell array including a plurality of memory cells in which a first terminal of a memory cell is connected to a corresponding first line among a plurality of first lines and a second terminal of a memory cell is connected to a corresponding second line among a plurality of second lines; and a bias circuit for biasing a selected second line to a first voltage and non-selected second lines to a second voltage.
摘要翻译：提供了一种在数据写入操作期间偏置存储单元阵列的方法和半导体存储器件。半导体存储器件包括：存储单元阵列，其包括多个存储单元，其中存储单元的第一端子连接到多条第一线路中的相应第一线路，而存储器单元的第二端子连接到多个第二行中的对应的第二行; 以及用于将所选择的第二线偏压到第一电压和未选择的第二线到第二电压的偏置电路。

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