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1. 发明申请

US20070217273A1 PHASE-CHANGE RANDOM ACCESS MEMORY 有权
标题翻译：相变随机存取存储器
公开(公告)号：US20070217273A1
公开(公告)日：2007-09-20
申请号：US11616969
申请日：2006-12-28
申请人： Byung-Gil Choi , Du-Eung Kim , Woo-Yeong Cho , Hye-Jin Kim
发明人： Byung-Gil Choi , Du-Eung Kim , Woo-Yeong Cho , Hye-Jin Kim
IPC分类号： G11C29/00
CPC分类号： G11C29/808 , G11C29/02 , G11C29/027 , G11C29/787 , G11C29/804 , G11C29/846
摘要： A phase-change random access memory includes a memory block including a plurality of memory columns corresponding to the same column address and using different input/output paths; a redundancy memory block including a plurality of redundancy memory columns using different input/output paths; and an input/output controller repairing at least one of the plurality of memory columns using at least one of the plurality of redundancy memory columns, and controlling the number of memory columns simultaneously repaired using redundancy memory columns in response to an input/output repair mode control signal.
摘要翻译：相变随机存取存储器包括存储块，该存储块包括对应于同一列地址的多个存储器列并使用不同的输入/输出路径; 冗余存储器块，其包括使用不同的输入/输出路径的多个冗余存储器列; 以及输入/输出控制器，其使用所述多个冗余存储器列中的至少一个来修复所述多个存储器列中的至少一个，并且响应于输入/输出修复模式来控制使用冗余存储器列同时修复的存储器列的数量控制信号。

2. 发明授权

US07961508B2 Phase-change random access memory 有权
标题翻译：相变随机存取存储器
公开(公告)号：US07961508B2
公开(公告)日：2011-06-14
申请号：US12771028
申请日：2010-04-30
申请人： Byung-Gil Choi , Du-Eung Kim , Woo-Yeong Cho , Hye-Jin Kim
发明人： Byung-Gil Choi , Du-Eung Kim , Woo-Yeong Cho , Hye-Jin Kim
IPC分类号： G11C11/00
CPC分类号： G11C29/808 , G11C29/02 , G11C29/027 , G11C29/787 , G11C29/804 , G11C29/846
摘要： A phase-change random access memory includes a memory block including a plurality of memory columns corresponding to the same column address and using different input/output paths; a redundancy memory block including a plurality of redundancy memory columns using different input/output paths; and an input/output controller repairing at least one of the plurality of memory columns using at least one of the plurality of redundancy memory columns, and controlling the number of memory columns simultaneously repaired using redundancy memory columns in response to an input/output repair mode control signal.
摘要翻译：相变随机存取存储器包括存储块，该存储块包括对应于同一列地址的多个存储器列并使用不同的输入/输出路径; 冗余存储器块，其包括使用不同的输入/输出路径的多个冗余存储器列; 以及输入/输出控制器，其使用所述多个冗余存储器列中的至少一个来修复所述多个存储器列中的至少一个，并且响应于输入/输出修复模式来控制使用冗余存储器列同时修复的存储器列的数量控制信号。

3. 发明授权

US07729160B2 Phase-change random access memory 有权
标题翻译：相变随机存取存储器
公开(公告)号：US07729160B2
公开(公告)日：2010-06-01
申请号：US11616969
申请日：2006-12-28
申请人： Byung-Gil Choi , Du-Eung Kim , Woo-Yeong Cho , Hye-Jin Kim
发明人： Byung-Gil Choi , Du-Eung Kim , Woo-Yeong Cho , Hye-Jin Kim
IPC分类号： G11C11/00
CPC分类号： G11C29/808 , G11C29/02 , G11C29/027 , G11C29/787 , G11C29/804 , G11C29/846
摘要： A phase-change random access memory includes a memory block including a plurality of memory columns corresponding to the same column address and using different input/output paths; a redundancy memory block including a plurality of redundancy memory columns using different input/output paths; and an input/output controller repairing at least one of the plurality of memory columns using at least one of the plurality of redundancy memory columns, and controlling the number of memory columns simultaneously repaired using redundancy memory columns in response to an input/output repair mode control signal.
摘要翻译：相变随机存取存储器包括存储块，该存储块包括对应于同一列地址的多个存储器列并使用不同的输入/输出路径; 冗余存储器块，其包括使用不同的输入/输出路径的多个冗余存储器列; 以及输入/输出控制器，其使用所述多个冗余存储器列中的至少一个来修复所述多个存储器列中的至少一个，并且响应于输入/输出修复模式来控制使用冗余存储器列同时修复的存储器列的数量控制信号。

4. 发明授权

US07511993B2 Phase change memory device and related programming method 有权
标题翻译：相变存储器件及相关编程方法
公开(公告)号：US07511993B2
公开(公告)日：2009-03-31
申请号：US11724268
申请日：2007-03-15
申请人： Byung-Gil Choi , Du-Eung Kim , Beak-Hyung Cho , Woo-Yeong Cho
发明人： Byung-Gil Choi , Du-Eung Kim , Beak-Hyung Cho , Woo-Yeong Cho
IPC分类号： G11C11/00
CPC分类号： G11C8/10 , G11C11/5678 , G11C13/0004 , G11C13/0069 , G11C2013/0078 , G11C2213/72
摘要： A phase change memory device comprises a memory cell array and a write driver circuit. The memory cell array comprises a plurality of memory cells, and the write driver circuit comprises a set current driver and a reset current driver. The set current driver is adapted to provide a set current to a selected memory cell among the plurality of memory cells and the reset current driver is adapted to provide a reset current to a selected memory cell among the plurality of memory cells.
摘要翻译：相变存储器件包括存储单元阵列和写入驱动器电路。存储单元阵列包括多个存储单元，并且写驱动器电路包括设定电流驱动器和复位电流驱动器。所设置的电流驱动器适于向所述多个存储器单元中的所选择的存储单元提供设定电流，并且所述复位电流驱动器适于向所述多个存储器单元中的所选存储单元提供复位电流。

5. 发明申请

US20070133271A1 Phase-changeable memory device and read method thereof 有权
标题翻译：相变存储器件及其读取方法
公开(公告)号：US20070133271A1
公开(公告)日：2007-06-14
申请号：US11605212
申请日：2006-11-29
申请人： Woo-Yeong Cho , Byung-Gil Choi , Du-Eung Kim , Hyung-Rok Oh , Beak-Hyung Cho , Yu-Hwan Ro
发明人： Woo-Yeong Cho , Byung-Gil Choi , Du-Eung Kim , Hyung-Rok Oh , Beak-Hyung Cho , Yu-Hwan Ro
IPC分类号： G11C11/00
CPC分类号： G11C8/10 , G11C13/0004 , G11C13/004 , G11C2013/0054 , G11C2213/72
摘要： Disclosed is a phase-changeable memory device and a related method of reading data. The memory device is comprised of memory cells, a high voltage circuit, a precharging circuit, a bias circuit, and a sense amplifier. Each memory cell includes a phase-changeable material and a diode connected to a bitline. The high voltage circuit provides a high voltage from a power source. The precharging circuit raises the bitline up to the high voltage after charging the bitline up to the power source voltage. The bias circuit supplies a read current to the bitline by means of the high voltage. The sense amplifier compares a voltage of the bitline with a reference voltage by means of the high voltage, and reads data from the memory cell. The memory device is able to reduce the burden on the high voltage circuit during the precharging operation, thus assuring a sufficient sensing margin during the sensing operation.
摘要翻译：公开了一种可变相存储器件和读取数据的相关方法。存储器件包括存储器单元，高压电路，预充电电路，偏置电路和读出放大器。每个存储单元包括相位可变材料和连接到位线的二极管。高压电路从电源提供高电压。预充电电路将位线充电至电源电压后，将位线升高至高电压。偏置电路通过高电压向位线提供读取电流。读出放大器通过高电压将位线的电压与参考电压进行比较，并从存储单元读取数据。存储器件能够减少在预充电操作期间对高压电路的负担，从而在感测操作期间确保足够的感测余量。

6. 发明授权

US07463511B2 Phase change memory device using multiprogramming method 有权
标题翻译：相变存储器件采用多重编程方式
公开(公告)号：US07463511B2
公开(公告)日：2008-12-09
申请号：US11723361
申请日：2007-03-19
申请人： Byung-Gil Choi , Choong-Keun Kwak , Du-Eung Kim , Woo-Yeong Cho
发明人： Byung-Gil Choi , Choong-Keun Kwak , Du-Eung Kim , Woo-Yeong Cho
IPC分类号： G11C11/00
CPC分类号： G11C8/10 , G11C13/0004 , G11C13/0069 , G11C2013/0078 , G11C2213/72
摘要： A phase change memory device includes a memory cell array and a write driver circuit, and a column selection circuit. The memory cell array includes a plurality of block units each connected between a corresponding pair of word line drivers. The write driver circuit includes a plurality of write driver units each comprising a plurality of write drivers adapted to provide respective programming currents to a corresponding block unit among the plurality of block units. The column selection circuit is connected between the memory cell array and the write driver circuit and is adapted to select at least one of the plurality of memory blocks in response to a column selection signal to provide corresponding programming currents to the at least one of the plurality of memory blocks.
摘要翻译：相变存储器件包括存储单元阵列和写入驱动器电路以及列选择电路。存储单元阵列包括多个块单元，每个块单元连接在相应的一对字线驱动器之间。写驱动器电路包括多个写驱动器单元，每个写驱动器单元包括多个写驱动器，其适于向多个块单元中的相应块单元提供相应的编程电流。列选择电路连接在存储单元阵列和写驱动器电路之间，并且适于响应于列选择信号选择多个存储器块中的至少一个，以向多个存储单元阵列中的至少一个提供对应的编程电流的内存块。

7. 发明授权

US07391644B2 Phase-changeable memory device and read method thereof 有权
标题翻译：相变存储器件及其读取方法
公开(公告)号：US07391644B2
公开(公告)日：2008-06-24
申请号：US11605212
申请日：2006-11-29
申请人： Woo-Yeong Cho , Byung-Gil Choi , Du-Eung Kim , Hyung-Rok Oh , Beak-Hyung Cho , Yu-Hwan Ro
发明人： Woo-Yeong Cho , Byung-Gil Choi , Du-Eung Kim , Hyung-Rok Oh , Beak-Hyung Cho , Yu-Hwan Ro
IPC分类号： G11C11/00
CPC分类号： G11C8/10 , G11C13/0004 , G11C13/004 , G11C2013/0054 , G11C2213/72
摘要： Disclosed is a phase-changeable memory device and a related method of reading data. The memory device is comprised of memory cells, a high voltage circuit, a precharging circuit, a bias circuit, and a sense amplifier. Each memory cell includes a phase-changeable material and a diode connected to a bitline. The high voltage circuit provides a high voltage from a power source. The precharging circuit raises the bitline up to the high voltage after charging the bitline up to the power source voltage. The bias circuit supplies a read current to the bitline by means of the high voltage. The sense amplifier compares a voltage of the bitline with a reference voltage by means of the high voltage, and reads data from the memory cell. The memory device is able to reduce the burden on the high voltage circuit during the precharging operation, thus assuring a sufficient sensing margin during the sensing operation.
摘要翻译：公开了一种可变相存储器件和读取数据的相关方法。存储器件包括存储器单元，高压电路，预充电电路，偏置电路和读出放大器。每个存储单元包括相位可变材料和连接到位线的二极管。高压电路从电源提供高电压。预充电电路将位线充电至电源电压后，将位线升高至高电压。偏置电路通过高电压向位线提供读取电流。读出放大器通过高电压将位线的电压与参考电压进行比较，并从存储单元读取数据。存储器件能够减少在预充电操作期间对高压电路的负担，从而在感测操作期间确保足够的感测余量。

8. 发明申请

US20070242503A1 Phase change memory device using multiprogramming method 有权
标题翻译：相变存储器件采用多重编程方式
公开(公告)号：US20070242503A1
公开(公告)日：2007-10-18
申请号：US11723361
申请日：2007-03-19
申请人： Byung-Gil Choi , Choong-Keun Kwak , Du-Eung Kim , Woo-Yeong Cho
发明人： Byung-Gil Choi , Choong-Keun Kwak , Du-Eung Kim , Woo-Yeong Cho
IPC分类号： G11C11/00
CPC分类号： G11C8/10 , G11C13/0004 , G11C13/0069 , G11C2013/0078 , G11C2213/72
摘要： A phase change memory device comprises a memory cell array and a write driver circuit, and a column selection circuit. The memory cell array comprises a plurality of block units each connected between a corresponding pair of word line drivers. The write driver circuit comprises a plurality of write driver units each comprising a plurality of write drivers adapted to provide respective programming currents to a corresponding block unit among the plurality of block units. The column selection circuit is connected between the memory cell array and the write driver circuit and is adapted to select at least one of the plurality of memory blocks in response to a column selection signal to provide corresponding programming currents to the at least one of the plurality of memory blocks.
摘要翻译：相变存储器件包括存储单元阵列和写入驱动器电路以及列选择电路。存储单元阵列包括多个块单元，每个块单元连接在对应的一对字线驱动器之间。写驱动器电路包括多个写驱动器单元，每个写驱动器单元包括多个写驱动器，其适于向多个块单元中的相应块单元提供相应的编程电流。列选择电路连接在存储单元阵列和写驱动器电路之间，并且适于响应于列选择信号选择多个存储器块中的至少一个，以向多个存储单元阵列中的至少一个提供对应的编程电流的内存块。

9. 发明申请

US20070230240A1 Phase change memory device and related programming method 有权
标题翻译：相变存储器件及相关编程方法
公开(公告)号：US20070230240A1
公开(公告)日：2007-10-04
申请号：US11724268
申请日：2007-03-15
申请人： Byung-Gil Choi , Du-Eung Kim , Beak-Hyung Cho , Woo-Yeong Cho
发明人： Byung-Gil Choi , Du-Eung Kim , Beak-Hyung Cho , Woo-Yeong Cho
IPC分类号： G11C11/00
CPC分类号： G11C8/10 , G11C11/5678 , G11C13/0004 , G11C13/0069 , G11C2013/0078 , G11C2213/72
摘要： A phase change memory device comprises a memory cell array and a write driver circuit. The memory cell array comprises a plurality of memory cells, and the write driver circuit comprises a set current driver and a reset current driver. The set current driver is adapted to provide a set current to a selected memory cell among the plurality of memory cells and the reset current driver is adapted to provide a reset current to a selected memory cell among the plurality of memory cells.
摘要翻译：相变存储器件包括存储单元阵列和写入驱动器电路。存储单元阵列包括多个存储单元，并且写驱动器电路包括设定电流驱动器和复位电流驱动器。所设置的电流驱动器适于向所述多个存储器单元中的所选择的存储单元提供设定电流，并且所述复位电流驱动器适于向所述多个存储器单元中的所选存储单元提供复位电流。

10. 发明申请

US20070230239A1 Phase change memory devices and program methods 有权
标题翻译：相变存储器件和程序方法
公开(公告)号：US20070230239A1
公开(公告)日：2007-10-04
申请号：US11723354
申请日：2007-03-19
申请人： Byung-Gil Choi , Du-Eung Kim , Yu-Hwan Ro , Joon-Yong Choi , Beak-Hyung Cho , Woo-Yeong Cho
发明人： Byung-Gil Choi , Du-Eung Kim , Yu-Hwan Ro , Joon-Yong Choi , Beak-Hyung Cho , Woo-Yeong Cho
IPC分类号： G11C11/00
CPC分类号： G11C13/0069 , G11C13/0004 , G11C2013/0078 , G11C2213/72
摘要： A phase change memory device is disclosed. It includes a memory cell array including a plurality of memory cells programmed in relation to a phase change material, and a write driver circuit configured to provide a set current and a reset current to a selected memory cell. The write driver circuit includes a set current driver configured to provide the set current and a reset current driver configured to provide the reset current.
摘要翻译：公开了一种相变存储器件。其包括存储单元阵列，其包括相对于相变材料编程的多个存储器单元，以及写入驱动器电路，其被配置为向所选存储单元提供置位电流和复位电流。写驱动器电路包括配置成提供设定电流的设定电流驱动器和被配置为提供复位电流的复位电流驱动器。

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