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1. 发明申请

US20100216791A1 PYRIDINYLQUINAZOLINAMINE DERIVATIVES AND THEIR USE AS B-RAF INHIBITORS 审中-公开
标题翻译：吡啶并噻唑啉衍生物及其作为B-RAF抑制剂的用途
公开(公告)号：US20100216791A1
公开(公告)日：2010-08-26
申请号：US12377285
申请日：2007-08-15
申请人： Brian Aquila , Donald J. Cook , Craig Johnstone , Stephen Lee , Paul Lyne , David Alan Rudge , Melissa Vasbinder , Haixia Wang
发明人： Brian Aquila , Donald J. Cook , Craig Johnstone , Stephen Lee , Paul Lyne , David Alan Rudge , Melissa Vasbinder , Haixia Wang
IPC分类号： A61K31/5377 , C07D401/04 , A61K31/517 , A61P35/00 , A61P35/02 , C07D413/14
CPC分类号： C07D401/04 , C07D401/12 , C07D405/12
摘要： The invention relates to chemical compounds of the formula (I) or pharmaceutically acceptable salts thereof, which possess B-Raf inhibitory activity and are accordingly useful for their anti cancer activity and thus in methods of treatment of the human or animal body. The invention also relates to processes for the manufacture of said chemical compounds, to pharmaceutical compositions containing them and to their use in the manufacture of medicaments of use in the production of an anti-cancer effect in a warm blooded animal such as man.
摘要翻译：本发明涉及具有B-Raf抑制活性的式（I）化合物或其药学上可接受的盐，因此可用于其抗癌活性，因此可用于治疗人或动物体的方法。本发明还涉及制备所述化合物的方法，含有它们的药物组合物及其在制备用于在温血动物如人中产生抗癌作用的药物中的用途。

2. 发明授权

US06791344B2 System for and method of testing a microelectronic device using a dual probe technique 失效
标题翻译：使用双探针技术测试微电子器件的系统和方法
公开(公告)号：US06791344B2
公开(公告)日：2004-09-14
申请号：US09751355
申请日：2000-12-28
申请人： Donald J. Cook , Harvey Allard
发明人： Donald J. Cook , Harvey Allard
IPC分类号： G01R3102
CPC分类号： G01R31/2844
摘要： A system (10) for and method of testing a device under test (DUT) (12) having a plurality of probe pads (14) utilizing a dual probe technique to overcome contact resistance that may be present. The system comprises a plurality of sensing probes (30) and a plurality of forcing probes (32) arranged in pairs consisting of one sensing probe and one forcing probe. Each pair of sensing and forcing probes is provided for contacting one of the probe pads on the DUT. Each forcing probe is in electrical communication with a power supply (20) via a switching matrix (24), and each sensing probe is in electrical communication with a voltage meter (52) via the switching matrix. During testing, at least one of the power supplies provides a voltage to a corresponding forcing probe in contact with a particular probe pad. The sensing electrode at that particular probe pad senses a voltage, which is measured by the voltmeter and is used by a feedback controller (56) to adjust the voltage supplied by the corresponding power supply to the forcing probe.
摘要翻译：一种用于测试被测设备（DUT）（12）的方法和系统（10），其具有利用双探针技术来克服可能存在的接触电阻的多个探针焊盘（14）。该系统包括多个感测探针（30）和多个强制探针（32），成对地布置成由一个感测探针和一个强制探针组成。每对感测和强制探针被提供用于接触DUT上的探针焊盘之一。每个强制探头经由开关矩阵（24）与电源（20）电连通，并且每个感测探头经由开关矩阵与电压计（52）电连通。在测试期间，至少一个电源向与特定探针焊盘接触的相应的强制探针提供电压。在该特定探针焊盘处的感测电极感测由电压计测量的电压，并由反馈控制器（56）用来调节由相应的电源提供给强制探针的电压。

3. 发明授权

US06455766B1 Contact-less probe of semiconductor wafers 失效
标题翻译：半导体晶圆接触探针
公开(公告)号：US06455766B1
公开(公告)日：2002-09-24
申请号：US09829946
申请日：2001-04-11
申请人： Donald J. Cook , Edward J. Nowak , Minh H. Tong
发明人： Donald J. Cook , Edward J. Nowak , Minh H. Tong
IPC分类号： H01L31042
CPC分类号： G01R31/311 , Y10S136/291 , Y10S136/293
摘要： A device, having circuits formed thereon, comprises a circuit including a frequency generator for generating a detectable radio frequency energy when powered and a power generator, coupled to the frequency generator, for generating power when exposed to light.
摘要翻译：具有形成在其上的电路的装置包括电路，该电路包括用于在供电时产生可检测射频能量的频率发生器，以及耦合到频率发生器的用于在暴露于光时产生功率的发电机。

4. 发明授权

US06541981B2 Automation of transmission line pulse testing of electrostatic discharge devices 失效
标题翻译：静电放电装置传输线脉冲测试自动化
公开(公告)号：US06541981B2
公开(公告)日：2003-04-01
申请号：US09832072
申请日：2001-04-10
申请人： Harvey C. Allard, Jr. , Donald J. Cook , Robert J. Gauthier, Jr. , Edward S. Hoyt , Dain E. Reinhart , John A. Watson
发明人： Harvey C. Allard, Jr. , Donald J. Cook , Robert J. Gauthier, Jr. , Edward S. Hoyt , Dain E. Reinhart , John A. Watson
IPC分类号： G01R2912
CPC分类号： G01R31/14 , G01R31/002 , G01R31/2839 , G01R31/2851
摘要： A method and apparatus for automated testing of a plurality of electrostatic discharge (ESD) devices on a wafer. The wafer has M padsets and N conductive pads on each padset, where m is at least 1, and n is at least 2, and each ESD device is conductively coupled to a unique plurality of pads of a padset of the M padsets. Testing sequences, under program control of a computer system, implement the testing of the ESD devices.
摘要翻译：一种用于在晶片上自动测试多个静电放电（ESD）器件的方法和装置。晶片在每个焊盘上具有M个焊盘和N个导电焊盘，其中m为至少1，n为至少2，并且每个ESD器件与M个焊盘的焊盘的唯一多个焊盘导电耦合。在计算机系统的程序控制下的测试序列实现了ESD器件的测试。

5. 发明授权

US06300785B1 Contact-less probe of semiconductor wafers 失效
标题翻译：半导体晶圆接触探针
公开(公告)号：US06300785B1
公开(公告)日：2001-10-09
申请号：US09175303
申请日：1998-10-20
申请人： Donald J. Cook , Edward J. Nowak , Minh H. Tong
发明人： Donald J. Cook , Edward J. Nowak , Minh H. Tong
IPC分类号： G01R3128
CPC分类号： G01R31/311 , Y10S136/291 , Y10S136/293
摘要： A device, having circuits formed thereon, comprises a circuit including a frequency generator for generating a detectable radio frequency energy when powered and a power generator, coupled to the frequency generator, for generating power when exposed to light.
摘要翻译：具有形成在其上的电路的装置包括电路，该电路包括用于在供电时产生可检测射频能量的频率发生器，以及耦合到频率发生器的用于在暴露于光时产生功率的发电机。

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