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1. 发明授权

US07256603B1 Apparatus for measuring the static parameters of integrated circuits 有权
标题翻译：用于测量集成电路静态参数的装置
公开(公告)号：US07256603B1
公开(公告)日：2007-08-14
申请号：US11475147
申请日：2006-06-27
申请人： Bily Wang , Chung-Ho Chen , Kuei-Pao Chen
发明人： Bily Wang , Chung-Ho Chen , Kuei-Pao Chen
IPC分类号： G01R31/26
CPC分类号： G01R1/36 , G01R31/3004 , G01R31/31924
摘要： An apparatus for measuring the static parameters of integrated circuit is disclosed. When the apparatus is operated, the output mode is determined automatically according to the load of the integrated circuit. When the apparatus is operated in voltage output mode, the apparatus automatically limits the current. When the apparatus is operated at current output mode, the apparatus automatically limits the voltage. Therefore, the operation voltage and the operation current are stabilized. When the tested integrated circuit fails, the apparatus of the present invention can protect itself according to the stable operation voltage and operation current, and doesn't damage the tested integrated circuit.
摘要翻译：公开了一种用于测量集成电路的静态参数的装置。当设备运行时，根据集成电路的负载自动确定输出模式。当设备在电压输出模式下工作时，设备自动限制电流。当设备在当前输出模式下工作时，设备自动限制电压。因此，工作电压和工作电流稳定。当测试的集成电路出现故障时，本发明的装置可以根据稳定的工作电压和工作电流来保护自身，并且不会损坏被测集成电路。

2. 发明授权

US08873920B2 Light-guiding cover structure 有权
标题翻译：导光罩结构
公开(公告)号：US08873920B2
公开(公告)日：2014-10-28
申请号：US13425829
申请日：2012-03-21
申请人： Bily Wang , Kuei-Pao Chen , Hsin-Cheng Chen , Cheng-Chin Chiu
发明人： Bily Wang , Kuei-Pao Chen , Hsin-Cheng Chen , Cheng-Chin Chiu
IPC分类号： G02B6/00
CPC分类号： G02B6/4298 , G01J2001/4252 , G01R31/2635 , G02B6/3616 , G02B6/3644
摘要： A light-guiding cover structure includes a top cover unit and a light-guiding unit. The top cover unit has a plurality of receiving spaces formed therein. The light-guiding unit includes a plurality of light-guiding groups, wherein each light-guiding group includes a plurality of optical fiber cables received in the corresponding receiving space, and each optical fiber cable has two opposite ends exposed from the bottom surface of the top cover unit and respectively facing at least one light-emitting device and at least one light-sensing device that have been disposed under the top cover unit. Therefore, the optical fiber cables received in the corresponding receiving space, thus when the light-guiding cover structure is applied to the LED package chip classification system, the aspect of the LED package chip classification system can be enhanced.
摘要翻译：导光罩结构包括顶盖单元和导光单元。顶盖单元具有形成在其中的多个接收空间。导光单元包括多个导光组，其中每个导光组包括容纳在相应接收空间中的多根光纤电缆，并且每根光纤电缆具有两个相对端从第并且分别面向至少一个发光装置和已经设置在顶盖单元下的至少一个光感测装置。因此，光纤电缆在相应的接收空间中被接收，因此当导光盖结构被应用于LED封装芯片分类系统时，可以提高LED封装芯片分类系统的方面。

3. 发明授权

US08686310B2 Packaged chip detection and classification device 有权
标题翻译：封装芯片检测和分类装置
公开(公告)号：US08686310B2
公开(公告)日：2014-04-01
申请号：US13170705
申请日：2011-06-28
申请人： Bily Wang , Kuei-Pao Chen , Hsin-Cheng Chen
发明人： Bily Wang , Kuei-Pao Chen , Hsin-Cheng Chen
IPC分类号： B07C5/344
CPC分类号： B07C5/00 , B07C5/344 , G01R31/01 , G01R31/2893
摘要： A packaged chip detection and classification device includes a rotation unit for transporting a plurality of packaged chips, a packaged chip detection unit, and a packaged chip classification unit. The rotation unit includes a rotary turntable, a plurality of receiving portions formed on the rotary turntable, and a plurality of suction-exhaust openings respectively formed in the receiving portions. Each receiving portion is used to selectively receive at least one of the packaged chips. The packaged chip detection unit includes a packaged chip detection module adjacent to the rotation unit for detecting each packaged chip. The packaged chip classification unit includes a packaged chip classification module adjacent to the rotation unit for classifying the packaged chips. Therefore, the packaged chip detection and classification device can be used to detect and classify no-lead packaged chips by matching the rotation unit, the packaged chip detection unit, and the packaged chip classification unit.
摘要翻译：封装芯片检测和分类装置包括用于传输多个封装芯片的转动单元，封装芯片检测单元和封装芯片分类单元。旋转单元包括旋转转盘，形成在旋转转盘上的多个接收部分和分别形成在接收部分中的多个抽吸排气口。每个接收部分用于选择性地接收至少一个封装的芯片。封装芯片检测单元包括与用于检测每个封装芯片的旋转单元相邻的封装芯片检测模块。封装芯片分类单元包括与旋转单元相邻的封装芯片分类模块，用于对封装芯片进行分类。因此，封装芯片检测和分类装置可以通过匹配旋转单元，封装芯片检测单元和封装芯片分类单元来检测和分类无铅封装芯片。

4. 发明授权

US08107720B2 Detection system for detecting appearances of many electronic elements and methods of using the same 有权
标题翻译：用于检测许多电子元件外观的检测系统及其使用方法
公开(公告)号：US08107720B2
公开(公告)日：2012-01-31
申请号：US12453636
申请日：2009-05-18
申请人： Bily Wang , Kuei-Pao Chen , Hsin-Cheng Chen , Ming-Hao Chou , Ren-Chun Ni
发明人： Bily Wang , Kuei-Pao Chen , Hsin-Cheng Chen , Ming-Hao Chou , Ren-Chun Ni
IPC分类号： G06K9/00
CPC分类号： G06T7/0006 , G06T2207/30164
摘要： A detection system for detecting appearances of many electronic elements includes a rotary module, a feeding module and a detection module. The rotary module has a base structure and a hollow transparent rotary structure disposed on the base structure. The feeding module is disposed beside one side of the hollow transparent rotary structure in order to sequentially guide the electronic elements to the top surface of the hollow transparent rotary structure. The detection module has a plurality of detection units sequentially disposed around the hollow transparent rotary structure. Each detection unit is composed of an image-sensing element for sensing the electronic elements, an image-capturing element for capturing surface images of the electronic elements and a classifying element for classifying the electronic elements.
摘要翻译：用于检测许多电子元件的外观的检测系统包括旋转模块，馈送模块和检测模块。旋转模块具有底座结构和设置在基座结构上的中空透明旋转结构。馈送模块设置在中空透明旋转结构的一侧旁边，以便顺序地将电子元件引导到中空透明旋转结构的顶表面。检测模块具有多个依次设置在中空透明旋转结构周围的检测单元。每个检测单元由用于感测电子元件的图像感测元件，用于捕获电子元件的表面图像的图像捕获元件和用于分类电子元件的分类元件组成。

5. 发明授权

US07898663B2 Uniform light generating system for testing an image-sensing device and method of using the same 有权
标题翻译：用于测试图像感测装置的均匀光产生系统及其使用方法
公开(公告)号：US07898663B2
公开(公告)日：2011-03-01
申请号：US12285191
申请日：2008-09-30
申请人： Bily Wang , Kuei-Pao Chen , Chih-Ming Wang
发明人： Bily Wang , Kuei-Pao Chen , Chih-Ming Wang
IPC分类号： G01J3/40 , G01B9/00
CPC分类号： G01J1/10 , G01J1/0271 , G01J1/04 , G01J1/0411 , G01J1/0422 , G01J1/08 , G01J2001/083 , G01M11/0264 , G02B19/0028 , G02B19/0066 , G02B27/0977 , G02B27/0994
摘要： A uniform light generating system for testing an image-sensing device includes a light-generating unit, a light-transmitting unit, a light-diffusing unit, and a lens unit. The light-generating unit has a substrate and a plurality of light-emitting elements electrically disposed on the substrate. The light-transmitting unit has one side communicated with the light-generating unit for receiving and uniformizing light beams projected from the light-emitting elements. The light-diffusing unit has one side disposed on the other side of the light-transmitting unit for receiving and diffusing the light beams that have passed through the light-transmitting unit. The lens unit is disposed on the other side of the light-diffusing unit for transmitting the light beams that have passed through the light-diffusing unit to the image-sensing device.
摘要翻译：用于测试图像感测装置的均匀光产生系统包括发光单元，光发射单元，光漫射单元和透镜单元。光产生单元具有基板和电气设置在基板上的多个发光元件。光发射单元具有与发光单元连通的用于接收并均匀化从发光元件投射的光束的一侧。光漫射单元的一侧设置在透光单元的另一侧，用于接收并扩散已经通过光发射单元的光束。透镜单元设置在光漫射单元的另一侧，用于将已经通过光漫射单元的光束传输到图像感测装置。

6. 发明申请

US20090190124A1 Uniform light generating system for testing an image-sensing device and method of using the same 有权
标题翻译：用于测试图像感测装置的均匀光产生系统及其使用方法
公开(公告)号：US20090190124A1
公开(公告)日：2009-07-30
申请号：US12285191
申请日：2008-09-30
申请人： Bily Wang , Kuei-Pao Chen , Chih-Ming Wang
发明人： Bily Wang , Kuei-Pao Chen , Chih-Ming Wang
IPC分类号： G01J1/10 , G02B27/40
CPC分类号： G01J1/10 , G01J1/0271 , G01J1/04 , G01J1/0411 , G01J1/0422 , G01J1/08 , G01J2001/083 , G01M11/0264 , G02B19/0028 , G02B19/0066 , G02B27/0977 , G02B27/0994
摘要： A uniform light generating system for testing an image-sensing device includes a light-generating unit, a light-transmitting unit, a light-diffusing unit, and a lens unit. The light-generating unit has a substrate and a plurality of light-emitting elements electrically disposed on the substrate. The light-transmitting unit has one side communicated with the light-generating unit for receiving and uniformizing light beams projected from the light-emitting elements. The light-diffusing unit has one side disposed on the other side of the light-transmitting unit for receiving and diffusing the light beams that have passed through the light-transmitting unit. The lens unit is disposed on the other side of the light-diffusing unit for transmitting the light beams that have passed through the light-diffusing unit to the image-sensing device.
摘要翻译：用于测试图像感测装置的均匀光产生系统包括发光单元，光发射单元，光漫射单元和透镜单元。光产生单元具有基板和电气设置在基板上的多个发光元件。光发射单元具有与发光单元连通的用于接收并均匀化从发光元件投射的光束的一侧。光漫射单元的一侧设置在透光单元的另一侧，用于接收并扩散已经通过光发射单元的光束。透镜单元设置在光漫射单元的另一侧，用于将已经通过光漫射单元的光束传输到图像感测装置。

7. 发明授权

US08031930B2 Testing system and testing method for inspecting electonic devices 有权
标题翻译：用于检查电子设备的测试系统和测试方法
公开(公告)号：US08031930B2
公开(公告)日：2011-10-04
申请号：US12285184
申请日：2008-09-30
申请人： Bily Wang , Kuei-Pao Chen , Hsin-Cheng Chen , Ming-Hao Chou
发明人： Bily Wang , Kuei-Pao Chen , Hsin-Cheng Chen , Ming-Hao Chou
IPC分类号： G06K9/00
CPC分类号： G01N21/95 , G01N21/8806
摘要： A testing system for inspecting electronic devices includes a first transparent disk, a first image capturing unit disposed under the first transparent disk, a second disk disposed next to the first transparent disk, a guiding unit disposed on adjacent area between the transparent disk and the second disk, and a plurality of second image capturing units disposed around the second disk. A plurality of electronic devices is continuingly supplied onto the first transparent disk and the first image capturing unit is used for capturing the images of the bottom surfaces of the electronic devices. Then, the electronic devices are guided to the second disk via the guiding unit and the second image capturing units are used for capturing the images of other surfaces of the electronic devices. A testing method for electronic devices is further disclosed.
摘要翻译：用于检查电子设备的测试系统包括第一透明盘，设置在第一透明盘下方的第一图像捕获单元，邻近第一透明盘设置的第二盘，设置在透明盘与第二透明盘之间相邻区域上的引导单元盘，以及设置在第二盘周围的多个第二图像捕获单元。多个电子设备被连续地提供到第一透明盘上，并且第一图像捕获单元用于捕获电子设备的底面的图像。然后，电子设备经由引导单元被引导到第二盘，并且第二图像捕获单元用于捕获电子设备的其他表面的图像。进一步公开了一种电子设备的测试方法。

8. 发明申请

US20100166290A1 DIE DEFECT INSPECTING SYSTEM WITH A DIE DEFECT INSPECTING FUNCTION AND A METHOD OF USING THE SAME 审中-公开
标题翻译：具有缺陷检查功能的DIE缺陷检查系统及其使用方法
公开(公告)号：US20100166290A1
公开(公告)日：2010-07-01
申请号：US12489878
申请日：2009-06-23
申请人： Bily Wang , Kuei-Pao Chen , Hsin-Cheng Chen , Chien-Chi Huang , Chung-Yi Tsai
发明人： Bily Wang , Kuei-Pao Chen , Hsin-Cheng Chen , Chien-Chi Huang , Chung-Yi Tsai
IPC分类号： G06K9/00
CPC分类号： G01N21/9501 , G01N21/95607 , H01L22/12
摘要： A die defect inspecting system with a die defect inspecting function includes a wafer-positioning module, an image-capturing module, a die-sucking module, a die defect analyzing module, a die-classifying module and a control module. The image-capturing module is disposed beside one side of the wafer-positioning module in order to capture an image of each die. The die-sucking module is disposed above the wafer-positioning module and the image-capturing module in order to suck each die from the wafer-positioning module to a position above the image-capturing module for capturing a back image of a back surface of each die. The die defect analyzing module is electrically connected to the image-capturing module in order to judge whether the back image of the back surface of each die passes inspection standard.
摘要翻译：具有模具缺陷检查功能的模具缺陷检查系统包括晶片定位模块，图像捕获模块，模具吸收模块，模具缺陷分析模块，模具分类模块和控制模块。图像捕获模块设置在晶片定位模块的一侧旁边，以便捕获每个模具的图像。模具吸附模块设置在晶片定位模块和图像捕获模块上方，以便将每个模具从晶片定位模块吸入到图像捕获模块上方的位置，用于捕获背景图像每个死亡。模具缺陷分析模块电连接到图像捕获模块，以便判断每个模具的背面的背面图像是否经过检查标准。

9. 发明申请

US20090251815A1 Testing system and testing method for inspecting electonic devices 有权
标题翻译：用于检查电子设备的测试系统和测试方法
公开(公告)号：US20090251815A1
公开(公告)日：2009-10-08
申请号：US12285184
申请日：2008-09-30
申请人： Bily Wang , Kuei-Pao Chen , Hsin-Cheng Chen , Ming-Hao Chou
发明人： Bily Wang , Kuei-Pao Chen , Hsin-Cheng Chen , Ming-Hao Chou
IPC分类号： G11B27/36
CPC分类号： G01N21/95 , G01N21/8806
摘要： A testing system for inspecting electronic devices includes a first transparent disk, a first image capturing unit disposed under the first transparent disk, a second disk disposed next to the first transparent disk, a guiding unit disposed on adjacent area between the transparent disk and the second disk, and a plurality of second image capturing units disposed around the second disk. A plurality of electronic devices is continuingly supplied onto the first transparent disk and the first image capturing unit is used for capturing the images of the bottom surfaces of the electronic devices. Then, the electronic devices are guided to the second disk via the guiding unit and the second image capturing units are used for capturing the images of other surfaces of the electronic devices. A testing method for electronic devices is further disclosed.
摘要翻译：用于检查电子设备的测试系统包括第一透明盘，设置在第一透明盘下方的第一图像捕获单元，邻近第一透明盘设置的第二盘，设置在透明盘和第二透明盘之间的相邻区域上的引导单元盘，以及设置在第二盘周围的多个第二图像捕获单元。多个电子设备被连续地提供到第一透明盘上，并且第一图像捕获单元用于捕获电子设备的底面的图像。然后，电子设备经由引导单元被引导到第二盘，并且第二图像捕获单元用于捕获电子设备的其他表面的图像。进一步公开了一种电子设备的测试方法。

10. 发明授权

US07379171B2 Optical object distance simulation device 有权
公开(公告)号：US07379171B2
公开(公告)日：2008-05-27
申请号：US11476166
申请日：2006-06-28
申请人： Bily Wang , Chih-Ming Wang , Kuei-Pao Chen , Kuo-Lung Kuo
发明人： Bily Wang , Chih-Ming Wang , Kuei-Pao Chen , Kuo-Lung Kuo
IPC分类号： G01B9/00
CPC分类号： G01M11/0207
摘要： An optical object distance simulation device is disclosed. The device has an optical lens module composed of a plurality of optical lens and the optical lens module is arranged between an optical lens and a chart for simulating the real object distance and reducing the space required for testing an optical lens. Moreover, the optical lens module is separated from a light-emitting element, a power supply or any heat-generating elements all separated from the optical lens module. Furthermore, the heat-dissipating elements are arranged near elements that generate substantial heat. Hence, not only does the present invention have a good heat-dissipating effect, but it also prevents external dust from polluting the optical lens module because of the positioning of the heat-dissipating element and the heat-dissipating hole.

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