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    • 2. 发明授权
    • Surface tension measuring device and method
    • 表面张力测量装置及方法
    • US08390815B2
    • 2013-03-05
    • US12667184
    • 2008-03-14
    • Takayuki SaitoToshiyuki SanadaYusuke Ozawa
    • Takayuki SaitoToshiyuki SanadaYusuke Ozawa
    • G01N21/55
    • G01N13/02G01N21/431
    • Low-cost interface property measuring device and method enabling high-precision and simple measurement of an interface property. The interface property measuring device comprises an optical fiber probe (1) having a first end face (2) at least part of which is inclined with respect to a direction perpendicular to a fiber axis, a light supply (24) for supplying light from a second end face on the side opposite to the first end face of the optical fiber probe, a reflected light amount measuring device (24) for measuring the reflected light amount and a moving mechanism (18) for moving at least one of the optical fiber probe and an object (21) to be measured such that the first end face of the optical fiber probe passes through an interface (23) of the object (21) at a constant speed, and the interface property measuring device acquires the interface property of the object to be measured according to the result of measurement of the reflected light amount when the first end face of the optical fiber probe passes through the interface of the object to be measured.
    • 低成本接口属性测量装置和方法能够实现高精度和简单的测量接口性能。 所述界面性质测量装置包括:光纤探针(1),其具有至少一部分相对于与光纤轴垂直的方向倾斜的第一端面(2);用于从 第二端面与光纤探针的第一端面相对的一侧,用于测量反射光量的反射光量测量装置(24)和用于移动光纤探针中的至少一个的移动机构(18) 和测量对象(21),使得光纤探针的第一端面以恒定速度穿过物体(21)的界面(23),并且界面性质测量装置获取 当光纤探针的第一端面通过被测量物体的界面时,根据反射光量的测量结果来测量的物体。
    • 3. 发明申请
    • SURFACE TENSION MEASURING DEVICE AND METHOD
    • 表面张力测量装置和方法
    • US20100188662A1
    • 2010-07-29
    • US12667184
    • 2008-03-14
    • Takayuki SaitoToshiyuki SanadaYusuke Ozawa
    • Takayuki SaitoToshiyuki SanadaYusuke Ozawa
    • G01N21/55
    • G01N13/02G01N21/431
    • Low-cost interface property measuring device and method enabling high-precision and simple measurement of an interface property. The interface property measuring device comprises an optical fiber probe (1) having a first end face (2) at least part of which is inclined with respect to a direction perpendicular to a fiber axis, a light supplying means (24) for supplying light from a second end face on the side opposite to the first end face of the optical fiber probe, a reflected light amount measuring means (24) for measuring the reflected light amount obtained by the light supplied by the light supplying means being reflected by the first end face and returning to the second end face, and a moving means (18) for moving at least one of the optical fiber probe and an object (21) to be measured such that the first end face of the optical fiber probe passes through an interface (23) of the object (21) at a constant speed, and the interface property measuring device acquires the interface property of the object to be measured according to the result of measurement of the reflected light amount when the first end face of the optical fiber probe passes through the interface of the object to be measured.
    • 低成本接口属性测量装置和方法能够实现高精度和简单的测量接口性能。 所述界面特性测量装置包括:光纤探针(1),其具有至少一部分相对于与光纤轴垂直的方向倾斜的第一端面(2),用于提供来自 在与光纤探针的第一端面相反的一侧的第二端面,反射光量测量装置,用于测量由光供给装置提供的光获得的反射光量,该反射光量由第一端 并且返回到第二端面,以及移动装置(18),用于移动光纤探针和被测量物体(21)中的至少一个,使得光纤探针的第一端面通过界面 (21)的第一端面(23),并且界面性质测量装置根据反射光量的测量结果来获取被测量物体的界面特性,当第一端面 的光纤探头穿过待测物体的界面。