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1. 发明授权

US07852488B2 Method and device for characterising a structure by wavelength effect in a photoacoustic system 有权
标题翻译：用于通过光声系统中的波长效应来表征结构的方法和装置
公开(公告)号：US07852488B2
公开(公告)日：2010-12-14
申请号：US11922536
申请日：2006-06-19
申请人： Arnaud Devos , Grégory Caruyer
发明人： Arnaud Devos , Grégory Caruyer
IPC分类号： G01B11/02 , G01B11/28
CPC分类号： G01N21/1702 , G01N2021/1706
摘要： The invention relates to a structure characterising device comprising means which are used for generating a first pump radiation and a second probe radiation and for transmitting different wavelength radiation, means for producing a time offset between said first pump and second probe radiation on the structure by means of detecting means of said second beam after the reflection or transmission thereof to said structure in such a way that an analysis signal is generated, means for processing said signal and identifying an area corresponding to the signal jump, for determining the jump amplitude according to different wavelengths, for comparing said amplitude with a theoretical amplitude variation pattern according to the wavelengths and for determining, for the wavelength characteristic for said theoretical pattern, a characteristic value associated to the structure thickness and to the radiation propagation velocity in said structure.
摘要翻译：本发明涉及一种结构特征化装置，其包括用于产生第一泵浦辐射和第二探测辐射并用于传输不同波长辐射的装置，用于通过装置在所述结构上产生所述第一泵和第二探测器辐射之间的时间偏移的装置所述第二光束的检测装置在以产生分析信号的方式反射或传输到所述结构之后，检测所述第二光束的检测装置，用于处理所述信号并识别与信号跳跃相对应的区域的装置，用于根据不同的信号确定跳跃幅度波长，用于将所述振幅与根据波长的理论振幅变化模式进行比较，并且对于所述理论模式的波长特性，确定与所述结构中的结构厚度和辐射传播速度相关联的特征值。

2. 发明申请

US20080315131A1 Method and Device for Characterising a Structure by Wavelength Effect in a Photoacoustic System 有权
标题翻译：用于通过光声系统中的波长效应来表征结构的方法和装置
公开(公告)号：US20080315131A1
公开(公告)日：2008-12-25
申请号：US11922536
申请日：2006-06-19
申请人： Arnaud Devos , Gregory Caruyer
发明人： Arnaud Devos , Gregory Caruyer
IPC分类号： G01J1/00
CPC分类号： G01N21/1702 , G01N2021/1706
摘要： The invention relates to a structure characterising device comprising means which are used for generating a first pump radiation and a second probe radiation and for transmitting different wavelength radiation, means for producing a time offset between said first pump and second probe radiation on the structure by means of detecting means of said second beam after the reflection or transmission thereof to said structure in such a way that an analysis signal is generated, means for processing said signal and identifying an area corresponding to the signal jump, for determining the jump amplitude according to different wavelengths, for comparing said amplitude with a theoretical amplitude variation pattern according to the wavelengths and for determining, for the wavelength characteristic for said theoretical pattern, a characteristic value associated to the structure thickness and to the radiation propagation velocity in said structure.
摘要翻译：本发明涉及一种结构特征化装置，其包括用于产生第一泵浦辐射和第二探测辐射并用于传输不同波长辐射的装置，用于通过装置在所述结构上产生所述第一泵和第二探测器辐射之间的时间偏移的装置所述第二光束的检测装置在以产生分析信号的方式反射或传输到所述结构之后，检测所述第二光束的检测装置，用于处理所述信号并识别与信号跳跃相对应的区域的装置，用于根据不同的信号确定跳跃幅度波长，用于将所述振幅与根据波长的理论振幅变化模式进行比较，并且对于所述理论模式的波长特性，确定与所述结构中的结构厚度和辐射传播速度相关联的特征值。

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