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1. 发明授权

US06320194B1 Portable high resolution scanning electron microscope column using permanent magnet electron lenses 失效
标题翻译：便携式高分辨率扫描电子显微镜柱，采用永磁电子透镜
公开(公告)号：US06320194B1
公开(公告)日：2001-11-20
申请号：US09563117
申请日：2000-05-02
申请人： Anjam Khursheed , Jacob Chee Hong Phang , John Thiam Leong Thong
发明人： Anjam Khursheed , Jacob Chee Hong Phang , John Thiam Leong Thong
IPC分类号： H01J3718
CPC分类号： H01J37/28 , H01J37/14 , H01J2237/16
摘要： A detachable, portable SEM column that is easily disconnected from the electron gun assembly and specimen chamber of the system, allowing different column designs to be used in a given SEM system. As an alternate design, the electron gun and column are configured as a single detachable, portable assembly. The column of the present invention contains a condenser lens and an objective lens, both designed employing permanent magnet elements for primary field generation. Relatively small coils are used for scanning and precise adjustment of focus.
摘要翻译：可拆卸的便携式SEM柱，易于与系统的电子枪组件和样品室断开，允许在给定SEM系统中使用不同的色谱柱设计。作为替代设计，电子枪和柱被配置为单个可拆卸的便携式组件。本发明的列包含聚光透镜和物镜，它们均采用永磁体元件进行设计，用于初级场产生。相对小的线圈用于扫描和精确调整焦点。

2. 发明授权

US6057553A Portable high resolution scanning electron microscope column using permanent magnet electron lenses 失效
标题翻译：便携式高分辨率扫描电子显微镜柱，采用永磁电子透镜
公开(公告)号：US6057553A
公开(公告)日：2000-05-02
申请号：US016593
申请日：1998-01-30
申请人： Anjam Khursheed , Jacob Chee Hong Phang , John Thiam Leong Thong
发明人： Anjam Khursheed , Jacob Chee Hong Phang , John Thiam Leong Thong
IPC分类号： H01J37/14 , H01J37/28 , H01J37/18
CPC分类号： H01J37/28 , H01J37/14 , H01J2237/16
摘要： A detachable, portable SEM column that is easily disconnected from the electron gun assembly and specimen chamber of the system, allowing different column designs to be used in a given SEM system. As an alternate design, the electron gun and column are configured as a single detachable, portable assembly. The column of the present invention contains a condenser lens and an objective lens, both designed employing permanent magnet elements for primary field generation. Relatively small coils are used for scanning and precise adjustment of focus.
摘要翻译：可拆卸的便携式SEM柱，易于与系统的电子枪组件和样品室断开，允许在给定SEM系统中使用不同的色谱柱设计。作为替代设计，电子枪和柱被配置为单个可拆卸的便携式组件。本发明的列包含聚光透镜和物镜，它们均采用永磁体元件进行设计，用于初级场产生。相对小的线圈用于扫描和精确调整焦点。

3. 发明授权

US06897441B2 Reducing chromatic aberration in images formed by emmission electrons 失效
标题翻译：减少由电子出现形成的图像中的色差
公开(公告)号：US06897441B2
公开(公告)日：2005-05-24
申请号：US10613700
申请日：2003-07-03
申请人： Anjam Khursheed
发明人： Anjam Khursheed
IPC分类号： G01Q30/02 , H01J37/153 , H01J37/285
CPC分类号： H01J37/153 , H01J37/285
摘要： An imaging device, such as an EEM, includes an electric/magnetic lens used to focus pulsed electrons emitted from an object on to a target plane. Before a pulse of emitted electrons reaches the lens, electrons are spatially separated in dependence on their respective kinetic energies and are then subject to a time varying electric field that keeps the final focal plane constant for a wide variety of different energy electrons. The electric field compensates for variations in the image focal length caused by a spread in kinetic energies, causing the electrons to be focused proximate the target plane, reducing chromatic aberration. The varying electric field may be provided by varying an electric potential at the lens by, for example, varying a voltage supplied to an electrode at the lens. This potential effectively varies the focal strength of the lens in time, in order to compensate for variations in kinetic energies of electrons arriving at the lens, effectively keeping the image plane position constant.
摘要翻译：诸如EEM的成像装置包括用于将从物体发射的脉冲电子聚焦到目标平面上的电/磁透镜。在发射的电子脉冲到达透镜之前，电子根据它们各自的动能在空间上分离，然后经受时变电场，使得最终的焦平面保持不同的各种不同能量的电子。电场补偿由于动能的扩散而导致的图像焦距的变化，导致电子靠近目标平面聚焦，从而减小色差。可以通过例如改变在透镜处提供给电极的电压来改变透镜上的电位来提供变化的电场。该电位有效地改变透镜的焦点强度，以补偿到达透镜的电子的动能的变化，有效地保持图像平面位置的恒定。

4. 发明申请

US20060060782A1 Scanning electron microscope 有权
标题翻译：扫描电子显微镜
公开(公告)号：US20060060782A1
公开(公告)日：2006-03-23
申请号：US11155014
申请日：2005-06-16
申请人： Anjam Khursheed
发明人： Anjam Khursheed
IPC分类号： G01N23/00
CPC分类号： H01J37/256 , G01N23/225 , H01J37/28 , H01J2237/14 , H01J2237/24415 , H01J2237/2445 , H01J2237/2446 , H01J2237/24475 , H01J2237/2448 , H01J2237/24485
摘要： In a scanning electron microscope, an emitted primary electron beam is diverted by an angle of at least about 45 degrees prior to incidence with a specimen. The beam may be bent by a magnetic separator. The separator may also serve to deflect secondary electron and back scattered electrons. As the angle of emissions and reflections from the specimen is close to the angle of incidence, bending the primary electron beam prior to incidence, allows the electron source to be located so as not to obstruct the travel of emissions and reflections to suitable detectors.
摘要翻译：在扫描电子显微镜中，发射的一次电子束在与样品入射之前被转向至少约45度的角度。梁可以通过磁选机弯曲。分离器还可以用于偏转二次电子和背散射电子。当来自样品的发射角和反射角接近于入射角时，在入射之前弯曲一次电子束，允许电子源被定位成不妨碍发射和反射到合适的检测器的行进。

5. 发明授权

US07326928B2 Electron microscope and a method of imaging objects 有权
标题翻译：电子显微镜和成像对象的方法
公开(公告)号：US07326928B2
公开(公告)日：2008-02-05
申请号：US11288929
申请日：2005-11-29
申请人： Anjam Khursheed
发明人： Anjam Khursheed
IPC分类号： H01J37/26 , H01J37/153
CPC分类号： H01J37/153 , H01J37/21 , H01J37/265 , H01J37/28 , H01J2237/0432 , H01J2237/1202 , H01J2237/1534 , H01J2237/21 , H01J2237/2485 , H01J2237/2538 , H01J2237/2809
摘要： An electron microscope and a method of imaging objects. The method including the steps of: generating at least one electron pulse, each electron pulse including a plurality of electrons with the electrons having a kinetic energy spread; demagnifying each electron pulse using one or more lenses, each lens having a focal strength; dynamically varying said focal strength of at least one of said one or more lenses to compensate for said kinetic energy spread; and forming an image of said object based on interactions at said object resulting from each demagnified pulse. The electron microscope comprising: an electron source adapted to produce a plurality of electron pulses, each electron pulse including a plurality of electrons with the electrons having a kinetic energy spread; one or more lenses adapted to demagnify each of said electron pulses at said object, each lens having a focal strength; compensation means for dynamically varying said focal strength of at least one of said one or more lenses to compensate for said kinetic energy spread; and a detector for forming an image of said object based on interactions at said object resulting from each of said demagnified pulses
摘要翻译：电子显微镜和成像对象的方法。该方法包括以下步骤：产生至少一个电子脉冲，每个电子脉冲包括具有动能扩散的电子的多个电子; 使用一个或多个透镜对每个电子脉冲进行缩小，每个透镜具有焦点强度; 动态地改变所述一个或多个透镜中的至少一个的所述焦距强度以补偿所述动能扩展; 以及基于由每个缩小的脉冲产生的所述对象的相互作用形成所述对象的图像。该电子显微镜包括：适于产生多个电子脉冲的电子源，每个电子脉冲包括具有动能扩散的电子的多个电子; 一个或多个透镜，适于在所述物体处对每个所述电子脉冲进行去磁，每个透镜具有焦点强度; 用于动态地改变所述一个或多个透镜中的至少一个透镜的所述焦距强度以补偿所述动能扩展的补偿装置; 以及检测器，用于基于由每个所述缩小脉冲产生的在所述物体处的相互作用形成所述物体的图像

6. 发明授权

US07294834B2 Scanning electron microscope 有权
标题翻译：扫描电子显微镜
公开(公告)号：US07294834B2
公开(公告)日：2007-11-13
申请号：US11155014
申请日：2005-06-16
申请人： Anjam Khursheed
发明人： Anjam Khursheed
IPC分类号： G01N23/00
CPC分类号： H01J37/256 , G01N23/225 , H01J37/28 , H01J2237/14 , H01J2237/24415 , H01J2237/2445 , H01J2237/2446 , H01J2237/24475 , H01J2237/2448 , H01J2237/24485
摘要： In a scanning electron microscope, an emitted primary electron beam is diverted by an angle of at least about 45 degrees prior to incidence with a specimen. The beam may be bent by a magnetic separator. The separator may also serve to deflect secondary electron and back scattered electrons. As the angle of emissions and reflections from the specimen is close to the angle of incidence, bending the primary electron beam prior to incidence, allows the electron source to be located so as not to obstruct the travel of emissions and reflections to suitable detectors.
摘要翻译：在扫描电子显微镜中，发射的一次电子束在与样品入射之前被转向至少约45度的角度。梁可以通过磁选机弯曲。分离器还可以用于偏转二次电子和背散射电子。当来自样品的发射角和反射角接近于入射角时，在入射之前弯曲一次电子束，允许电子源被定位成不妨碍发射和反射到合适的检测器的行进。

7. 发明授权

US08981292B2 Parallel radial mirror analyser with an angled zero-volt equipotential exit grid for scanning electron microscopes 有权
标题翻译：具有倾斜零伏等势出口格栅的平行径向镜分析仪，用于扫描电子显微镜
公开(公告)号：US08981292B2
公开(公告)日：2015-03-17
申请号：US14114170
申请日：2012-04-24
申请人： Anjam Khursheed , Hung Quang Hoang
发明人： Anjam Khursheed , Hung Quang Hoang
IPC分类号： H01J49/48 , H01J37/244 , H01J37/28 , H01J37/26 , H01J37/05 , H01J37/22
CPC分类号： H01J37/261 , H01J37/05 , H01J37/244 , H01J37/28 , H01J49/48 , H01J49/482 , H01J49/484 , H01J49/486 , H01J49/488 , H01J2237/2446 , H01J2237/24485
摘要： A parallel radial mirror analyzer (PRMA) (700) for facilitating rotationally symmetric detection of charged particles caused by a charged beam incident on a specimen is disclosed. The PRMA comprises a zero-volt equipotential grid (728), and a plurality of electrodes (702, 704, 706, 708, 710, 712, 714, 716, 718, 720, 722) electrically configured to generate corresponding electrostatic fields for deflecting the charged particles in accordance with respective energy levels of the charged particles to exit through the grid (728) to form corresponding second-order focal points on a detector (206). The detector (206) is disposed external to the corresponding electrostatic fields. A related method is also disclosed.
摘要翻译：公开了一种用于促进由入射在试样上的带电束引起的带电粒子的旋转对称检测的并行径向镜分析仪（PRMA）（700）。 PRMA包括零伏等势网格（728）和多个电极（702,704,706,708,710,712,714,716,718,720,722），电气地配置为产生相应的静电场用于偏转所述带电粒子根据所述带电粒子的相应能级移动通过所述格栅（728）以在检测器（206）上形成对应的二阶焦点。检测器（206）设置在相应静电场的外部。还公开了相关方法。

8. 发明申请

US20140042317A1 PARALLEL RADIAL MIRROR ANALYSER FOR SCANNING MICROSCOPES 有权
标题翻译：用于扫描显微镜的并行径向分析仪
公开(公告)号：US20140042317A1
公开(公告)日：2014-02-13
申请号：US14114170
申请日：2012-04-24
申请人： Anjam Khursheed , Hung Quang Hoang
发明人： Anjam Khursheed , Hung Quang Hoang
IPC分类号： H01J37/26
CPC分类号： H01J37/261 , H01J37/05 , H01J37/244 , H01J37/28 , H01J49/48 , H01J49/482 , H01J49/484 , H01J49/486 , H01J49/488 , H01J2237/2446 , H01J2237/24485
摘要： A parallel radial mirror analyser (PRMA) (700) for facilitating rotationally symmetric detection of charged particles caused by a charged beam incident on a specimen is disclosed. The PRMA comprises a zero-volt equipotential grid (728), and a plurality of electrodes (702, 704, 706, 708, 710, 712, 714, 716, 718, 720, 722) electrically configured to generate corresponding electrostatic fields for deflecting the charged particles in accordance with respective energy levels of the charged particles to exit through the grid (728) to form corresponding second-order focal points on a detector (206). The detector (206) is disposed external to the corresponding electrostatic fields. A related method is also disclosed.
摘要翻译：公开了一种用于促进由入射在试样上的带电束引起的带电粒子的旋转对称检测的并行径向镜分析仪（PRMA）（700）。 PRMA包括零伏等势网格（728）和多个电极（702,704,706,708,710,712,714,716,718,720,722），电气地配置为产生相应的静电场用于偏转所述带电粒子根据所述带电粒子的相应能级移动通过所述格栅（728）以在检测器（206）上形成对应的二阶焦点。检测器（206）设置在相应静电场的外部。还公开了相关方法。

9. 发明申请

US20060151696A1 Electron microscope and a method of imaging objects 有权
标题翻译：电子显微镜和成像对象的方法
公开(公告)号：US20060151696A1
公开(公告)日：2006-07-13
申请号：US11288929
申请日：2005-11-29
申请人： Anjam Khursheed
发明人： Anjam Khursheed
IPC分类号： G21K7/00
CPC分类号： H01J37/153 , H01J37/21 , H01J37/265 , H01J37/28 , H01J2237/0432 , H01J2237/1202 , H01J2237/1534 , H01J2237/21 , H01J2237/2485 , H01J2237/2538 , H01J2237/2809
摘要： An electron microscope and a method of imaging objects. The method including the steps of: generating at least one electron pulse, each electron pulse including a plurality of electrons with the electrons having a kinetic energy spread; demagnifying each electron pulse using one or more lenses, each lens having a focal strength; dynamically varying said focal strength of at least one of said one or more lenses to compensate for said kinetic energy spread; and forming an image of said object based on interactions at said object resulting from each demagnified pulse. The electron microscope comprising: an electron source adapted to produce a plurality of electron pulses, each electron pulse including a plurality of electrons with the electrons having a kinetic energy spread; one or more lenses adapted to demagnify each of said electron pulses at said object, each lens having a focal strength; compensation means for dynamically varying said focal strength of at least one of said one or more lenses to compensate for said kinetic energy spread; and a detector for forming an image of said object based on interactions at said object resulting from each of said demagnified pulses
摘要翻译：电子显微镜和成像对象的方法。该方法包括以下步骤：产生至少一个电子脉冲，每个电子脉冲包括具有动能扩散的电子的多个电子; 使用一个或多个透镜对每个电子脉冲进行缩小，每个透镜具有焦点强度; 动态地改变所述一个或多个透镜中的至少一个的所述焦距强度以补偿所述动能扩展; 以及基于由每个缩小的脉冲产生的所述对象的相互作用形成所述对象的图像。该电子显微镜包括：适于产生多个电子脉冲的电子源，每个电子脉冲包括具有动能扩散的电子的多个电子; 一个或多个透镜，适于在所述物体处对每个所述电子脉冲进行去磁，每个透镜具有焦点强度; 用于动态地改变所述一个或多个透镜中的至少一个透镜的所述焦距强度以补偿所述动能扩展的补偿装置; 以及检测器，用于基于由每个所述缩小脉冲产生的在所述物体处的相互作用形成所述物体的图像

10. 发明授权

US08013298B2 Electrostatic electron spectrometry apparatus 有权
标题翻译：静电电子分光装置
公开(公告)号：US08013298B2
公开(公告)日：2011-09-06
申请号：US12502707
申请日：2009-07-14
申请人： Anjam Khursheed
发明人： Anjam Khursheed
IPC分类号： H01J47/00 , G01N23/00
CPC分类号： H01J49/48
摘要： An apparatus for spectrometry that includes a spectrometer configured for second order focusing and capable of 2π azimuthal collection.
摘要翻译：一种用于光谱测定的装置，其包括配置用于二阶聚焦并且能够2和pgr的光谱仪; 方位收集。

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