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    • 4. 发明授权
    • Memory with embedded error correction codes
    • 具有嵌入式纠错码的内存
    • US07581153B2
    • 2009-08-25
    • US11221584
    • 2005-09-08
    • Rino MicheloniRoberto RavasioAngelo BovinoVincenzo Altieri
    • Rino MicheloniRoberto RavasioAngelo BovinoVincenzo Altieri
    • G11C29/00
    • G06F11/1048
    • A memory has one bus for data, addresses, and commands. A data register is coupled to the bus to store the data written to and read from the memory, a command register is coupled to the bus for receiving memory commands, and an address register is coupled to the bus to address the memory. The memory also includes an Error Correction Code circuit for calculating an ECC. The memory is configured to be responsive to external commands for controlling the operation of the ECC circuit for reading or writing of the ECC that are separate from external commands controlling reads or writes of the memory data. The memory may also include a status register that stores information regarding the passing or failing of the ECC.
    • 内存有一条总线用于数据,地址和命令。 数据寄存器耦合到总线以存储写入存储器和从存储器读取的数据,命令寄存器耦合到总线以接收存储器命令,并且地址寄存器耦合到总线以寻址存储器。 存储器还包括用于计算ECC的纠错码电路。 存储器被配置为响应于用于控制ECC电路的操作的外部命令,用于读取或写入与控制存储器数据的读取或写入的外部命令分离的ECC。 存储器还可以包括状态寄存器,其存储关于ECC的通过或失败的信息。
    • 5. 发明申请
    • Page buffer circuit and method for multi-level NAND programmable memories
    • 页面缓冲电路和多级NAND可编程存储器的方法
    • US20070030735A1
    • 2007-02-08
    • US11495874
    • 2006-07-28
    • Luca CrippaChiara MissiroliRoberto RavasioRino MicheloniAngelo Bovino
    • Luca CrippaChiara MissiroliRoberto RavasioRino MicheloniAngelo Bovino
    • G11C16/04
    • G11C16/12G11C11/5628G11C16/0483G11C2211/5621G11C2211/5642G11C2216/14
    • A page buffer for an electrically programmable memory including at least one read/program unit having a coupling line operatively associable with at least one of said bit lines and adapted to at least temporarily storing data bits read from or to be written into either one of the first or second memory page stored in the memory cells of a selected memory cell sets. The read/program unit includes enabling means for selectively enabling a change in programming state of a selected memory cell by causing the coupling line to take one among a program enabling potential and a program inhibition potential, conditioned to a target data value to be stored in the first group of data bits of the selected memory cell and an existing data value already stored in the second group of data bits of the selected memory cell. The enabling means includes reading means for retrieving the existing data value, means for receiving an indication of the target data value, combining means for combining the received target data value with the retrieved existing data value, thereby modifying said indication of the target data value so as to obtain a modified indication. Conditioning means in the combining means condition a potential of the coupling line based on the existing data value and the modified indication so as to cause the coupling line to take the program enabling potential or the program inhibition potential.
    • 一种用于电可编程存储器的页面缓冲器,包括至少一个读/程序单元,其具有可操作地与至少一个所述位线相关联的耦合线,并且适于至少临时存储从或写入到 存储在所选存储单元组的存储单元中的第一或第二存储器页。 读/程序单元包括启用装置,用于通过使耦合线在程序使能电位和程序禁止电位之间采取一种方式来有选择地启用所选择的存储单元的编程状态的改变, 所选存储单元的第一组数据位和已存储在所选存储单元的第二组数据位中的现有数据值。 启用装置包括用于检索现有数据值的读取装置,用于接收目标数据值的指示的装置,用于将接收的目标数据值与所检索的现有数据值组合的组合装置,从而修改目标数据值的所述指示,从而 以获得修改的指示。 组合装置中的调节装置基于现有数据值和修改的指示来条件耦合线的电位,以使耦合线采取程序使能电位或程序禁止电位。
    • 7. 发明申请
    • Nand flash memory with erase verify based on shorter evaluation time
    • 基于更短的评估时间,具有擦除验证的Nand闪存
    • US20070030730A1
    • 2007-02-08
    • US11495886
    • 2006-07-28
    • Angelo BovinoRino MicheloniRoberto Ravasio
    • Angelo BovinoRino MicheloniRoberto Ravasio
    • G11C16/06
    • G11C16/12G11C11/5628G11C16/0483G11C2211/5621G11C2211/5642G11C2216/14
    • A non-volatile memory device is proposed. The non-volatile memory device includes a plurality of memory cells each one having a programmable threshold voltage, and means for reading a set of selected memory cells with respect to a plurality of reference voltages, for each selected memory cell the means for reading including means for charging a reading node associated with the selected memory cell with a charging voltage, means for biasing the selected memory cell with a biasing voltage, means for connecting the charged reading node with the biased selected memory cell, and means for sensing a voltage at the reading node after a predefined delay from the connection, for at least a first one of the reference voltages the biasing voltage being a first biasing voltage equal to the first reference voltage and the delay being a common first delay, wherein for at least a second one of the reference voltages the biasing voltage is a second biasing voltage different from the second reference voltage, and the delay is a second delay different from the first delay.
    • 提出了一种非易失性存储器件。 该非易失性存储器件包括多个具有可编程阈值电压的存储单元,以及用于针对每个所选择的存储器单元读取相对于多个参考电压的一组所选存储单元的装置,所述读取装置包括装置 用于利用充电电压对与所选择的存储器单元相关联的读取节点进行充电,用于利用偏置电压偏置所选择的存储单元的装置,用于将所述充电的读取节点与所偏置的选择的存储单元相连接的装置,以及用于感测所述存储单元 在来自所述连接的预定义延迟之后的读取节点,对于所述参考电压中的至少第一参考电压,所述偏置电压是等于所述第一参考电压的第一偏置电压,并且所述延迟是公共的第一延迟,其中对于至少第二个 的参考电压,偏置电压是与第二参考电压不同的第二偏置电压,并且延迟是第二延迟di 与第一次延迟不同。